JPS6237467B2 - - Google Patents
Info
- Publication number
- JPS6237467B2 JPS6237467B2 JP9997780A JP9997780A JPS6237467B2 JP S6237467 B2 JPS6237467 B2 JP S6237467B2 JP 9997780 A JP9997780 A JP 9997780A JP 9997780 A JP9997780 A JP 9997780A JP S6237467 B2 JPS6237467 B2 JP S6237467B2
- Authority
- JP
- Japan
- Prior art keywords
- magnetic field
- loops
- bubble memory
- defective
- holding
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000015654 memory Effects 0.000 claims description 29
- 230000002950 deficient Effects 0.000 claims description 21
- 238000012360 testing method Methods 0.000 claims description 12
- 230000006866 deterioration Effects 0.000 claims description 3
- 230000006870 function Effects 0.000 claims description 2
- 230000007257 malfunction Effects 0.000 description 9
- 230000007547 defect Effects 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 4
- 238000012216 screening Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000007787 long-term memory Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000006403 short-term memory Effects 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/003—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation in serial memories
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9997780A JPS5727480A (en) | 1980-07-23 | 1980-07-23 | Tester for magnetic bubble memory selection |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9997780A JPS5727480A (en) | 1980-07-23 | 1980-07-23 | Tester for magnetic bubble memory selection |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5727480A JPS5727480A (en) | 1982-02-13 |
JPS6237467B2 true JPS6237467B2 (enrdf_load_stackoverflow) | 1987-08-12 |
Family
ID=14261719
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9997780A Granted JPS5727480A (en) | 1980-07-23 | 1980-07-23 | Tester for magnetic bubble memory selection |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5727480A (enrdf_load_stackoverflow) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0381197U (enrdf_load_stackoverflow) * | 1989-12-08 | 1991-08-20 |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59217287A (ja) * | 1983-05-25 | 1984-12-07 | Fujitsu Ltd | バブルメモリ素子の試験方法 |
JPS6314392A (ja) * | 1986-07-05 | 1988-01-21 | Fujitsu Ltd | 磁気バブルメモリ装置のコントロ−ル装置 |
-
1980
- 1980-07-23 JP JP9997780A patent/JPS5727480A/ja active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0381197U (enrdf_load_stackoverflow) * | 1989-12-08 | 1991-08-20 |
Also Published As
Publication number | Publication date |
---|---|
JPS5727480A (en) | 1982-02-13 |
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