JPS6217727Y2 - - Google Patents
Info
- Publication number
- JPS6217727Y2 JPS6217727Y2 JP13731782U JP13731782U JPS6217727Y2 JP S6217727 Y2 JPS6217727 Y2 JP S6217727Y2 JP 13731782 U JP13731782 U JP 13731782U JP 13731782 U JP13731782 U JP 13731782U JP S6217727 Y2 JPS6217727 Y2 JP S6217727Y2
- Authority
- JP
- Japan
- Prior art keywords
- output
- signal
- test
- input
- terminal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 62
- 238000000034 method Methods 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13731782U JPS5941767U (ja) | 1982-09-10 | 1982-09-10 | 試験信号印加判定回路 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13731782U JPS5941767U (ja) | 1982-09-10 | 1982-09-10 | 試験信号印加判定回路 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5941767U JPS5941767U (ja) | 1984-03-17 |
| JPS6217727Y2 true JPS6217727Y2 (OSRAM) | 1987-05-07 |
Family
ID=30308472
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13731782U Granted JPS5941767U (ja) | 1982-09-10 | 1982-09-10 | 試験信号印加判定回路 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5941767U (OSRAM) |
-
1982
- 1982-09-10 JP JP13731782U patent/JPS5941767U/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5941767U (ja) | 1984-03-17 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6028443A (en) | Test circuit for semiconductor integrated logic circuit using tristate buffers allowing control circuit for tristate to be tested | |
| JPS6217727Y2 (OSRAM) | ||
| JPH10240560A (ja) | 波形信号処理装置 | |
| JP2919147B2 (ja) | 半導体集積回路の試験方法 | |
| JPS62281034A (ja) | 装置試験方式 | |
| JPS5923676U (ja) | 自己診断機能を持つic試験装置 | |
| JP2633692B2 (ja) | 半導体試験方法 | |
| US6724182B2 (en) | Tester and testing method for differential data drivers | |
| JPH0712940Y2 (ja) | Ic試験装置 | |
| JPS631248Y2 (OSRAM) | ||
| JP2527623Y2 (ja) | Ic試験装置 | |
| JPH0540457Y2 (OSRAM) | ||
| JPS596553A (ja) | 論理回路 | |
| JPS6134483A (ja) | 集積回路装置 | |
| JP2836101B2 (ja) | プローバのアタッチメントボード | |
| JPH0318154B2 (OSRAM) | ||
| JPS5957175A (ja) | 集積回路の測定方法 | |
| JPH02128576U (OSRAM) | ||
| JPS59172384U (ja) | 論理回路試験装置 | |
| JPS6342484A (ja) | 集積回路装置 | |
| JPS5852579A (ja) | 半導体集積回路の試験装置 | |
| JPS6417476U (OSRAM) | ||
| JPH04359173A (ja) | 直流特性試験回路 | |
| JPH0465144A (ja) | 半導体試験装置 | |
| JPS62145171A (ja) | ボ−ドテスト装置 |