JPS6196544U - - Google Patents
Info
- Publication number
- JPS6196544U JPS6196544U JP18162184U JP18162184U JPS6196544U JP S6196544 U JPS6196544 U JP S6196544U JP 18162184 U JP18162184 U JP 18162184U JP 18162184 U JP18162184 U JP 18162184U JP S6196544 U JPS6196544 U JP S6196544U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor wafer
- wafer prober
- prober
- cassette
- heater
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18162184U JPS6196544U (enExample) | 1984-11-30 | 1984-11-30 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18162184U JPS6196544U (enExample) | 1984-11-30 | 1984-11-30 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6196544U true JPS6196544U (enExample) | 1986-06-21 |
Family
ID=30739164
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18162184U Pending JPS6196544U (enExample) | 1984-11-30 | 1984-11-30 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6196544U (enExample) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54125978A (en) * | 1978-03-24 | 1979-09-29 | Toshiba Corp | Drying device of photo resist film |
| JPS5932146A (ja) * | 1982-08-18 | 1984-02-21 | Nec Corp | 半導体ウエハ−の検査装置 |
-
1984
- 1984-11-30 JP JP18162184U patent/JPS6196544U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54125978A (en) * | 1978-03-24 | 1979-09-29 | Toshiba Corp | Drying device of photo resist film |
| JPS5932146A (ja) * | 1982-08-18 | 1984-02-21 | Nec Corp | 半導体ウエハ−の検査装置 |
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