JPS62293738A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS62293738A
JPS62293738A JP13775286A JP13775286A JPS62293738A JP S62293738 A JPS62293738 A JP S62293738A JP 13775286 A JP13775286 A JP 13775286A JP 13775286 A JP13775286 A JP 13775286A JP S62293738 A JPS62293738 A JP S62293738A
Authority
JP
Japan
Prior art keywords
gate
cathode
electrode metal
finger
lead
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13775286A
Other languages
Japanese (ja)
Inventor
Yoshiaki Murayama
村山 美明
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Rectifier Corp Japan Ltd
Original Assignee
International Rectifier Corp Japan Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Rectifier Corp Japan Ltd filed Critical International Rectifier Corp Japan Ltd
Priority to JP13775286A priority Critical patent/JPS62293738A/en
Publication of JPS62293738A publication Critical patent/JPS62293738A/en
Pending legal-status Critical Current

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  • Electrodes Of Semiconductors (AREA)
  • Thyristors (AREA)

Abstract

PURPOSE:To equalize current shares in each finger section by forming a cathode electrode metal and a gate electrode metal to a symmetric pattern shape so that distances among respective finger section and the connecting sections of leads lead out of the upper sections of the cathode electrode metal and the gate electrode metal are all made uniform CONSTITUTION:The pattern shapes of electrode metals are formed symmetrically so that distances reaching the noses K1, K2..., and G1, G2... of each finger section in respective cathode region and gate region from the connecting sections 4a, 5a of a cathode lead 4 and a gate lead 5 are equalized. Consequently, lateral resistance R and reactance among cathode finger sections for respective GTO1, GTO2... and the connecting section 4a of the cathode lead 4 and lateral resistance R and reactance L among gate finger sections and the connecting section 5a of the gate lead 5 are all made uniform. Accordingly, the current shares of each finger section are equalized, thus uniformly operating respective finger section.

Description

【発明の詳細な説明】 3、発明の詳細な説明 [産業上の利用分野] この発明は、半導体装置に関し、特に、ゲート・ターン
・オフ・サイリスタ(以下、GTOと略記する)のゲー
ト・ターンφオンおよびゲート・ターン・オフ特性を改
善し得る電極構造を備えた半導体装置に関する。
[Detailed Description of the Invention] 3. Detailed Description of the Invention [Field of Industrial Application] The present invention relates to a semiconductor device, and in particular, to a gate turn off thyristor (hereinafter abbreviated as GTO). The present invention relates to a semiconductor device having an electrode structure that can improve φ-on and gate turn-off characteristics.

[従来の技術] 第3図および第4図にGTOの電極金属の引出し構造の
一例を示す。
[Prior Art] FIGS. 3 and 4 show an example of an electrode metal lead-out structure of a GTO.

これらの図において、GTOを形成する半導体基板1に
は、Pc −Na −PR−NEの四層が形成され、こ
の半導体基板1のNE層上にカソード電極金属2が設け
られ、また、28層上にはゲート電極金属3が設けられ
ている。
In these figures, four layers of Pc-Na-PR-NE are formed on a semiconductor substrate 1 forming a GTO, a cathode electrode metal 2 is provided on the NE layer of this semiconductor substrate 1, and 28 layers are formed. A gate electrode metal 3 is provided on top.

これらのカソード1!極金属2およびゲート電極金属3
は、その直下のNE層および28層のパターン形状に合
せて互いにくし歯状に入り組む複数のフィンガ部2a、
3aを有している。
These cathodes 1! Pole metal 2 and gate electrode metal 3
is a plurality of finger portions 2a that intertwine with each other in a comb-like shape according to the pattern shapes of the NE layer and the 28th layer immediately below;
3a.

上記のカソード電極金属2、ゲート電極金属3の表面”
の基幹部からワイヤ・ポンディングなどにより、それぞ
れ外部へカンードリード線4、ゲートリード線5が引き
出される。
The surfaces of the above cathode electrode metal 2 and gate electrode metal 3"
Cando lead wires 4 and gate lead wires 5 are respectively drawn out from the core of the main body by wire bonding or the like.

[発明が解決しようとする問題点] 上記のような電極金属の引出し構造を有するGTOにお
いて、ゲートを負にバイアスすることによってゲート・
ターン・オフさせる場合1次のような問題点がある。
[Problems to be Solved by the Invention] In a GTO having the above-mentioned electrode metal lead-out structure, by biasing the gate negatively, the gate
When turning off, there are the following problems.

すなわち、カソード領域およびゲート領域の各フィンガ
部に流れる電流は、これらカソード領域およびゲート領
域上の電極金属2.3の各部から外部へ引き出されるカ
ソードリード線4およびゲートリード線5の接続部4a
、5aまでに至る距離がそのパターン形状の相違により
異なり、その間の横方向抵抗およびリアクタンスがそれ
ぞれ相違するため均等にならない。
That is, the current flowing through each finger portion of the cathode region and the gate region is transferred to the connecting portion 4a of the cathode lead wire 4 and the gate lead wire 5, which are drawn out from each portion of the electrode metal 2.3 on the cathode region and the gate region.
, 5a differs due to the difference in pattern shape, and the lateral resistance and reactance between them are different, so they are not equal.

例えば、上記第3図のような電極金属パターンでは、カ
ソード電流は、カソードリード線4の接続部4aに近い
に3が最大となり、カソードリード線4の接続部4aか
ら遠ざかるに比例して小さくなる。すなわち、Kコ> 
K 2 > K +となる。
For example, in the electrode metal pattern shown in FIG. 3 above, the cathode current is at a maximum near the connection part 4a of the cathode lead wire 4, and decreases in proportion to the distance from the connection part 4a of the cathode lead wire 4. . In other words, K >
K 2 > K +.

また、ゲート電流もゲートリード線5の接続部5aに近
いG3が最大となり、ゲートリード線5の接続部5aか
ら遠ざかるに比例して小さくなる。すなわち、G3 >
G2 >Glとなるため、電流分担が均一にならず、し
たがって各フィンガ部の均一動作ができないという問題
点があった。
Further, the gate current also becomes maximum at G3 near the connection portion 5a of the gate lead wire 5, and decreases in proportion to the distance from the connection portion 5a of the gate lead wire 5. That is, G3>
Since G2 > Gl, there is a problem in that the current distribution is not uniform, and therefore, each finger section cannot operate uniformly.

[発明の目的] この発明は、上記のような問題点を解決するためになさ
れたもので、各フィンガ部の電流分担が均一になり、各
フィンガ部とも均一動作ができ、ゲートΦターン拳オン
およびゲート・ターン−オフ特性を改善し得る半導体装
置を提供することを目的とする。
[Purpose of the Invention] This invention was made to solve the above-mentioned problems, and the current distribution among the finger parts becomes uniform, each finger part can operate uniformly, and the gate Φ turn fist is turned on. Another object of the present invention is to provide a semiconductor device that can improve gate turn-off characteristics.

[問題点を解決するための手段] この発明に係る半導体装置は、各フィンガ部と、カソー
ド電極金属およびゲート電極金属上から引き出されるリ
ード線の接続部との距離がすべて等しくなるようにカソ
ード電極金属およびゲート電極金属を対称のパターン形
状に形成したものである− [作用] この発明の半導体装置においては、各フィンガ部での横
方向抵抗およびリアクタンスが等しくなり、各フィンガ
部における電流分担が均一になる。
[Means for Solving the Problems] In the semiconductor device according to the present invention, the cathode electrode is connected so that the distances between each finger portion and the connection portion of the lead wire drawn out from the cathode electrode metal and the gate electrode metal are all equal. The metal and the gate electrode metal are formed in a symmetrical pattern. [Function] In the semiconductor device of the present invention, the lateral resistance and reactance in each finger portion are equal, and the current distribution in each finger portion is uniform. become.

[実施例] 以下、この発明の一実施例を図について説明する。[Example] An embodiment of the present invention will be described below with reference to the drawings.

第1図(A)は、この発明の半導体装置における引出し
電極構造のパターン形状を模式的に示す模式図、同図(
B)は、上記パターン形状の電極構造を有する場合の等
価回路図である。
FIG. 1(A) is a schematic diagram schematically showing the pattern shape of the extraction electrode structure in the semiconductor device of the present invention, and FIG.
B) is an equivalent circuit diagram when the electrode structure has the above pattern shape.

この発明では、カソードリード線4およびゲートリード
線5の接続部4a、5aからそれぞれのカソード領域お
よびゲート領域の各フィンガ部の先端に+  、に2 
 、に3  、に4・・・・・・およびGl+G2 1
G3  、GA・・・・・−に至る距離が等しくなるよ
うに電極金属のパターン形状を対称に形成しである。
In this invention, from the connecting portions 4a and 5a of the cathode lead wire 4 and gate lead wire 5 to the tips of the respective finger portions of the cathode region and the gate region, + and 2 are connected.
, ni3, ni4...and Gl+G2 1
The pattern shape of the electrode metal is formed symmetrically so that the distances to G3, GA, . . . - are equal.

そのため、同図(B)に示すように、それぞれのGTO
I 、 GTO2、GTO3・・・・・・のカソードフ
ィンガ部 1−カソードリード線4の接続部4a間の横
方向抵抗Rおよびリアクタンス、ゲートフィンガ部−ゲ
ートリード&Ia5の接続部5a間の横方向抵抗Rおよ
びリアクタンスLがすべて等しくなる。
Therefore, as shown in the same figure (B), each GTO
I, Cathode finger part of GTO2, GTO3... Lateral resistance R and reactance between 1 and connection part 4a of cathode lead wire 4, Lateral resistance between gate finger part and connection part 5a of gate lead &Ia5 R and reactance L are all equal.

第2図は、実際の電極金属のパターン形状を示す平面図
であり、カソード電極金属2およびゲート電極金属3が
最外側で一体的に接続されるように階段状に対称形状と
成しである。
FIG. 2 is a plan view showing the actual pattern shape of the electrode metal, which is formed in a stepwise symmetrical shape so that the cathode electrode metal 2 and the gate electrode metal 3 are integrally connected at the outermost side. .

上記のように、この発明は、カソードリード線4および
ゲートリード線5の接続部4a、5aからそれぞれのカ
ソード領域およびゲート領域の各フィンガ部の先端に至
る距離が等しくなるように電極金属のパターン形状を対
称に形成したため、各フィンガ部での電流分担が均一と
なる。
As described above, in the present invention, the electrode metal is patterned so that the distances from the connecting parts 4a and 5a of the cathode lead wire 4 and the gate lead wire 5 to the tips of the finger parts of the respective cathode and gate regions are equal. Since the shape is formed symmetrically, the current distribution in each finger portion is uniform.

[発明の効果] 以上の説明から明らかなように、この発明によれば、各
フィンガ部と、カソード電極金属およびゲ−ト電極金属
上から引き出されるリード線の接続部との一距敲がすべ
て等しくなるようにカソード電極金属およびゲート電極
金属を対称のパターン形状に形成したので、各フィンガ
部での電流分担が均一となり、したがって各フィンガ部
とも均一動作ができ、GTOのゲート・ターン・オンお
よびゲート・ターン・オフ特性を改善し得る等の優れた
効果を奏する。
[Effects of the Invention] As is clear from the above description, according to the present invention, the distance between each finger portion and the connection portion of the lead wire drawn out from the cathode electrode metal and the gate electrode metal is all Since the cathode electrode metal and the gate electrode metal are formed in a symmetrical pattern shape so that they are equal, the current distribution in each finger part is uniform, and therefore each finger part can operate uniformly, and the GTO gate turn-on and It has excellent effects such as improving gate turn-off characteristics.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図(A)は、この発明の半導体装置における引出し
電極構造のパターン形状を模式的に示す模式図、同図(
B)は、上記パターン形状の電極構造を有する場合の等
価回路図、第2図は、この発明の実際の電極金属のパタ
ーン形状を示す平面図、第3図および第4図は、従来の
半導体装置の引出し電極構造を示す平面図および断面図
である。 2・・・カソード電極金属、 3・・・ゲート電極金属、 4・・・カソードリード線、 4a、5a・・・接続部、 5・・・ ゲートリード線。
FIG. 1(A) is a schematic diagram schematically showing the pattern shape of the extraction electrode structure in the semiconductor device of the present invention, and FIG.
B) is an equivalent circuit diagram when the electrode structure has the above pattern shape, FIG. 2 is a plan view showing the actual pattern shape of the electrode metal of the present invention, and FIGS. 3 and 4 are diagrams of the conventional semiconductor. FIG. 3 is a plan view and a cross-sectional view showing the extraction electrode structure of the device. 2... Cathode electrode metal, 3... Gate electrode metal, 4... Cathode lead wire, 4a, 5a... Connection portion, 5... Gate lead wire.

Claims (1)

【特許請求の範囲】[Claims] 複数のフィンガ部を有し、カソード領域とゲート領域が
互いにくし歯状に入り組み、これらカソード領域とゲー
ト領域上にそれぞれカソード電極金属およびゲート電極
金属とが設けられ、前記カソード電極金属およびゲート
電極金属上からそれぞれ外部にリード線が引き出される
構造を備えた半導体装置において、前記各フィンガ部と
、前記カソード電極金属およびゲート電極金属上から引
き出されるリード線の接続部との距離がすべて等しくな
るように前記カソード電極金属およびゲート電極金属を
対称のパターン形状に形成したことを特徴とする半導体
装置。
It has a plurality of finger parts, a cathode region and a gate region are intertwined with each other in a comb-like shape, and a cathode electrode metal and a gate electrode metal are respectively provided on the cathode region and the gate region, and the cathode electrode metal and gate electrode In a semiconductor device having a structure in which lead wires are drawn out from above the metal, the distances between each of the finger parts and the connection parts of the lead wires drawn out from the cathode electrode metal and the gate electrode metal are all equal. A semiconductor device characterized in that the cathode electrode metal and the gate electrode metal are formed in a symmetrical pattern shape.
JP13775286A 1986-06-13 1986-06-13 Semiconductor device Pending JPS62293738A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13775286A JPS62293738A (en) 1986-06-13 1986-06-13 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13775286A JPS62293738A (en) 1986-06-13 1986-06-13 Semiconductor device

Publications (1)

Publication Number Publication Date
JPS62293738A true JPS62293738A (en) 1987-12-21

Family

ID=15206005

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13775286A Pending JPS62293738A (en) 1986-06-13 1986-06-13 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS62293738A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04123554U (en) * 1991-04-24 1992-11-09 株式会社明電舎 semiconductor equipment
US5204735A (en) * 1988-04-21 1993-04-20 Kabushiki Kaisha Toshiba High-frequency semiconductor device having emitter stabilizing resistor and method of manufacturing the same

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5895865A (en) * 1981-12-02 1983-06-07 Hitachi Ltd Gate turn off thyristor
JPS6046553A (en) * 1983-08-25 1985-03-13 Nippon Telegr & Teleph Corp <Ntt> Method and device for pattern formation

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5895865A (en) * 1981-12-02 1983-06-07 Hitachi Ltd Gate turn off thyristor
JPS6046553A (en) * 1983-08-25 1985-03-13 Nippon Telegr & Teleph Corp <Ntt> Method and device for pattern formation

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5204735A (en) * 1988-04-21 1993-04-20 Kabushiki Kaisha Toshiba High-frequency semiconductor device having emitter stabilizing resistor and method of manufacturing the same
JPH04123554U (en) * 1991-04-24 1992-11-09 株式会社明電舎 semiconductor equipment

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