JPS6245830U - - Google Patents

Info

Publication number
JPS6245830U
JPS6245830U JP13642285U JP13642285U JPS6245830U JP S6245830 U JPS6245830 U JP S6245830U JP 13642285 U JP13642285 U JP 13642285U JP 13642285 U JP13642285 U JP 13642285U JP S6245830 U JPS6245830 U JP S6245830U
Authority
JP
Japan
Prior art keywords
lower electrode
exhaust port
opened
moves
vacuum chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13642285U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13642285U priority Critical patent/JPS6245830U/ja
Publication of JPS6245830U publication Critical patent/JPS6245830U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Drying Of Semiconductors (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例を示す縦断面図、第
2図は従来のドライエツチング装置の縦断面図で
ある。 6……下部電極、{11a……内チヤンバ、1
1b……外チヤンバ}真空チヤンバ、14……排
気口。
FIG. 1 is a longitudinal sectional view showing an embodiment of the present invention, and FIG. 2 is a longitudinal sectional view of a conventional dry etching apparatus. 6... Lower electrode, {11a... Inner chamber, 1
1b...Outer chamber} Vacuum chamber, 14...Exhaust port.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 真空チヤンバ内を真空排気しながら反応ガスを
導入しつつ、半導体ウエハを載置して上下動する
下部電極に高周波電力を印加し、プラズマ状態を
形成して半導体ウエハ上の被エツチング物をエツ
チングするドライエツチング装置において、真空
チヤンバの前記下部電極に対向する側壁に排気口
を開口し、該排気口を上下動する前記下部電極に
て開閉可能としたことを特徴とするドライエツチ
ング装置。
While evacuating the vacuum chamber and introducing a reactive gas, a semiconductor wafer is placed and high frequency power is applied to the lower electrode that moves up and down to form a plasma state and etch the object to be etched on the semiconductor wafer. A dry etching apparatus characterized in that an exhaust port is opened in a side wall of the vacuum chamber facing the lower electrode, and the exhaust port can be opened and closed by the lower electrode that moves up and down.
JP13642285U 1985-09-06 1985-09-06 Pending JPS6245830U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13642285U JPS6245830U (en) 1985-09-06 1985-09-06

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13642285U JPS6245830U (en) 1985-09-06 1985-09-06

Publications (1)

Publication Number Publication Date
JPS6245830U true JPS6245830U (en) 1987-03-19

Family

ID=31039518

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13642285U Pending JPS6245830U (en) 1985-09-06 1985-09-06

Country Status (1)

Country Link
JP (1) JPS6245830U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015194397A1 (en) * 2014-06-19 2015-12-23 東京エレクトロン株式会社 Plasma processing device
JP2017112217A (en) * 2015-12-16 2017-06-22 東京エレクトロン株式会社 Plasma processing device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015194397A1 (en) * 2014-06-19 2015-12-23 東京エレクトロン株式会社 Plasma processing device
JP2017112217A (en) * 2015-12-16 2017-06-22 東京エレクトロン株式会社 Plasma processing device
WO2017104442A1 (en) * 2015-12-16 2017-06-22 東京エレクトロン株式会社 Plasma treatment device

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