JPS6226418B2 - - Google Patents

Info

Publication number
JPS6226418B2
JPS6226418B2 JP54061438A JP6143879A JPS6226418B2 JP S6226418 B2 JPS6226418 B2 JP S6226418B2 JP 54061438 A JP54061438 A JP 54061438A JP 6143879 A JP6143879 A JP 6143879A JP S6226418 B2 JPS6226418 B2 JP S6226418B2
Authority
JP
Japan
Prior art keywords
target object
inspection
image signal
imaging device
dimensional
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54061438A
Other languages
English (en)
Japanese (ja)
Other versions
JPS55154442A (en
Inventor
Yasuo Nakagawa
Hiroshi Makihira
Toshimitsu Hamada
Makoto Uko
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP6143879A priority Critical patent/JPS55154442A/ja
Publication of JPS55154442A publication Critical patent/JPS55154442A/ja
Publication of JPS6226418B2 publication Critical patent/JPS6226418B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Monitoring And Testing Of Nuclear Reactors (AREA)
JP6143879A 1979-05-21 1979-05-21 Inspecting apparatus Granted JPS55154442A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6143879A JPS55154442A (en) 1979-05-21 1979-05-21 Inspecting apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6143879A JPS55154442A (en) 1979-05-21 1979-05-21 Inspecting apparatus

Publications (2)

Publication Number Publication Date
JPS55154442A JPS55154442A (en) 1980-12-02
JPS6226418B2 true JPS6226418B2 (enExample) 1987-06-09

Family

ID=13171063

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6143879A Granted JPS55154442A (en) 1979-05-21 1979-05-21 Inspecting apparatus

Country Status (1)

Country Link
JP (1) JPS55154442A (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0612244B2 (ja) * 1983-11-18 1994-02-16 トキコ株式会社 溝検出装置
JP5764093B2 (ja) * 2012-06-04 2015-08-12 株式会社日立パワーソリューションズ 検査システムおよび検査方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5379594A (en) * 1976-12-24 1978-07-14 Hitachi Ltd Surface inspecting apparatus of objects

Also Published As

Publication number Publication date
JPS55154442A (en) 1980-12-02

Similar Documents

Publication Publication Date Title
US7342655B2 (en) Inspecting apparatus and method for foreign matter
GB2036301A (en) Foreign matter detecting device
US8058607B2 (en) Machine for inspecting glass containers at an inspection station using an addition of a plurality of illuminations of reflected light
JPS6212845A (ja) 壜のねじ口部欠陥検出装置
JPH0345784B2 (enExample)
JPH06138056A (ja) 固体上の異物検査方法
US20080093538A1 (en) Machine for inspecting glass containers
EP0422845B1 (en) System for inspecting bearing balls for defects
JP2000314705A (ja) 物品の側面検査装置
KR101587982B1 (ko) 용기 주둥이부 검사 방법 및 장치
JP2010151473A (ja) ねじ口壜の検査装置
JPH0634573A (ja) 瓶検査装置
JPS6357731B2 (enExample)
JPH0797087B2 (ja) 容器割目の検査
JPS6226418B2 (enExample)
JPS6212463B2 (enExample)
JP2990820B2 (ja) 表面欠陥検査装置
JPH0752161B2 (ja) 透明容器内の粉末中異物の検査装置
JP2846052B2 (ja) 円筒体の検査装置
JP2018128261A (ja) 検査装置および方法
JP2000346813A (ja) 物品の表面検査装置
JP2005003406A (ja) 円形断面を有する容器の検査装置
JP3130548B2 (ja) 画像処理装置
JPH043820B2 (enExample)
JPH07104289B2 (ja) びん口検査装置