JPS637370U - - Google Patents

Info

Publication number
JPS637370U
JPS637370U JP10117586U JP10117586U JPS637370U JP S637370 U JPS637370 U JP S637370U JP 10117586 U JP10117586 U JP 10117586U JP 10117586 U JP10117586 U JP 10117586U JP S637370 U JPS637370 U JP S637370U
Authority
JP
Japan
Prior art keywords
electronic component
vertically movable
movable base
recess
base
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10117586U
Other languages
Japanese (ja)
Other versions
JPH0436461Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1986101175U priority Critical patent/JPH0436461Y2/ja
Publication of JPS637370U publication Critical patent/JPS637370U/ja
Application granted granted Critical
Publication of JPH0436461Y2 publication Critical patent/JPH0436461Y2/ja
Expired legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図は、本考案の電子部品検査治具の平面図
であり、第２図は、第１図のＡ―Ａ断面図であり
、第３図は、上下可動台の凹部に側面に端子が突
出して設けられた電子部品が嵌合された部分断面
図であり、第４図は、支持台が横方向にずれたと
きの説明図であり、第５図は、上下可動台の凹部
に側面に沿つて端子が設けられた電子部品が嵌合
された部分断面図であり、第６図は、本考案の電
子部品検査治具の他の実施例のコンタクト・プロ
ーブ先端の拡大図である。 １：電子部品検査治具、２：支持台、３：支持
孔、４：支持柱、５：上下可動台、６，７：有底
孔、８：コイルばね、９：凹部、１１：透孔、１
２，２４：コンタクト・プローブ、２３：電子部
品。 FIG. 1 is a plan view of the electronic component inspection jig of the present invention, FIG. 2 is a sectional view taken along line A-A in FIG. FIG. 4 is an explanatory diagram when the support base is shifted in the lateral direction, and FIG. FIG. 6 is a partial sectional view of an electronic component fitted with a terminal provided along the side surface, and FIG. 6 is an enlarged view of the tip of a contact probe of another embodiment of the electronic component inspection jig of the present invention. . 1: Electronic component inspection jig, 2: Support stand, 3: Support hole, 4: Support column, 5: Vertical movable table, 6, 7: Bottomed hole, 8: Coil spring, 9: Recess, 11: Through hole ,1
2, 24: Contact probe, 23: Electronic components.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 上下可動台の上下方向の一面に、側面に多数の
端子が設けられた電子部品が挿入嵌合できる凹部
を形成し、この凹部に嵌合される電子部品の前記
端子に臨んで上下方向に透孔を前記上下可動台に
穿設し、前記上下可動台の他側面に配設された支
持台に前記上下可動台を分離しないようにして上
下動自在に配設するとともにコイルばねにより分
離方向に弾性付勢し、さらに上下伸縮自在のコン
トタクト・プローブを前記上下可動台に穿設した
前記透孔に先端部を遊嵌させて前記電子部品の端
子に臨むように前記支持台に配設したことを特徴
とする電子部品検査治具。 A recess into which an electronic component having a large number of terminals can be inserted and fitted is formed on one surface of the vertical movable table in the vertical direction, and a recess is formed in the vertical direction to face the terminals of the electronic component to be fitted into the recess. A hole is bored in the vertically movable base, and the vertically movable base is arranged on a support base provided on the other side of the vertically movable base so as to be movable up and down without being separated, and a coil spring is used to move the vertically movable base in the separating direction. A contact probe which is elastically biased and is vertically telescopic is disposed on the support base so as to face the terminal of the electronic component with its tip loosely fitting into the through hole bored in the vertically movable base. An electronic component inspection jig characterized by:
JP1986101175U 1986-07-01 1986-07-01 Expired JPH0436461Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1986101175U JPH0436461Y2 (en) 1986-07-01 1986-07-01

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1986101175U JPH0436461Y2 (en) 1986-07-01 1986-07-01

Publications (2)

Publication Number Publication Date
JPS637370U true JPS637370U (en) 1988-01-19
JPH0436461Y2 JPH0436461Y2 (en) 1992-08-27

Family

ID=30971681

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1986101175U Expired JPH0436461Y2 (en) 1986-07-01 1986-07-01

Country Status (1)

Country Link
JP (1) JPH0436461Y2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6447968A (en) * 1987-05-05 1989-02-22 Reliability Inc Head assembly
JP2016191553A (en) * 2015-03-30 2016-11-10 日本発條株式会社 Probe unit

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4921417U (en) * 1972-05-26 1974-02-23
JPS5153164U (en) * 1974-10-16 1976-04-22
JPS60142529A (en) * 1983-12-28 1985-07-27 Yokowo Mfg Co Ltd Inspecting apparatus for circuit substrate

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4921417U (en) * 1972-05-26 1974-02-23
JPS5153164U (en) * 1974-10-16 1976-04-22
JPS60142529A (en) * 1983-12-28 1985-07-27 Yokowo Mfg Co Ltd Inspecting apparatus for circuit substrate

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6447968A (en) * 1987-05-05 1989-02-22 Reliability Inc Head assembly
JP2016191553A (en) * 2015-03-30 2016-11-10 日本発條株式会社 Probe unit

Also Published As

Publication number Publication date
JPH0436461Y2 (en) 1992-08-27

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