JPS622338B2 - - Google Patents
Info
- Publication number
- JPS622338B2 JPS622338B2 JP55187229A JP18722980A JPS622338B2 JP S622338 B2 JPS622338 B2 JP S622338B2 JP 55187229 A JP55187229 A JP 55187229A JP 18722980 A JP18722980 A JP 18722980A JP S622338 B2 JPS622338 B2 JP S622338B2
- Authority
- JP
- Japan
- Prior art keywords
- data
- scan
- test
- memory
- normal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/0706—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment
- G06F11/073—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment in a memory management context, e.g. virtual memory or cache management
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55187229A JPS57111754A (en) | 1980-12-29 | 1980-12-29 | Scan system testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55187229A JPS57111754A (en) | 1980-12-29 | 1980-12-29 | Scan system testing device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57111754A JPS57111754A (en) | 1982-07-12 |
| JPS622338B2 true JPS622338B2 (OSRAM) | 1987-01-19 |
Family
ID=16202315
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55187229A Granted JPS57111754A (en) | 1980-12-29 | 1980-12-29 | Scan system testing device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57111754A (OSRAM) |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3873818A (en) * | 1973-10-29 | 1975-03-25 | Ibm | Electronic tester for testing devices having a high circuit density |
-
1980
- 1980-12-29 JP JP55187229A patent/JPS57111754A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57111754A (en) | 1982-07-12 |
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