JPS6279182U - - Google Patents
Info
- Publication number
- JPS6279182U JPS6279182U JP17003285U JP17003285U JPS6279182U JP S6279182 U JPS6279182 U JP S6279182U JP 17003285 U JP17003285 U JP 17003285U JP 17003285 U JP17003285 U JP 17003285U JP S6279182 U JPS6279182 U JP S6279182U
- Authority
- JP
- Japan
- Prior art keywords
- electronic component
- frame
- conductive terminal
- fixed
- terminal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007689 inspection Methods 0.000 claims description 5
- 230000037431 insertion Effects 0.000 claims description 2
- 238000003780 insertion Methods 0.000 claims description 2
- 210000002105 tongue Anatomy 0.000 claims 4
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Description
第１図は、本考案の電子部品検査治具の一実施
例の平面図であり、第２図は、第１図のＡ―Ａ断
面図であり、第３図は、第１図の底面図であり、
第４図は、第１図の導通端子舌片および枠体の一
部切欠き斜視図であり、第５図は、本考案の電子
部品検査治具を上下動自在に配設するための摺動
支持基台の平面図であり、第６図は、摺動支持基
台より下の構造の第５図Ｂ―Ｂ断面図であり、第
７図は、本考案の電子部品検査治具を上下動自在
に配設するための他の摺動支持基台の平面図であ
り、第８図は、他の摺動支持基台より下の構造の
第７図Ｃ―Ｃ断面図であり、第９図は、側方に端
子が張り出したＩＣ等の電子部品の斜視図であり
、第１０図は、本考案の電子部品の検査治具の対
象とする側面に沿つて端子が設けられたＩＣ等の
電子部品の斜視図である。
１，３：電子部品、２，４：端子、１０：電子
部品検査治具、１１：治具基台、１２：枠体、１
４：上端面、１５：溝、１６：導通端子舌片、１
８：挿入固定部材。
FIG. 1 is a plan view of one embodiment of the electronic component inspection jig of the present invention, FIG. 2 is a sectional view taken along line AA in FIG. 1, and FIG. 3 is a bottom view of the electronic component inspection jig of the present invention. is a diagram,
FIG. 4 is a partially cutaway perspective view of the conductive terminal tongue piece and frame shown in FIG. 1, and FIG. FIG. 6 is a sectional view of the structure below the sliding support base taken along line B-B in FIG. 5, and FIG. 7 is a plan view of the dynamic support base. FIG. 8 is a plan view of another sliding support base for vertically movable arrangement, and FIG. 8 is a cross-sectional view taken along line C-C in FIG. 7 of the structure below the other sliding support base; Fig. 9 is a perspective view of an electronic component such as an IC with terminals protruding from the side, and Fig. 10 is a perspective view of an electronic component such as an IC with terminals protruding from the side. FIG. 2 is a perspective view of an electronic component such as an IC. 1, 3: Electronic component, 2, 4: Terminal, 10: Electronic component inspection jig, 11: Jig base, 12: Frame, 1
4: Upper end surface, 15: Groove, 16: Continuity terminal tongue piece, 1
8: Insertion fixing member.
Claims (1)
の側方周囲を囲む枠体の上端面に、前記電子部品
の端子配列にそれぞれ対応して内側と外側に渡つ
て溝を設け、この溝に挿入されるとともに前記枠
体の内周壁に沿つて垂下するよう折り曲げられた
導通端子舌片をそれぞれ配列し、前記枠体の上面
に治具基台を固定し、前記枠体の内側に挿入固定
部材を挿入して前記導通端子舌片を前記枠体と前
記挿入固定部材で挾持固定し、前記電子部品を前
記枠体で囲むように相対移動させて前記端子に横
方向から前記導通端子舌片をそれぞれ弾接させる
ように構成したことを特徴とする電子部品検査治
具。 Grooves are provided on the upper end surface of a frame surrounding the lateral periphery of an electronic component having a large number of terminals along its side surfaces, and are provided with grooves extending inside and outside corresponding to the terminal arrangement of the electronic component, respectively. The conductive terminal tongues that are inserted and bent so as to hang down along the inner circumferential wall of the frame are respectively arranged, a jig base is fixed to the upper surface of the frame, and the tongues are inserted and fixed inside the frame. A member is inserted, the conductive terminal tongue piece is clamped and fixed between the frame body and the insertion fixing member, and the electronic component is relatively moved so as to be surrounded by the frame body, and the conductive terminal tongue piece is attached to the terminal from the lateral direction. An electronic component inspection jig characterized in that the electronic component inspection jig is configured such that the two are brought into elastic contact with each other.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985170032U JPH0446221Y2 (en) | 1985-11-05 | 1985-11-05 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985170032U JPH0446221Y2 (en) | 1985-11-05 | 1985-11-05 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6279182U true JPS6279182U (en) | 1987-05-20 |
| JPH0446221Y2 JPH0446221Y2 (en) | 1992-10-29 |
Family
ID=31104389
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1985170032U Expired JPH0446221Y2 (en) | 1985-11-05 | 1985-11-05 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0446221Y2 (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60213872A (en) * | 1984-03-19 | 1985-10-26 | アイ・テイー・インダストリーズ、インコーポレーテツド | Chip carrier test adapter |
-
1985
- 1985-11-05 JP JP1985170032U patent/JPH0446221Y2/ja not_active Expired
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60213872A (en) * | 1984-03-19 | 1985-10-26 | アイ・テイー・インダストリーズ、インコーポレーテツド | Chip carrier test adapter |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0446221Y2 (en) | 1992-10-29 |
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