JPS6228874B2 - - Google Patents

Info

Publication number
JPS6228874B2
JPS6228874B2 JP54043774A JP4377479A JPS6228874B2 JP S6228874 B2 JPS6228874 B2 JP S6228874B2 JP 54043774 A JP54043774 A JP 54043774A JP 4377479 A JP4377479 A JP 4377479A JP S6228874 B2 JPS6228874 B2 JP S6228874B2
Authority
JP
Japan
Prior art keywords
test
pattern
expected value
input
main memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54043774A
Other languages
English (en)
Japanese (ja)
Other versions
JPS55135762A (en
Inventor
Junji Nishiura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP4377479A priority Critical patent/JPS55135762A/ja
Priority to US06/069,345 priority patent/US4313200A/en
Publication of JPS55135762A publication Critical patent/JPS55135762A/ja
Publication of JPS6228874B2 publication Critical patent/JPS6228874B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
JP4377479A 1978-08-28 1979-04-11 Ic test unit Granted JPS55135762A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP4377479A JPS55135762A (en) 1979-04-11 1979-04-11 Ic test unit
US06/069,345 US4313200A (en) 1978-08-28 1979-08-24 Logic test system permitting test pattern changes without dummy cycles

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4377479A JPS55135762A (en) 1979-04-11 1979-04-11 Ic test unit

Publications (2)

Publication Number Publication Date
JPS55135762A JPS55135762A (en) 1980-10-22
JPS6228874B2 true JPS6228874B2 (OSRAM) 1987-06-23

Family

ID=12673091

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4377479A Granted JPS55135762A (en) 1978-08-28 1979-04-11 Ic test unit

Country Status (1)

Country Link
JP (1) JPS55135762A (OSRAM)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4502127A (en) * 1982-05-17 1985-02-26 Fairchild Camera And Instrument Corporation Test system memory architecture for passing parameters and testing dynamic components

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5585265A (en) * 1978-12-23 1980-06-27 Toshiba Corp Function test evaluation device for integrated circuit

Also Published As

Publication number Publication date
JPS55135762A (en) 1980-10-22

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