JPS57111754A - Scan system testing device - Google Patents

Scan system testing device

Info

Publication number
JPS57111754A
JPS57111754A JP55187229A JP18722980A JPS57111754A JP S57111754 A JPS57111754 A JP S57111754A JP 55187229 A JP55187229 A JP 55187229A JP 18722980 A JP18722980 A JP 18722980A JP S57111754 A JPS57111754 A JP S57111754A
Authority
JP
Japan
Prior art keywords
scan
testing
data
input
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55187229A
Other languages
English (en)
Other versions
JPS622338B2 (ja
Inventor
Tsuguhito Serizawa
Toshishige Ando
Toshio Karino
Shozo Toda
Kazuya Kobayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP55187229A priority Critical patent/JPS57111754A/ja
Publication of JPS57111754A publication Critical patent/JPS57111754A/ja
Publication of JPS622338B2 publication Critical patent/JPS622338B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0706—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment
    • G06F11/073—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment in a memory management context, e.g. virtual memory or cache management
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP55187229A 1980-12-29 1980-12-29 Scan system testing device Granted JPS57111754A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55187229A JPS57111754A (en) 1980-12-29 1980-12-29 Scan system testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55187229A JPS57111754A (en) 1980-12-29 1980-12-29 Scan system testing device

Publications (2)

Publication Number Publication Date
JPS57111754A true JPS57111754A (en) 1982-07-12
JPS622338B2 JPS622338B2 (ja) 1987-01-19

Family

ID=16202315

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55187229A Granted JPS57111754A (en) 1980-12-29 1980-12-29 Scan system testing device

Country Status (1)

Country Link
JP (1) JPS57111754A (ja)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5075343A (ja) * 1973-10-29 1975-06-20

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5075343A (ja) * 1973-10-29 1975-06-20

Also Published As

Publication number Publication date
JPS622338B2 (ja) 1987-01-19

Similar Documents

Publication Publication Date Title
DE3886038D1 (de) Speichergerät, das einen zur Ausführung einer Selbstprüfung adaptierten statischen RAM-Speicher enthält und integrierte Schaltung, die als eingebauten statischen RAM-Speicher ein solches Gerät enthält.
GB1430467A (en) Programmable logic circuits for controlling auxiliary functions on machine tools
JPS5585265A (en) Function test evaluation device for integrated circuit
JPS57189397A (en) Semiconductor storage device
JPS6491074A (en) Memory-contained logic lsi and testing thereof
KR880008341A (ko) 특수 모드용 prom 셀들이 있는 반도체장치
KR980003618A (ko) 메모리 시험 장치
JPS57111754A (en) Scan system testing device
DE69030209D1 (de) Durch Ereigniss befähigte Prüfarchitektur für integrierte Schaltungen
JPS57208697A (en) Semiconductor storage device
JPS6447972A (en) Memory ic testing circuit
JPS5715296A (en) Testing system for storage device
JPS5564699A (en) Semiconductor integrated-circuit memory
JPS5556262A (en) Operation hysteresis retention system
JPS56157546A (en) Instruction trace device
JPS57133588A (en) Storage device of integrated circuit
JPS5798174A (en) Semiconductor storage device
JPS56153595A (en) Integrated circuit for memory
JPS57111895A (en) Storage device having scan-out function
JPS56169293A (en) Memory testing circuit
JPS5736331A (ja) Basurainsochi
JPS5547547A (en) Control device
JPS56140440A (en) Memory pattern generating devce
JPS57167196A (en) Memory circuit
JPS6425400A (en) Circuit for testing access time