JPS62140459U - - Google Patents
Info
- Publication number
- JPS62140459U JPS62140459U JP2813386U JP2813386U JPS62140459U JP S62140459 U JPS62140459 U JP S62140459U JP 2813386 U JP2813386 U JP 2813386U JP 2813386 U JP2813386 U JP 2813386U JP S62140459 U JPS62140459 U JP S62140459U
- Authority
- JP
- Japan
- Prior art keywords
- contact pin
- contact
- sharp needle
- tip
- needle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 5
- 230000002093 peripheral effect Effects 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000005476 soldering Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Description
第１図は本考案の一実施例を示す接触ピン先端
の詳細図、第２図は第１図の平面図、第３図は第
２図の―線断面図、第４図はコンタクトプロ
ーブの全体構成を示す部分断面図、第５図および
第６図は導通検査状態をそれぞれ示す説明図、第
７図ないし第１２図は従来のコンタクトプローブ
の先端構造およびその導通検査状態をそれぞれ示
す説明図である。
２…回路基板、３…電子部品、４…はんだ付部
、５…曲げ脚、１０…コンタクトプローブ、１１
…スリーブ、１１ａ…ストツパ、１２…接触ピン
、１３…コイルスプリング、１５…先端部、１５
ａ…周縁尖鋭針部、１５ｂ…中央尖鋭針部、Ｌ…
寸法。
Fig. 1 is a detailed view of the tip of a contact pin showing an embodiment of the present invention, Fig. 2 is a plan view of Fig. 1, Fig. 3 is a sectional view taken along the line - - of Fig. 2, and Fig. 4 is a diagram of a contact probe. FIGS. 5 and 6 are explanatory diagrams showing a continuity test state, respectively. FIGS. 7 to 12 are explanatory diagrams showing the tip structure of a conventional contact probe and its continuity test state, respectively. It is. 2... Circuit board, 3... Electronic component, 4... Soldering part, 5... Bent leg, 10... Contact probe, 11
...Sleeve, 11a...Stopper, 12...Contact pin, 13...Coil spring, 15...Tip part, 15
a...Peripheral sharp needle part, 15b...Center sharp needle part, L...
size.
Claims (1)
めされた状態で先端が突出する接触ピンを滑動自
在に設けるとともに、この接触ピンをスプリング
により外方に常時押圧付勢し、前記接触ピンの先
端を回路基板等の検査点に接触させて導通検査を
行なうコンタクトプローブにおいて、前記接触ピ
ンの先端に、その周縁にそつて一列に周縁尖鋭針
部を設けるとともに、中央部に少なくとも一つの
中央尖鋭針部を設け、かつ中央尖鋭針部の針高を
、周縁尖鋭針部の針高よりも低くしたことを特徴
とするコンタクトプローブ。 A contact pin whose tip protrudes in a fixed state is slidably provided in a conductive cylindrical sleeve, and this contact pin is constantly pressed outward by a spring, so that the tip of the contact pin In a contact probe that performs a continuity test by bringing the contact pin into contact with a test point on a circuit board, etc., a peripheral sharp needle is provided at the tip of the contact pin in a row along the periphery, and at least one central sharp needle is provided in the center. 1. A contact probe characterized in that the needle height of the central sharp needle part is lower than the needle height of the peripheral sharp needle part.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986028133U JPH0323576Y2 (en) | 1986-02-27 | 1986-02-27 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986028133U JPH0323576Y2 (en) | 1986-02-27 | 1986-02-27 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62140459U true JPS62140459U (en) | 1987-09-04 |
| JPH0323576Y2 JPH0323576Y2 (en) | 1991-05-22 |
Family
ID=30830810
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1986028133U Expired JPH0323576Y2 (en) | 1986-02-27 | 1986-02-27 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0323576Y2 (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010038612A (en) * | 2008-08-01 | 2010-02-18 | Hioki Ee Corp | Contact probe |
| JP2012132717A (en) * | 2010-12-20 | 2012-07-12 | Unitechno Inc | Inspection contact probe |
| JP2012149927A (en) * | 2011-01-17 | 2012-08-09 | Yokowo Co Ltd | Contact probe and socket |
| WO2013018809A1 (en) * | 2011-08-02 | 2013-02-07 | 日本発條株式会社 | Probe unit |
| JP2016038207A (en) * | 2014-08-05 | 2016-03-22 | 株式会社アイエスシーＩｓｃ Ｃｏ．， Ｌｔｄ． | Probe member for pogo pin |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS585978U (en) * | 1981-07-04 | 1983-01-14 | 大正製薬株式会社 | container |
-
1986
- 1986-02-27 JP JP1986028133U patent/JPH0323576Y2/ja not_active Expired
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS585978U (en) * | 1981-07-04 | 1983-01-14 | 大正製薬株式会社 | container |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010038612A (en) * | 2008-08-01 | 2010-02-18 | Hioki Ee Corp | Contact probe |
| JP2012132717A (en) * | 2010-12-20 | 2012-07-12 | Unitechno Inc | Inspection contact probe |
| JP2012149927A (en) * | 2011-01-17 | 2012-08-09 | Yokowo Co Ltd | Contact probe and socket |
| WO2013018809A1 (en) * | 2011-08-02 | 2013-02-07 | 日本発條株式会社 | Probe unit |
| JPWO2013018809A1 (en) * | 2011-08-02 | 2015-03-05 | 日本発條株式会社 | Probe unit |
| TWI479156B (en) * | 2011-08-02 | 2015-04-01 | Nhk Spring Co Ltd | Probe unit |
| US9702905B2 (en) | 2011-08-02 | 2017-07-11 | Nhk Spring Co., Ltd. | Probe unit |
| JP2016038207A (en) * | 2014-08-05 | 2016-03-22 | 株式会社アイエスシーＩｓｃ Ｃｏ．， Ｌｔｄ． | Probe member for pogo pin |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0323576Y2 (en) | 1991-05-22 |
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