JPS5727480A - Tester for magnetic bubble memory selection - Google Patents

Tester for magnetic bubble memory selection

Info

Publication number
JPS5727480A
JPS5727480A JP9997780A JP9997780A JPS5727480A JP S5727480 A JPS5727480 A JP S5727480A JP 9997780 A JP9997780 A JP 9997780A JP 9997780 A JP9997780 A JP 9997780A JP S5727480 A JPS5727480 A JP S5727480A
Authority
JP
Japan
Prior art keywords
magnetic field
pulsating
holding magnetic
tester
malfunction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9997780A
Other languages
Japanese (ja)
Other versions
JPS6237467B2 (en
Inventor
Minoru Hiroshima
Masahiro Yanai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP9997780A priority Critical patent/JPS5727480A/en
Publication of JPS5727480A publication Critical patent/JPS5727480A/en
Publication of JPS6237467B2 publication Critical patent/JPS6237467B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/003—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation in serial memories

Abstract

PURPOSE:To discover the malfunction at the operation of memories for a long time, so-called weak defective loop, in a short time, by pulsating a holding magnetic field at the operation of selection test. CONSTITUTION:Taking notice that malfunction of weak defective loop can be accelerated greatly by pulsating a holding magnetic field known conventionally, which is applied to suppress the deterioration of characteristic through start/stop operation, a bias current to produce a pulsating holding magnetic field is given to two orthogonal coils (X and coils) for rotating magnetic field generation to pulsate the holding magnetic field vector as shown in figure. Thus, the discovery of weak defective loop which cannot be discovered easily conventionally can be made in a short time, by using the means like this.
JP9997780A 1980-07-23 1980-07-23 Tester for magnetic bubble memory selection Granted JPS5727480A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9997780A JPS5727480A (en) 1980-07-23 1980-07-23 Tester for magnetic bubble memory selection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9997780A JPS5727480A (en) 1980-07-23 1980-07-23 Tester for magnetic bubble memory selection

Publications (2)

Publication Number Publication Date
JPS5727480A true JPS5727480A (en) 1982-02-13
JPS6237467B2 JPS6237467B2 (en) 1987-08-12

Family

ID=14261719

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9997780A Granted JPS5727480A (en) 1980-07-23 1980-07-23 Tester for magnetic bubble memory selection

Country Status (1)

Country Link
JP (1) JPS5727480A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59217287A (en) * 1983-05-25 1984-12-07 Fujitsu Ltd Testing method of bubble memory element
EP0201007A2 (en) * 1985-04-26 1986-11-12 Hitachi, Ltd. Method for measuring holding field of a magnetic bubble memory module using picture-frame-core
JPS6314392A (en) * 1986-07-05 1988-01-21 Fujitsu Ltd Controller for magnetic bubble memory device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0381197U (en) * 1989-12-08 1991-08-20

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59217287A (en) * 1983-05-25 1984-12-07 Fujitsu Ltd Testing method of bubble memory element
JPS622391B2 (en) * 1983-05-25 1987-01-19 Fujitsu Ltd
EP0201007A2 (en) * 1985-04-26 1986-11-12 Hitachi, Ltd. Method for measuring holding field of a magnetic bubble memory module using picture-frame-core
JPS6314392A (en) * 1986-07-05 1988-01-21 Fujitsu Ltd Controller for magnetic bubble memory device

Also Published As

Publication number Publication date
JPS6237467B2 (en) 1987-08-12

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