JPS6216537B2 - - Google Patents
Info
- Publication number
- JPS6216537B2 JPS6216537B2 JP56035022A JP3502281A JPS6216537B2 JP S6216537 B2 JPS6216537 B2 JP S6216537B2 JP 56035022 A JP56035022 A JP 56035022A JP 3502281 A JP3502281 A JP 3502281A JP S6216537 B2 JPS6216537 B2 JP S6216537B2
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- heat treatment
- semiconductor device
- epitaxial layer
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H10P95/90—
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56035022A JPS57167635A (en) | 1981-03-11 | 1981-03-11 | Manufacture of semiconductor device |
| EP82301212A EP0060676B1 (en) | 1981-03-11 | 1982-03-10 | A method for the production of a semiconductor device comprising annealing a silicon wafer |
| DE8282301212T DE3280219D1 (de) | 1981-03-11 | 1982-03-10 | Verfahren zur herstellung einer halbleiteranordnung mit ausgluehen eines halbleiterkoerpers. |
| IE559/82A IE55966B1 (en) | 1981-03-11 | 1982-03-11 | A method for the production of a semiconductor device comprising annealing a silicon wafer |
| US06/598,544 US4597804A (en) | 1981-03-11 | 1984-04-12 | Methods of forming denuded zone in wafer by intrinsic gettering and forming bipolar transistor therein |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56035022A JPS57167635A (en) | 1981-03-11 | 1981-03-11 | Manufacture of semiconductor device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57167635A JPS57167635A (en) | 1982-10-15 |
| JPS6216537B2 true JPS6216537B2 (OSRAM) | 1987-04-13 |
Family
ID=12430429
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56035022A Granted JPS57167635A (en) | 1981-03-11 | 1981-03-11 | Manufacture of semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57167635A (OSRAM) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6251050U (OSRAM) * | 1985-09-20 | 1987-03-30 |
-
1981
- 1981-03-11 JP JP56035022A patent/JPS57167635A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6251050U (OSRAM) * | 1985-09-20 | 1987-03-30 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57167635A (en) | 1982-10-15 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN1158696C (zh) | 理想的氧沉淀硅晶片及氧外扩散较小的方法 | |
| CN114093764B (zh) | 单晶硅晶片 | |
| US4970568A (en) | Semiconductor device and a process for producing a semiconductor device | |
| US4597804A (en) | Methods of forming denuded zone in wafer by intrinsic gettering and forming bipolar transistor therein | |
| KR100647940B1 (ko) | 무결함 영역을 가진 반도체 | |
| JPS618931A (ja) | 半導体装置の製造方法 | |
| KR100231607B1 (ko) | 반도체 소자의 초저접합 형성방법 | |
| CN1769549A (zh) | 一种单晶硅抛光片热处理工艺 | |
| CN1111904C (zh) | 半导体器件制造方法 | |
| CN114597249B (zh) | 半导体装置及其制造方法 | |
| JPS6216537B2 (OSRAM) | ||
| JPH0521448A (ja) | 半導体装置の製造方法 | |
| JP3144378B2 (ja) | 固体撮像装置の製造方法 | |
| JP2843037B2 (ja) | 半導体装置の製造方法 | |
| JPS5887833A (ja) | 半導体装置の製造方法 | |
| KR100312971B1 (ko) | 실리콘 웨이퍼내의 산소 불순물 농도 감소방법 | |
| JPH023539B2 (OSRAM) | ||
| JPH11288942A (ja) | 半導体装置の製造方法 | |
| JPS60198735A (ja) | 半導体装置の製造方法 | |
| JPS6216538B2 (OSRAM) | ||
| JP3211232B2 (ja) | 半導体装置の製造方法 | |
| JPH0387022A (ja) | 拡散層の形成方法 | |
| JPS6216539B2 (OSRAM) | ||
| JPS63164440A (ja) | 半導体装置の製造方法 | |
| JPS6315742B2 (OSRAM) |