JPS6279183U - - Google Patents
Info
- Publication number
- JPS6279183U JPS6279183U JP17003385U JP17003385U JPS6279183U JP S6279183 U JPS6279183 U JP S6279183U JP 17003385 U JP17003385 U JP 17003385U JP 17003385 U JP17003385 U JP 17003385U JP S6279183 U JPS6279183 U JP S6279183U
- Authority
- JP
- Japan
- Prior art keywords
- electronic component
- elastic contact
- inspection jig
- recess
- contact members
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007689 inspection Methods 0.000 claims description 9
- 238000000926 separation method Methods 0.000 claims 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
第１図は、本考案の電子部品検査治具を構成す
る摺動支持基台の平面図であり、第２図は、第１
図のＡ―Ａで断面した本考案の電子部品検査治具
の断面図であり、第３図は、第２図の導通端子舌
片および枠体の一部切欠き斜視図であり、第４図
は、本考案の電子部品検査治具の他の実施例の縦
断面図であり、第５図は、コンタクトピンの一実
施例の断面図であり、第６図は、コンタクトピン
の他の実施例の断面図であり、第７図は、側方に
端子が張り出したＩＣ等の電子部品の斜視図であ
り、第８図は、本考案の電子部品検査治具の対象
とする側面に沿つて端子が設けられたＩＣ等の電
子部品の斜視図である。
１，３：電子部品、２，４：端子、１０，４０
：電子部品検査治具、１１：摺動支持基台、１３
：支持柱、１７：コイルばね、２０，５０：移動
検査治具、２１：治具基台、２２：枠体、２６：
導通端子舌片、５１：検査治具台、５２：凹部、
５３：タンタクトピン。
FIG. 1 is a plan view of a sliding support base constituting the electronic component inspection jig of the present invention, and FIG.
3 is a cross-sectional view of the electronic component inspection jig of the present invention taken along line A-A in the figure; FIG. 3 is a partially cutaway perspective view of the conductive terminal tongue piece and frame of FIG. The figure is a longitudinal sectional view of another embodiment of the electronic component inspection jig of the present invention, FIG. 5 is a sectional view of one embodiment of the contact pin, and FIG. 6 is a sectional view of another embodiment of the contact pin. FIG. 7 is a cross-sectional view of an embodiment, and FIG. 7 is a perspective view of an electronic component such as an IC with terminals protruding from the side. FIG. FIG. 2 is a perspective view of an electronic component such as an IC along which terminals are provided. 1, 3: Electronic components, 2, 4: Terminals, 10, 40
: Electronic component inspection jig, 11: Sliding support base, 13
: Support column, 17: Coil spring, 20, 50: Moving inspection jig, 21: Jig base, 22: Frame, 26:
Continuity terminal tongue piece, 51: Inspection jig stand, 52: Recessed part,
53: Tongue tact pin.
Claims (1)
が挿入嵌合できる凹部を移動検査治具に形成し、
前記電子部品の側面に対向する前記凹部の内周に
前記電子部品の端子にそれぞれ対応して横方向か
ら弾接するように弾接部材を配列し、前記移動検
査治具を摺動支持基台に対して分離しないように
上下動自在に配置するとともにコイルばねにより
分離方向に弾性付勢し、前記電子部品と前記摺動
支持基台との近接方向の相対移動により前記電子
部品を前記凹部に嵌合させて前記端子に横方向か
ら前記弾接部材をそれぞれ弾発させるように構成
したことを特徴とする電子部品検査治具。 A movable inspection jig is formed with a recess into which an electronic component with a large number of terminals can be inserted and fitted along the side.
Elastic contact members are arranged on the inner periphery of the recess facing the side surface of the electronic component so as to be in elastic contact with the terminals of the electronic component from the lateral direction, and the movable inspection jig is mounted on a sliding support base. The electronic component is arranged to be movable up and down so as not to be separated, and is elastically biased in the separation direction by a coil spring, and the electronic component is fitted into the recess by relative movement in the proximal direction between the electronic component and the sliding support base. 1. An electronic component inspection jig, characterized in that the elastic contact members are configured to be aligned with each other and to cause each of the elastic contact members to rebound from the lateral direction on the terminal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985170033U JPH0446222Y2 (en) | 1985-11-05 | 1985-11-05 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985170033U JPH0446222Y2 (en) | 1985-11-05 | 1985-11-05 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6279183U true JPS6279183U (en) | 1987-05-20 |
| JPH0446222Y2 JPH0446222Y2 (en) | 1992-10-29 |
Family
ID=31104391
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1985170033U Expired JPH0446222Y2 (en) | 1985-11-05 | 1985-11-05 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0446222Y2 (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60213872A (en) * | 1984-03-19 | 1985-10-26 | アイ・テイー・インダストリーズ、インコーポレーテツド | Chip carrier test adapter |
| JPS6191174U (en) * | 1984-11-20 | 1986-06-13 |
-
1985
- 1985-11-05 JP JP1985170033U patent/JPH0446222Y2/ja not_active Expired
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60213872A (en) * | 1984-03-19 | 1985-10-26 | アイ・テイー・インダストリーズ、インコーポレーテツド | Chip carrier test adapter |
| JPS6191174U (en) * | 1984-11-20 | 1986-06-13 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0446222Y2 (en) | 1992-10-29 |
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