JPH01168042A - Semiconductor integrated circuit device - Google Patents

Semiconductor integrated circuit device

Info

Publication number
JPH01168042A
JPH01168042A JP32776787A JP32776787A JPH01168042A JP H01168042 A JPH01168042 A JP H01168042A JP 32776787 A JP32776787 A JP 32776787A JP 32776787 A JP32776787 A JP 32776787A JP H01168042 A JPH01168042 A JP H01168042A
Authority
JP
Japan
Prior art keywords
pads
buffer
power supply
cells
integrated circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP32776787A
Other languages
Japanese (ja)
Inventor
Masahiro Kono
政裕 河野
Masao Yoshikawa
吉川 正夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP32776787A priority Critical patent/JPH01168042A/en
Publication of JPH01168042A publication Critical patent/JPH01168042A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/10Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration
    • H01L27/118Masterslice integrated circuits
    • H01L27/11898Input and output buffer/driver structures

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)

Abstract

PURPOSE:To eliminate a reduction in buffer cells by disposing more pads than the number of the cells by decreasing the disposing pitch of the pads smaller than that of buffer cell rows, and using excess pads except the pads corresponding to the respective cells for a power supply or a ground. CONSTITUTION:The disposing pitch of pads in a semiconductor chip 101 is reduced smaller than that of buffers, thereby forming excess pads 10a1, 10a2, 10b not corresponding by 1:1 thereby in addition to the pads 10 corresponding by 1:1 to the buffers 7. A power source line is provided by a second layer aluminum 11a through an insulating layer on the row of the buffer cells 7, and the buffers 7 are connected to the pads 10 through aluminum wirings 11. The excess pads 10a1 are connected through second layer aluminum wirings 11a directly to a GND line 9, and the excess pads 10a2 are connected through first layer aluminum wirings 11b and second layer aluminum wirings 11c connected by a contact 12 to a VCC line 8. Thus, the pads 10a1, 10a2 are connected directly to the power source line thereby to increase the number of the pads for the power supply or the ground.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は半導体集積回路装置に関し、電源供給用パッド
又は接地用パッドを数多く必要とする半導体集積回路装
置、特にセミカスタムLSI、すなわちゲートアレイ方
式の集積回路装置に関するものである。
[Detailed Description of the Invention] [Field of Industrial Application] The present invention relates to semiconductor integrated circuit devices, and particularly semiconductor integrated circuit devices that require a large number of power supply pads or grounding pads, particularly semi-custom LSIs, that is, gate array type devices. The present invention relates to an integrated circuit device.

〔従来の技術〕[Conventional technology]

ゲートアレイ方式とは、あらかじめ拡散工程を終えて能
動素子あるいは受動素子を作り込んだ内部セル及びバッ
ファセルを半導体基板に形成しておき、その後に実現し
友いJ!能に応じて配線のみを設計し、完成させるもの
である。
In the gate array method, internal cells and buffer cells with active or passive elements are formed on a semiconductor substrate after completing a diffusion process in advance, and then realized. Only the wiring is designed and completed according to the performance.

ゲートアレイ方式LSIの一例を第2図に示す。FIG. 2 shows an example of a gate array type LSI.

第2図に於いて半導体チップ1の中央部に内部セル領域
2を配置し、その周囲に入出力バッファセル3を複数個
配置している。こ几らのバッファセル列の上に電源フィ
ン4、電源フィン5を設けている。そしてパップアセル
列と平行にパッド6を複数個配置し、隣り合うバッファ
セル3とパッド6を接読している。
In FIG. 2, an internal cell region 2 is arranged in the center of a semiconductor chip 1, and a plurality of input/output buffer cells 3 are arranged around it. A power supply fin 4 and a power supply fin 5 are provided above these buffer cell rows. A plurality of pads 6 are arranged in parallel with the buffer cell row, and adjacent buffer cells 3 and pads 6 are closely read.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

近年、入出力インターフェイスに関して、入出力バッフ
ァセルの出力駆動能力の向上が要求されている。入出力
バッファセルの最大駆動能力はバッファセル内に配置さ
れるトランジスタの数に依存する。すなわち駆動能力を
大きく設計すれば、バッファセル内に配置するトランジ
スタの数が多くなり、必然的に入出力バッファセル自体
が大きくなる。しかし第蔑図に示すように各バッファセ
ル3を1対1にパッド6に対応させて配置すると、バッ
ファセル3の配置ピッチとパッド6の配置ピッチが同じ
である念めに、パッドとパッド間の距mがバッファセル
3のピッチに影響されて、ワイヤボンディングの際に受
ける制限から決まる距離以上に大きくなる。また駆動能
力が大きくなれば、パッドを電源供給用パッド又は接地
用パッドとして数多く用いる必要が生じる。このために
、電源供給用パッド又は接地用パッドに対応する電源供
給用バッファ又は接地用バッファが増え、入出力バッフ
ァとして使えるバッファ数が減少し、半導体集積回路装
置としての機能低下を余儀無くされるという問題点があ
った。
In recent years, with regard to input/output interfaces, there has been a demand for improvement in the output driving ability of input/output buffer cells. The maximum drive capability of an input/output buffer cell depends on the number of transistors arranged within the buffer cell. In other words, if the drive capacity is designed to be large, the number of transistors arranged in the buffer cell will increase, and the input/output buffer cell itself will inevitably become larger. However, when each buffer cell 3 is arranged in one-to-one correspondence with the pad 6 as shown in the diagram, in order to ensure that the arrangement pitch of the buffer cells 3 and the arrangement pitch of the pads 6 are the same, it is necessary to The distance m is influenced by the pitch of the buffer cells 3 and becomes larger than the distance determined by the restrictions imposed upon wire bonding. Further, as the driving capacity increases, it becomes necessary to use a large number of pads as power supply pads or grounding pads. For this reason, the number of power supply buffers or grounding buffers corresponding to the power supply pads or grounding pads increases, reducing the number of buffers that can be used as input/output buffers, and forcing a decline in the functionality of the semiconductor integrated circuit device. There was a problem.

[問題点を解決する為の手段] 本発明は従来の問題点を解決する為、半導体チップの中
央部に内部セル領域を設け、その内部セル領域の周囲に
入出力バッファセル列を配置し、そのバッファセル列と
平行にパッド列を配置する構成の半導体集積回路装置に
於いて、パッドの配置ピッチをバッファセル列の配置ピ
ッチより小さくしてバッファセル数よりも多くのパッド
を配置し、各々のバッファセルに対応するパッドを除く
余剰のパッドを電源供給用又は接地用に使用して半導体
集積回路を構成する。
[Means for Solving the Problems] In order to solve the conventional problems, the present invention provides an internal cell area in the center of a semiconductor chip, arranges an input/output buffer cell array around the internal cell area, In a semiconductor integrated circuit device having a structure in which a pad row is arranged parallel to the buffer cell row, the pad arrangement pitch is made smaller than the arrangement pitch of the buffer cell row, and more pads than the number of buffer cells are arranged. A semiconductor integrated circuit is constructed by using the surplus pads other than the pads corresponding to the buffer cells for power supply or grounding.

〔発明の作用〕[Action of the invention]

本発明によりバッファセルとパッドが1対1に対応して
いない余剰のパッド′t−電源供給用又は接地用として
使用し、電源供給用又は接地用のバッファセルを使用す
ることがないので、電源供給用又は接地用パッドが増え
ても入出力用として使用するバッファセルが減少するこ
とがない。
According to the present invention, the extra pads that do not have a one-to-one correspondence between buffer cells and pads are used for power supply or grounding, and the buffer cells for power supply or grounding are not used. Even if the number of supply or grounding pads increases, the number of buffer cells used for input/output does not decrease.

〔実施例〕〔Example〕

本発明の実施例を第1図(a)及び(b)に示す。第1
図(a)はチップのサイド部分を第1図(b)はチップ
のコーナ一部分を示すものである。
An embodiment of the present invention is shown in FIGS. 1(a) and 1(b). 1st
FIG. 1(a) shows a side portion of the chip, and FIG. 1(b) shows a corner portion of the chip.

半導体チップlO1に於いて内部セル領域102の周囲
にバッファセルフを配置し、そのバッフアセ/L/7列
と平行にパッドlo、10a、s 10az。
In the semiconductor chip IO1, a buffer cell is arranged around the internal cell region 102, and pads lo, 10a, s 10az are arranged in parallel with the buffer cell/L/7 column.

10bを配置している。10b is arranged.

ここでパッドの配置ピッチをバッファの配置ピッチよシ
も小さくすることにより、バッファ7に1対1で対応す
るパッド10に加えて、1対1に対応しない余剰のパッ
ド1oale 10a2* 10bが形成できる。前記
バッファセルフ列の上には絶縁層を介して第2層1を用
いて電源フィン(VCCフィン8及びGNDフィン9 
) を設ff、/(ツファ7とパッド10はAl配線1
1を介して接続されている。図において余剰のパッド1
0a1は第2層kl配線11af:介°してGNDフィ
ン9と直接に接続され、また余剰パッ、ド10a2はコ
ンタクト12で接続された電1層Al?配線11bと第
2層A4配線11cを介してvCCフィン8と接続され
ている。以上のように余剰パッド10 al 110a
2を直接電源フィンと接続することにより電源供給用パ
ッド又は接地用パッドの数を増加させることができる。
Here, by making the arrangement pitch of the pads smaller than the arrangement pitch of the buffers, in addition to the pads 10 that correspond one-to-one to the buffer 7, it is possible to form surplus pads 1oale 10a2*10b that do not correspond one-to-one. . Power supply fins (VCC fins 8 and GND fins 9
) is set, /(Tuff 7 and pad 10 are Al wiring 1
1. In the figure, extra pad 1
0a1 is directly connected to the GND fin 9 through the second layer kl wiring 11af, and the redundant pad 10a2 is connected to the first layer Al? through the contact 12. It is connected to the vCC fin 8 via the wiring 11b and the second layer A4 wiring 11c. As above, surplus pad 10 al 110a
2 can be directly connected to the power supply fin, thereby increasing the number of power supply pads or grounding pads.

〔発明の効果〕〔Effect of the invention〕

以上のように本発明によれば、チップ面積を大きくする
ことなく、マた半導体回路装置としての機能を低下させ
ることなく、電源供給用パッド又は接地用パッドを増加
させることが可能である。
As described above, according to the present invention, it is possible to increase the number of power supply pads or grounding pads without increasing the chip area or reducing the functionality of the semiconductor circuit device.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図会≠春÷暴は本発明の一実施例の要部を!示す平
面図、第呑図は従来のゲートアレイLSIの形状を示す
平面図である。 7・・・バッファセル、 8・・・vCCフィン、 9
・・・GNDフィン、 10・・・パッド、 10 a
 1 el 0 a 2 *  10 b ・・・余剰
の゛バッド、  11 ・AI配線、 lla・・・第
二層Al配線、 llb・・・第−層AI配線、 11
c・・・第二層Al配線、12・・・第−層AA’、!
:第二層とのコンタクト、101・・・半導体チップ、
 102・・・内部セル領域。
Figure 1 ≠ Spring ÷ Vio shows the main part of an embodiment of the present invention! The plan view shown in FIG. 1 is a plan view showing the shape of a conventional gate array LSI. 7... Buffer cell, 8... vCC fin, 9
...GND fin, 10...pad, 10 a
1 el 0 a 2 * 10 b... Surplus bad, 11 - AI wiring, lla... Second layer Al wiring, llb... Third layer AI wiring, 11
c...Second layer Al wiring, 12...-th layer AA',!
: Contact with second layer, 101... semiconductor chip,
102... Internal cell area.

Claims (1)

【特許請求の範囲】 1、半導体チップの中央部に内部セル領域を設け該内部
セル領域の周囲にバッファセル列を配置し、該バッファ
セル列と平行にパッド列を配置してなるゲートアレイ式
半導体集積回路装置に於いて、 パッドの配置ピッチをバッファセル列の配置ピッチより
小さくしてバッファセル数より多くのパッドを設け、余
剰パッドを電源供給用フィン或いは接地フィンに接続し
たことを特徴とする半導体集積回路装置。
[Claims] 1. A gate array type in which an internal cell region is provided in the center of a semiconductor chip, a buffer cell row is arranged around the internal cell region, and a pad row is arranged parallel to the buffer cell row. In a semiconductor integrated circuit device, the arrangement pitch of the pads is made smaller than the arrangement pitch of the buffer cell rows to provide more pads than the number of buffer cells, and the surplus pads are connected to power supply fins or grounding fins. Semiconductor integrated circuit device.
JP32776787A 1987-12-23 1987-12-23 Semiconductor integrated circuit device Pending JPH01168042A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP32776787A JPH01168042A (en) 1987-12-23 1987-12-23 Semiconductor integrated circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP32776787A JPH01168042A (en) 1987-12-23 1987-12-23 Semiconductor integrated circuit device

Publications (1)

Publication Number Publication Date
JPH01168042A true JPH01168042A (en) 1989-07-03

Family

ID=18202760

Family Applications (1)

Application Number Title Priority Date Filing Date
JP32776787A Pending JPH01168042A (en) 1987-12-23 1987-12-23 Semiconductor integrated circuit device

Country Status (1)

Country Link
JP (1) JPH01168042A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04171843A (en) * 1990-11-05 1992-06-19 Nec Ic Microcomput Syst Ltd Gate array system lsi
EP0563973A2 (en) * 1992-04-01 1993-10-06 Nec Corporation Master slice integrated circuit having a reduced chip size and a reduced power supply noise
WO1994029902A1 (en) * 1993-06-07 1994-12-22 National Semiconductor Corporation Flexcell gate array

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04171843A (en) * 1990-11-05 1992-06-19 Nec Ic Microcomput Syst Ltd Gate array system lsi
EP0563973A2 (en) * 1992-04-01 1993-10-06 Nec Corporation Master slice integrated circuit having a reduced chip size and a reduced power supply noise
EP0563973A3 (en) * 1992-04-01 1994-08-10 Nec Corp Master slice integrated circuit having a reduced chip size and a reduced power supply noise
US5422441A (en) * 1992-04-01 1995-06-06 Nec Corporation Master slice integrated circuit having a reduced chip size and a reduced power supply noise
WO1994029902A1 (en) * 1993-06-07 1994-12-22 National Semiconductor Corporation Flexcell gate array

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