JPS6245664B2 - - Google Patents

Info

Publication number
JPS6245664B2
JPS6245664B2 JP52056062A JP5606277A JPS6245664B2 JP S6245664 B2 JPS6245664 B2 JP S6245664B2 JP 52056062 A JP52056062 A JP 52056062A JP 5606277 A JP5606277 A JP 5606277A JP S6245664 B2 JPS6245664 B2 JP S6245664B2
Authority
JP
Japan
Prior art keywords
ions
gas
orifice
vacuum chamber
region
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP52056062A
Other languages
English (en)
Japanese (ja)
Other versions
JPS53142294A (en
Inventor
Bii Furenchi Jon
Emu Riido Neiru
Ei Batsukurei Janetsuto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Toronto
Original Assignee
University of Toronto
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of Toronto filed Critical University of Toronto
Priority to JP5606277A priority Critical patent/JPS53142294A/ja
Publication of JPS53142294A publication Critical patent/JPS53142294A/ja
Publication of JPS6245664B2 publication Critical patent/JPS6245664B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP5606277A 1977-05-17 1977-05-17 Method and apparatus for focusing ions Granted JPS53142294A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5606277A JPS53142294A (en) 1977-05-17 1977-05-17 Method and apparatus for focusing ions

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5606277A JPS53142294A (en) 1977-05-17 1977-05-17 Method and apparatus for focusing ions

Publications (2)

Publication Number Publication Date
JPS53142294A JPS53142294A (en) 1978-12-11
JPS6245664B2 true JPS6245664B2 (cs) 1987-09-28

Family

ID=13016585

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5606277A Granted JPS53142294A (en) 1977-05-17 1977-05-17 Method and apparatus for focusing ions

Country Status (1)

Country Link
JP (1) JPS53142294A (cs)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0281379U (cs) * 1988-12-14 1990-06-22

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07118295B2 (ja) * 1985-10-30 1995-12-18 株式会社日立製作所 質量分析計
JP2002042721A (ja) * 2000-07-19 2002-02-08 Anelva Corp イオン付着質量分析装置
JP2010153278A (ja) * 2008-12-26 2010-07-08 Hitachi High-Technologies Corp 荷電粒子線加工装置
JP6126111B2 (ja) * 2011-11-21 2017-05-10 ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド 質量分析計においてカーテンガス流動を適用するためのシステムおよび方法
WO2019167026A1 (en) * 2018-03-02 2019-09-06 Dh Technologies Development Pte. Ltd. Integrated low cost curtain plate, orifice pcb and ion lens assembly

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0281379U (cs) * 1988-12-14 1990-06-22

Also Published As

Publication number Publication date
JPS53142294A (en) 1978-12-11

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