JPS6191571A - 試験片を用いる連続自動分析方法及び装置 - Google Patents

試験片を用いる連続自動分析方法及び装置

Info

Publication number
JPS6191571A
JPS6191571A JP21359284A JP21359284A JPS6191571A JP S6191571 A JPS6191571 A JP S6191571A JP 21359284 A JP21359284 A JP 21359284A JP 21359284 A JP21359284 A JP 21359284A JP S6191571 A JPS6191571 A JP S6191571A
Authority
JP
Japan
Prior art keywords
test piece
automatic
test
holder
photometry
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP21359284A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0426434B2 (en, 2012
Inventor
Kazue Inoue
和重 井上
Hiroshi Yamamoto
博司 山本
Hiroshi Hyodo
寛 兵藤
Shinichi Kishimoto
進一 岸本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Arkray Inc
Original Assignee
Kyoto Daiichi Kagaku KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyoto Daiichi Kagaku KK filed Critical Kyoto Daiichi Kagaku KK
Priority to JP21359284A priority Critical patent/JPS6191571A/ja
Priority to US06/782,356 priority patent/US4876204A/en
Priority to DE8585112715T priority patent/DE3576857D1/de
Priority to EP85112715A priority patent/EP0180792B2/en
Priority to CN198585108392A priority patent/CN85108392A/zh
Publication of JPS6191571A publication Critical patent/JPS6191571A/ja
Publication of JPH0426434B2 publication Critical patent/JPH0426434B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G01N2035/00039—Transport arrangements specific to flat sample substrates, e.g. pusher blade
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G01N2035/00039—Transport arrangements specific to flat sample substrates, e.g. pusher blade
    • G01N2035/00049—Transport arrangements specific to flat sample substrates, e.g. pusher blade for loading/unloading a carousel
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G01N2035/00089—Magazines
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G01N2035/00099—Characterised by type of test elements
    • G01N2035/00108—Test strips, e.g. paper
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
    • G01N2035/00099—Characterised by type of test elements
    • G01N2035/00108—Test strips, e.g. paper
    • G01N2035/00118—Test strips, e.g. paper for multiple tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N35/1009—Characterised by arrangements for controlling the aspiration or dispense of liquids
    • G01N2035/1025—Fluid level sensing

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
JP21359284A 1984-10-11 1984-10-11 試験片を用いる連続自動分析方法及び装置 Granted JPS6191571A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP21359284A JPS6191571A (ja) 1984-10-11 1984-10-11 試験片を用いる連続自動分析方法及び装置
US06/782,356 US4876204A (en) 1984-10-11 1985-10-01 Method and apparatus of automatic continuous analysis using analytical implement
DE8585112715T DE3576857D1 (de) 1984-10-11 1985-10-08 Verfahren und vorrichtung zur automatischen kontinuierlichen analyse unter verwendung eines analysegeraetes.
EP85112715A EP0180792B2 (en) 1984-10-11 1985-10-08 Method and apparatus of automatic continuous analysis using analytical implement
CN198585108392A CN85108392A (zh) 1984-10-11 1985-10-09 分析器具的连续自动分析方法及装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21359284A JPS6191571A (ja) 1984-10-11 1984-10-11 試験片を用いる連続自動分析方法及び装置

Publications (2)

Publication Number Publication Date
JPS6191571A true JPS6191571A (ja) 1986-05-09
JPH0426434B2 JPH0426434B2 (en, 2012) 1992-05-07

Family

ID=16641746

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21359284A Granted JPS6191571A (ja) 1984-10-11 1984-10-11 試験片を用いる連続自動分析方法及び装置

Country Status (1)

Country Link
JP (1) JPS6191571A (en, 2012)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6453167A (en) * 1987-04-11 1989-03-01 Kyoto Daiichi Kagaku Kk Method and apparatus for biochemical analysis using test piece
JPH04115160A (ja) * 1990-09-05 1992-04-16 Kyoto Daiichi Kagaku:Kk 検体自動分析装置
JPH05133960A (ja) * 1991-11-14 1993-05-28 Hitachi Ltd 試験片供給装置およびそれを用いた分析装置
EP0594108A1 (en) * 1992-10-19 1994-04-27 Hitachi, Ltd. liquid sample automatic analyzer
US5460968A (en) * 1991-10-21 1995-10-24 Hitachi, Ltd. Analytical method and analytical apparatus using test strips
JP2009139364A (ja) * 2007-09-19 2009-06-25 F Hoffmann-La Roche Ag テストエレメントの不合格品マーキングのマーキング方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50106692A (en, 2012) * 1974-01-29 1975-08-22
US4204610A (en) * 1976-09-15 1980-05-27 Jacob Schlaepfer & Co. Ag Method of filling blind holes in a stencil
JPS5631538A (en) * 1979-08-20 1981-03-30 Tokico Ltd Method for filling gas in gas spring
JPS5782769A (en) * 1980-11-10 1982-05-24 Hitachi Ltd Automatic analyzing device
JPS581387A (ja) * 1981-06-25 1983-01-06 Sanyo Electric Co Ltd サンプリングクロツク再生回路
JPS59779A (ja) * 1982-06-28 1984-01-05 Nec Corp デ−タ照合システム

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50106692A (en, 2012) * 1974-01-29 1975-08-22
US4204610A (en) * 1976-09-15 1980-05-27 Jacob Schlaepfer & Co. Ag Method of filling blind holes in a stencil
JPS5631538A (en) * 1979-08-20 1981-03-30 Tokico Ltd Method for filling gas in gas spring
JPS5782769A (en) * 1980-11-10 1982-05-24 Hitachi Ltd Automatic analyzing device
JPS581387A (ja) * 1981-06-25 1983-01-06 Sanyo Electric Co Ltd サンプリングクロツク再生回路
JPS59779A (ja) * 1982-06-28 1984-01-05 Nec Corp デ−タ照合システム

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6453167A (en) * 1987-04-11 1989-03-01 Kyoto Daiichi Kagaku Kk Method and apparatus for biochemical analysis using test piece
JPH04115160A (ja) * 1990-09-05 1992-04-16 Kyoto Daiichi Kagaku:Kk 検体自動分析装置
US5460968A (en) * 1991-10-21 1995-10-24 Hitachi, Ltd. Analytical method and analytical apparatus using test strips
JPH05133960A (ja) * 1991-11-14 1993-05-28 Hitachi Ltd 試験片供給装置およびそれを用いた分析装置
US5378630A (en) * 1991-11-14 1995-01-03 Hitachi, Ltd. Test strip automatic supply device and analytical instrument using the same
EP0542260B1 (en) * 1991-11-14 1995-06-21 Hitachi, Ltd. Test strip automatic supply device and supply method using the same.
EP0594108A1 (en) * 1992-10-19 1994-04-27 Hitachi, Ltd. liquid sample automatic analyzer
US5415840A (en) * 1992-10-19 1995-05-16 Hitachi, Ltd. Liquid sample automatic analyzer
JP2009139364A (ja) * 2007-09-19 2009-06-25 F Hoffmann-La Roche Ag テストエレメントの不合格品マーキングのマーキング方法

Also Published As

Publication number Publication date
JPH0426434B2 (en, 2012) 1992-05-07

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Legal Events

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