JPS62224043A - Semiconductor integrated circuit device - Google Patents

Semiconductor integrated circuit device

Info

Publication number
JPS62224043A
JPS62224043A JP61065770A JP6577086A JPS62224043A JP S62224043 A JPS62224043 A JP S62224043A JP 61065770 A JP61065770 A JP 61065770A JP 6577086 A JP6577086 A JP 6577086A JP S62224043 A JPS62224043 A JP S62224043A
Authority
JP
Japan
Prior art keywords
terminal pad
circuit
peripheral circuit
parts
wiring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP61065770A
Other languages
Japanese (ja)
Inventor
Yasunaga Suzuki
康永 鈴木
Hiroaki Mizoguchi
溝口 弘明
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Microcomputer System Ltd
Hitachi Ltd
Original Assignee
Hitachi Ltd
Hitachi Microcomputer Engineering Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd, Hitachi Microcomputer Engineering Ltd filed Critical Hitachi Ltd
Priority to JP61065770A priority Critical patent/JPS62224043A/en
Publication of JPS62224043A publication Critical patent/JPS62224043A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
    • H01L27/04Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body
    • H01L27/10Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration
    • H01L27/118Masterslice integrated circuits
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/02Bonding areas ; Manufacturing methods related thereto
    • H01L24/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L24/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/04042Bonding areas specifically adapted for wire connectors, e.g. wirebond pads
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H01L2224/0554External layer
    • H01L2224/0555Shape
    • H01L2224/05552Shape in top view
    • H01L2224/05554Shape in top view being square
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H01L2224/0554External layer
    • H01L2224/0555Shape
    • H01L2224/05556Shape in side view
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/48463Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/14Integrated circuits

Abstract

PURPOSE:To increase the freedom of position and number of introduce power source leads without decreasing the number of peripheral circuit parts available to be used, by arranging a semiconductor base under the whole region where power source leads can be introduced to constitute a wiring. CONSTITUTION:Internal circuit parts 7, peripheral circuit parts 3 and terminal pad parts 4 are arranged in a gate array IC. Circuit elements capable of constituting arbitrarily either one of an input buffer circuit and an output buffer circuit on an input/output buffer circuit are previously formed in the respective peripheral circuit parts 3 as a semiconductor base. A terminal pad part 4A for a power source lead is arbitrarily selected out of many terminal pad parts 4, and power leads are introduced to the internal circuit parts 7 through power leads introducing wirings 8, which are arranged on a surface insulating film of the part where circuit elements of the peripheral circuit parts 3 are formed. Thereby, freedom of position to introduce the power leads can be increased without decreasing the number of peripheral circuits available to be used and almost without producing useless dead space.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、半導体集積回路技術、さらにはゲートアレ
イLSI(大規模集積回路装置)に適用して有効な技術
に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to semiconductor integrated circuit technology, and further to technology that is effective when applied to gate array LSIs (large scale integrated circuit devices).

〔従来の技術〕[Conventional technology]

ゲートアレイIC(半導体集積回路装置)は、たとえば
日経マグロウヒル社刊行[日経エレクトロニクス 19
85年6月3日号」151〜177頁(解説: 100
0億円市場が間近に迫ったゲートアレイ)に記載されて
いるように、半導体基板にあらかじめ下地の形で用意さ
れた多数の回路要素を任意に配線することにより所望の
回路機能を実現するものでありて、いわゆるセミカスタ
ムICとも呼ばれている。
Gate array ICs (semiconductor integrated circuit devices) are, for example, published by Nikkei McGraw-Hill [Nikkei Electronics 19
June 3, 1985 issue, pages 151-177 (commentary: 100
Gate arrays, which are about to reach a billion yen market, realize desired circuit functions by arbitrarily wiring a large number of circuit elements prepared in the form of bases on a semiconductor substrate. Therefore, it is also called a so-called semi-custom IC.

ここで、本発明者は、上記ゲートアレイICのレイアウ
ト構成について検討した。以下は、公知とされた技術で
はないが、本発明者によって開発、検討された技術であ
り、その概要は次のとおりである。
Here, the inventor studied the layout configuration of the gate array IC. Although the following is not a publicly known technique, it is a technique developed and studied by the present inventor, and its outline is as follows.

第3図はそれぞれ本発明者によって検討されたゲートア
レイICのレイアウト構成を示す。
FIG. 3 shows layout configurations of gate array ICs studied by the present inventors.

同図に示すゲートアレイICには、任意の論理回路網が
構成される内部回路部7、周辺回路部3、および端子パ
ッド部4が配設されている。
The gate array IC shown in the figure is provided with an internal circuit section 7, a peripheral circuit section 3, and a terminal pad section 4, which constitute an arbitrary logic circuit network.

内部回路部7は半導体基板1の中央部に大きく割り振ら
れて配置されている。この内部回路部7には多数本の基
本セルアレイ5が配設されている。
The internal circuit section 7 is arranged in a large portion at the center of the semiconductor substrate 1. A large number of basic cell arrays 5 are arranged in this internal circuit section 7.

各基本セルアレイ5は互いに平行に配設されている。こ
れとともに、各基本セルアレイ5の間にはそれぞれ所定
幅の配線領域7が設けられている。
Each basic cell array 5 is arranged parallel to each other. Along with this, a wiring region 7 having a predetermined width is provided between each basic cell array 5.

基本セルアレイ5は多数の基本セル6を一方向(図では
行方向)に配列したものである。各基本セル6内にはそ
れぞれ、論理ゲートを構成するための回路要素が半導体
下地の形であらかじめ形成されている。各基本セル6内
に形成される回路要素の種類と数およびその配置状態な
どはあらかじめ規格化されている。
The basic cell array 5 has a large number of basic cells 6 arranged in one direction (in the row direction in the figure). In each basic cell 6, circuit elements for forming a logic gate are formed in advance in the form of a semiconductor base. The type and number of circuit elements formed in each basic cell 6, their arrangement, etc. are standardized in advance.

他方、上記内部回路部7を取り囲んで多数の周辺回路s
3が配置され、さらに各周辺回路部3の外側にはそれぞ
れボンディング用の端子パッド部4が配置されている。
On the other hand, a large number of peripheral circuits s surround the internal circuit section 7.
3 are arranged, and terminal pad parts 4 for bonding are arranged on the outside of each peripheral circuit part 3, respectively.

各周辺回路部3にはそれぞれ、入力バッファ回路、出力
バラフッ回路、あるいは入出刃バッファ回路のいずれか
を任意に構成することができるだけの回路要素が半導体
下地の形であらかじめ形成されている。内部回路部7の
入出力信号は、その周辺回路部3によりて構成されたバ
ッファ回路および端子パッド部4を介して外部へ導出あ
るいは外部から導入される。
In each peripheral circuit section 3, circuit elements are formed in advance in the form of a semiconductor base to form any one of an input buffer circuit, an output balance circuit, or an input/output buffer circuit. Input/output signals of the internal circuit section 7 are led out or introduced from the outside via the buffer circuit constituted by the peripheral circuit section 3 and the terminal pad section 4.

ここで、上記ゲートアレイICの動作電源VCCは、特
定位置の端子パッド部4Aを電源用に指定し、この電源
用端子パッド部4Aから電源引込配線8を介して内部回
路部7および周辺回路部3に引き込まれる。電源用端子
パッド部4Aの下は、電源引込配N8を通すために空き
スペース9にしである。この空きスペース9は、本来は
周辺回路部3が形成されるところであるが、大きな電流
容量をもつ幅広の電源引込配#8を通すので、周辺回路
部3を形成するための下地をつくったとしてもこの周辺
回路を構成するための配線を形成することができず意味
がないとの理由で下地が形成されていなかった。
Here, the operating power supply VCC of the gate array IC is supplied to the internal circuit section 7 and the peripheral circuit section from the terminal pad section 4A at a specific position designated as a power supply via the power supply terminal pad section 4A through the power lead-in wiring 8. Drawn to 3. There is an empty space 9 under the power supply terminal pad portion 4A for passing the power supply lead-in wiring N8. This empty space 9 is originally where the peripheral circuit section 3 will be formed, but since the wide power supply lead-in wiring #8 with a large current capacity is passed through, it can be used as a base for forming the peripheral circuit section 3. However, the base was not formed because it was thought that there was no point in forming the wiring for configuring this peripheral circuit.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

しかしながら、上述した技術には、次のような問題点の
あることが本発明者によってあきらかとされた。
However, the inventors have found that the above-mentioned technique has the following problems.

すなわち、前記したように電源引込配線ライン8の位置
はあらかじめ固定されているのであるが、ときには顧客
要求や実装上の理由によりその位置を変更する必要が生
じる。この変更がおこなわれると、もとの電源引込配線
布線予定領域下には下地が形成されていないために、そ
の部分は入出力バッ7アを形成するのに利用することが
できないのでむだなあきスペースとなってしまう。
That is, although the position of the power supply wiring line 8 is fixed in advance as described above, it may sometimes be necessary to change the position due to customer requests or mounting reasons. If this change is made, there is no base layer formed under the original planned area for wiring the power supply wiring, so that area cannot be used to form the input/output buffer, so it is a waste of time. This results in empty space.

本発明の目的は、ゲートアレイICにおける使用可能な
周辺回路部の数を減らすことなく、かつ無駄な空きスペ
ースをほとんど生じさせずに、電源引込の位置および数
の自由度を大幅に高められるようにする、という技術を
提供するものである。
An object of the present invention is to greatly increase the degree of freedom in the position and number of power supply connections without reducing the number of usable peripheral circuit sections in a gate array IC and without creating nearly any wasted empty space. This technology provides the technology to do this.

本発明の前記ならびにそのほかの目的と新規な特徴は、
本明細書の記述および添付図面からあきらかになるであ
ろう。
The above and other objects and novel features of the present invention include:
It will become clear from the description of this specification and the accompanying drawings.

〔問題点を解決するための手段〕[Means for solving problems]

本願において開示される発明のうち代表的なものの概要
を)ム〕単に説明すれば、下Hピのとおりである。
A brief summary of typical inventions disclosed in this application is as shown below.

すなわち、端子バッド部から延在する電源引込配線布線
可能領域下にはすべて半導体下地を設けておく。電源引
込配線ラインは光面絶縁膜上に布線され、その電源引込
配線が布線されたところの周辺回路部表面絶縁膜下にも
半導体素子を配置しておくのである。
That is, a semiconductor base is provided entirely under the area where the power supply wiring can be laid extending from the terminal pad portion. The power lead-in wiring line is wired on the optical surface insulating film, and the semiconductor element is also arranged under the surface insulating film of the peripheral circuit section where the power lead-in wiring is wired.

〔作用〕[Effect]

上記した手段によれば、電源引込配線位置の変更がおこ
なわれても、もとのスペース下洗は下地が形成されてい
るためにここを人出力バッファとして使用でき入出力バ
ッファ数が減少することが防止できる。
According to the above-mentioned means, even if the power supply wiring position is changed, the original space can be used as a human output buffer because the base has been formed, and the number of input/output buffers can be reduced. can be prevented.

〔実施例〕〔Example〕

以下、本発明の好適な実施例を図面に基づいて説明する
Hereinafter, preferred embodiments of the present invention will be described based on the drawings.

なお、各図中、同一符号は同一あるいは相当部分を示す
In each figure, the same reference numerals indicate the same or corresponding parts.

第1図はこの発明による技術が適用されたゲートアレイ
ICのレイアウト構成を示す。
FIG. 1 shows the layout configuration of a gate array IC to which the technology according to the present invention is applied.

先ず、同図に示すゲートアレイICには、任意の論理回
路網が構成される内部回路部7、周辺回踏部3、および
端子パッド部4が配設されている。
First, the gate array IC shown in the figure is provided with an internal circuit section 7, a peripheral circuit section 3, and a terminal pad section 4, in which an arbitrary logic circuit network is constructed.

内部回路部7は半導体基板1の中央部に大きく割り振ら
れて配置されている。この内部回路部7には多数本の基
本セルアレイ5が配設されている。
The internal circuit section 7 is arranged in a large portion at the center of the semiconductor substrate 1. A large number of basic cell arrays 5 are arranged in this internal circuit section 7.

各基本セルアレイ5は互いに平行に配設されている。こ
れとともK、各基本セルアレイ5の間にはそれぞれ所定
幅の配線領域7が設けられている。
Each basic cell array 5 is arranged parallel to each other. In addition, a wiring region 7 having a predetermined width is provided between each basic cell array 5.

基本セルアレイ5は多数の基本セル6を一方向(図では
行方向)に配列したものである。各基本セル6内にはそ
れぞれ、論理ゲートを構成するための回路要素が半導体
下地の形であらかじめ形成されている。各基本セル6内
に形成される回路要素の種類と数およびその配置状態な
どはあらかじめ規格化されている。
The basic cell array 5 has a large number of basic cells 6 arranged in one direction (in the row direction in the figure). In each basic cell 6, circuit elements for forming a logic gate are formed in advance in the form of a semiconductor base. The type and number of circuit elements formed in each basic cell 6, their arrangement, etc. are standardized in advance.

他方、上記内部回路部7を取り囲んで多数の周辺回路部
3が配置され、さらに各周辺回路部3の外側にはそれぞ
れポンディング用の端子パッド部4が配置されている。
On the other hand, a large number of peripheral circuit sections 3 are arranged surrounding the internal circuit section 7, and terminal pad sections 4 for bonding are arranged on the outside of each peripheral circuit section 3, respectively.

各周辺回路s3にはそれぞれ、入力バッファ回路、出力
バッファ回路、あるいは入出力7277回路のいずれか
を任意に構成することができるだけの回路要素が半導体
下地の形であらかじめ形成されている。内部回路s20
入出力信号は、その周辺回路部3によって構成されたバ
ッファ回路および端子パッド部4を介して外部へ導出あ
るいは外部から導入される。
Each of the peripheral circuits s3 has circuit elements formed in advance in the form of a semiconductor base to form any one of an input buffer circuit, an output buffer circuit, or an input/output 7277 circuit. Internal circuit s20
Input/output signals are led out or introduced from the outside via the buffer circuit constituted by the peripheral circuit section 3 and the terminal pad section 4.

また、多数の端子パッド部4の中から電源用の端子パッ
ド部4Aが任意に選ばれ、この電源用端子パッド部4A
から電源引込配線8を通して内部回路部2への電源引込
が行われるようになっている。
Further, a terminal pad section 4A for power supply is arbitrarily selected from among the large number of terminal pad sections 4, and this terminal pad section 4A for power supply is arbitrarily selected.
Power is drawn into the internal circuit section 2 through a power supply lead-in wiring 8 .

ここで、電源用端子パッド部4Aから内部回路部2への
電源引込配線8は、詳細は後述するが、上記周辺回路部
3の回路要素が形成された部分の表面絶縁膜上に布線さ
れる。
Here, the power lead-in wiring 8 from the power supply terminal pad section 4A to the internal circuit section 2 is laid out on the surface insulating film of the portion of the peripheral circuit section 3 where the circuit elements are formed, although the details will be described later. Ru.

第2図は上記電源用端子パッド部4Aおよび周辺回路部
3の付近における断面状態を誇張拡大して示す。
FIG. 2 shows a cross-sectional state near the power supply terminal pad section 4A and the peripheral circuit section 3 in an exaggeratedly enlarged manner.

同図において、ゲートアレイICは、p−型シリコン半
導体基板10を用いた半導体基板1に形成される。そし
て、周辺回路部3の領域には n*型埋込層(n”BL
)、n型つz/L’拡散層(nWE L L )12、
p型分離拡散層(pISO)13、p型ウェル拡散層1
4などが選択的に形成されて、バイポーラ・トランジス
タやMOSトランジスタなどの能動素子領域が形成され
ている。15はp型ベース拡散層、16はn中型エミッ
タ拡散層、17はn中型コレクタ接続用拡散層、18は
n十型ソース・ドレイン拡散層、19はゲート電極をそ
れぞれ示す。また、20は酸化膜による表面絶縁膜を示
す。この表面絶縁膜20上に上記電源引込Al配線8が
通されている。電源引込配線8は1゜層目のアルミニウ
ム配線によって形成され、その一端側は端子パッド部4
Aに、その他端側はVccライン(2)に接続されてい
る。端子パッド部4AおよびVCCライン(2)および
GNDライン(2)には、それぞれ2層目のアルミニウ
ム配線A/2が使用されている。
In the figure, a gate array IC is formed on a semiconductor substrate 1 using a p-type silicon semiconductor substrate 10. As shown in FIG. In the area of the peripheral circuit section 3, there is an n* type buried layer (n”BL).
), n-type Z/L' diffusion layer (nWE L L ) 12,
p-type isolation diffusion layer (pISO) 13, p-type well diffusion layer 1
4 and the like are selectively formed to form active element regions such as bipolar transistors and MOS transistors. 15 is a p-type base diffusion layer, 16 is an n-medium emitter diffusion layer, 17 is an n-medium collector connection diffusion layer, 18 is an n-type source/drain diffusion layer, and 19 is a gate electrode. Further, 20 indicates a surface insulating film made of an oxide film. The power supply lead-in Al wiring 8 is passed over this surface insulating film 20. The power lead-in wiring 8 is formed of the first layer of aluminum wiring, and one end thereof is connected to the terminal pad portion 4.
A and the other end is connected to the Vcc line (2). Second-layer aluminum wiring A/2 is used for the terminal pad portion 4A, the VCC line (2), and the GND line (2), respectively.

以上説明したように、電源引込配線8を任意の位看に通
しても空スペースが生じない。
As explained above, even if the power supply lead-in wiring 8 is passed through an arbitrary position, no empty space is created.

以上、本発明者によってなされた発明を実施例にもとづ
き具体的に説明したが、本発明は上記実施例に限定され
るものではなく、その要旨を逸脱しない範囲で種々変更
可能であることはいうまでもない。たとえば、上記電源
引込配線8下の周辺回路部3の回路要素を入出力バッフ
ァ以外に、たとえば電源ラインにxfして侵入する雑音
の防止用回路を構成するために利用してもよい。
Above, the invention made by the present inventor has been specifically explained based on the examples, but it should be noted that the present invention is not limited to the above examples and can be modified in various ways without departing from the gist thereof. Not even. For example, the circuit elements of the peripheral circuit section 3 below the power lead-in wiring 8 may be used in addition to the input/output buffer, for example, to configure a circuit for preventing noise from entering the power line via xf.

以上の説明では主として本発明者によってなされた発明
をその背景となった利用分野であるBi−CMO8型の
ゲートアレイICに適用した場合について説明したが、
それに限定されるものではなく、たとえば、マイクロ・
プロセッサなどのランダム論理ICなどにも適用できる
In the above explanation, we have mainly explained the case where the invention made by the present inventor is applied to the Bi-CMO8 type gate array IC, which is the field of application that is the background of the invention.
For example, it is not limited to micro-
It can also be applied to random logic ICs such as processors.

〔発明の効果〕〔Effect of the invention〕

本願において開示される発明のうち代表的なものにより
て得られる効果を簡単に説明すれば、下記のとおりであ
る。
A brief explanation of the effects obtained by typical inventions disclosed in this application is as follows.

すなわち、半導体集積回路装置において使用可能な周辺
回路部の数を減らすことなく、かつ無駄な空きスペース
をほとんど生じさせずに、電源引込の位置の自由度を高
めることができるようになる、という効果が得られる。
In other words, the effect is that it becomes possible to increase the degree of freedom in the position of power supply lead-in without reducing the number of peripheral circuit sections that can be used in a semiconductor integrated circuit device and without creating almost any wasted empty space. is obtained.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明による技術が適用されたゲートアレイ
ICのレイアウト構成を示す平面図、第2図は第1図の
一部における動面状態を拡大して示す断面図、 043図は、本発明前に出願人により開発され、検討さ
れたゲートアレイICのレイアウト構成を示す平面図で
ある。 1・・・半褥体基板、3・・・周辺回路部、4・・・端
子パッド部、4A・・・電源用に選択された端子パッド
部、5・・・基本セルアレイ、6・・・基本セル、7・
・・内部回路、8・・・電源引込配線、9・・・配線領
職、20・・・表面絶縁膜(表面酸化膜)、21・・・
層間絶縁膜、All・・・1層目のアルミニウム配線、
A72・・・2層目のアルミニウム配線、Vcc・・・
電源。 代理人 弁理士  /ト 川 勝 男(、第  1  
FIG. 1 is a plan view showing the layout configuration of a gate array IC to which the technology according to the present invention is applied, FIG. 2 is an enlarged cross-sectional view showing a moving surface state in a part of FIG. 1 is a plan view showing a layout configuration of a gate array IC developed and studied by the applicant before the invention; FIG. DESCRIPTION OF SYMBOLS 1... Half-bedded board, 3... Peripheral circuit section, 4... Terminal pad section, 4A... Terminal pad section selected for power supply, 5... Basic cell array, 6... Basic cell, 7.
...Internal circuit, 8...Power lead-in wiring, 9...Wiring manager, 20...Surface insulating film (surface oxide film), 21...
Interlayer insulating film, All...first layer aluminum wiring,
A72...2nd layer aluminum wiring, Vcc...
power supply. Agent: Patent Attorney / Katsuo Togawa (, 1st
figure

Claims (1)

【特許請求の範囲】[Claims] 1、半導体基板の中央部に配置された内部回路部を取り
囲んで多数の周辺回路部が配置され、さらにその周辺回
路部の外側に端子パッド部が配置された半導体集積回路
装置であつて、端子パッド部に接続され、表面絶縁膜上
に布線される電源引込配線布線可能領域下に上記周辺回
路部の回路要素が形成されていることを特徴とする半導
体集積回路装置。
1. A semiconductor integrated circuit device in which a large number of peripheral circuit parts are arranged surrounding an internal circuit part arranged in the center of a semiconductor substrate, and a terminal pad part is arranged outside the peripheral circuit part, and the terminal pad part is arranged outside the peripheral circuit part. A semiconductor integrated circuit device, characterized in that circuit elements of the peripheral circuit section are formed below a region where power supply wiring can be wired, which is connected to the pad section and wired on the surface insulating film.
JP61065770A 1986-03-26 1986-03-26 Semiconductor integrated circuit device Pending JPS62224043A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61065770A JPS62224043A (en) 1986-03-26 1986-03-26 Semiconductor integrated circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61065770A JPS62224043A (en) 1986-03-26 1986-03-26 Semiconductor integrated circuit device

Publications (1)

Publication Number Publication Date
JPS62224043A true JPS62224043A (en) 1987-10-02

Family

ID=13296590

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61065770A Pending JPS62224043A (en) 1986-03-26 1986-03-26 Semiconductor integrated circuit device

Country Status (1)

Country Link
JP (1) JPS62224043A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05218203A (en) * 1991-11-20 1993-08-27 Nec Corp Semiconductor integrated circuit device
US6703650B2 (en) 2000-06-29 2004-03-09 Seiko Epson Corporation Semiconductor integrated circuit including a circuit protecting against static electricity

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05218203A (en) * 1991-11-20 1993-08-27 Nec Corp Semiconductor integrated circuit device
US6703650B2 (en) 2000-06-29 2004-03-09 Seiko Epson Corporation Semiconductor integrated circuit including a circuit protecting against static electricity

Similar Documents

Publication Publication Date Title
US3808475A (en) Lsi chip construction and method
JP3433731B2 (en) I / O cell arrangement method and semiconductor device
KR920008396B1 (en) Semiconductor integrated circuit device
US5060046A (en) Semiconductor integrated circuit device having enlarged cells formed on ends of basic cell arrays
US4947233A (en) Semi-custom LSI having input/output cells
JP4025044B2 (en) Semiconductor integrated circuit device
US3981070A (en) LSI chip construction and method
JPS62224043A (en) Semiconductor integrated circuit device
JPH1098108A (en) Semiconductor device
JPS62194640A (en) Semiconductor integrated circuit using bump mounting
JP3259763B2 (en) Semiconductor LSI
JP2693920B2 (en) Semiconductor integrated circuit device
JPS5856354A (en) Master slice large-scale integrated circuit
JP2000223575A (en) Design of semiconductor device, semiconductor device and its manufacture
JPH03274764A (en) Semiconductor integrated circuit device
JPH0815209B2 (en) Semiconductor integrated circuit device
JP2878765B2 (en) Semiconductor device
EP0278065A2 (en) Semiconductor integrated circuit latch-up preventing apparatus
JPH07153926A (en) Semiconductor integrated circuit device
JPH0566737B2 (en)
JPH01168042A (en) Semiconductor integrated circuit device
JP2003318263A (en) Semiconductor device
JPS6329550A (en) Semiconductor integrated circuit device
JPS62224042A (en) Semiconductor integrated circuit device
JP2634800B2 (en) Semiconductor integrated circuit standard cell