JPS62128540A - 半導体装置の試験用搬送方法 - Google Patents

半導体装置の試験用搬送方法

Info

Publication number
JPS62128540A
JPS62128540A JP27038285A JP27038285A JPS62128540A JP S62128540 A JPS62128540 A JP S62128540A JP 27038285 A JP27038285 A JP 27038285A JP 27038285 A JP27038285 A JP 27038285A JP S62128540 A JPS62128540 A JP S62128540A
Authority
JP
Japan
Prior art keywords
section
semiconductor device
semiconductor devices
test
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP27038285A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0585451B2 (enrdf_load_html_response
Inventor
Yoshiyuki Mishima
由幸 三島
Haruo Yoshida
吉田　治男
Hideji Aoki
青木　秀二
Ryoji Nishibashi
西橋　良二
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP27038285A priority Critical patent/JPS62128540A/ja
Publication of JPS62128540A publication Critical patent/JPS62128540A/ja
Publication of JPH0585451B2 publication Critical patent/JPH0585451B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Reciprocating Conveyors (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP27038285A 1985-11-29 1985-11-29 半導体装置の試験用搬送方法 Granted JPS62128540A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP27038285A JPS62128540A (ja) 1985-11-29 1985-11-29 半導体装置の試験用搬送方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP27038285A JPS62128540A (ja) 1985-11-29 1985-11-29 半導体装置の試験用搬送方法

Publications (2)

Publication Number Publication Date
JPS62128540A true JPS62128540A (ja) 1987-06-10
JPH0585451B2 JPH0585451B2 (enrdf_load_html_response) 1993-12-07

Family

ID=17485479

Family Applications (1)

Application Number Title Priority Date Filing Date
JP27038285A Granted JPS62128540A (ja) 1985-11-29 1985-11-29 半導体装置の試験用搬送方法

Country Status (1)

Country Link
JP (1) JPS62128540A (enrdf_load_html_response)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03206637A (ja) * 1990-01-09 1991-09-10 Rohm Co Ltd 電子部品の検査方法及びレーザー標印方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03206637A (ja) * 1990-01-09 1991-09-10 Rohm Co Ltd 電子部品の検査方法及びレーザー標印方法

Also Published As

Publication number Publication date
JPH0585451B2 (enrdf_load_html_response) 1993-12-07

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