JPS6174338A - 縮小投影露光装置およびその方法 - Google Patents
縮小投影露光装置およびその方法Info
- Publication number
- JPS6174338A JPS6174338A JP59195728A JP19572884A JPS6174338A JP S6174338 A JPS6174338 A JP S6174338A JP 59195728 A JP59195728 A JP 59195728A JP 19572884 A JP19572884 A JP 19572884A JP S6174338 A JPS6174338 A JP S6174338A
- Authority
- JP
- Japan
- Prior art keywords
- observed
- light
- alignment device
- optical alignment
- photoelectric conversion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59195728A JPS6174338A (ja) | 1984-09-20 | 1984-09-20 | 縮小投影露光装置およびその方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59195728A JPS6174338A (ja) | 1984-09-20 | 1984-09-20 | 縮小投影露光装置およびその方法 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6211247A Division JP2728368B2 (ja) | 1994-09-05 | 1994-09-05 | 露光方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6174338A true JPS6174338A (ja) | 1986-04-16 |
JPH0564450B2 JPH0564450B2 (enrdf_load_stackoverflow) | 1993-09-14 |
Family
ID=16345973
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59195728A Granted JPS6174338A (ja) | 1984-09-20 | 1984-09-20 | 縮小投影露光装置およびその方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6174338A (enrdf_load_stackoverflow) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6336526A (ja) * | 1986-07-30 | 1988-02-17 | Oki Electric Ind Co Ltd | ウエハ露光装置 |
JPS63161616A (ja) * | 1986-12-25 | 1988-07-05 | Nikon Corp | 位置ずれ検出装置 |
US6094268A (en) * | 1989-04-21 | 2000-07-25 | Hitachi, Ltd. | Projection exposure apparatus and projection exposure method |
Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS516565A (enrdf_load_stackoverflow) * | 1974-06-06 | 1976-01-20 | Ibm | |
JPS55134812A (en) * | 1979-04-02 | 1980-10-21 | Optimetrix Corp | Optical collection system |
JPS5632114A (en) * | 1979-06-12 | 1981-04-01 | Philips Nv | Optical image forming system |
JPS5696203A (en) * | 1979-12-27 | 1981-08-04 | Fujitsu Ltd | Detection device for optical position |
JPS56101112A (en) * | 1980-01-16 | 1981-08-13 | Fujitsu Ltd | Exposure method |
JPS58156937A (ja) * | 1982-03-12 | 1983-09-19 | Hitachi Ltd | 露光装置 |
JPS5947731A (ja) * | 1982-09-10 | 1984-03-17 | Hitachi Ltd | 投影露光装置におけるオ−トフオ−カス機構 |
JPS5999216A (ja) * | 1982-11-27 | 1984-06-07 | Jeol Ltd | 物体の表面高さ測定装置 |
JPS5999215A (ja) * | 1982-11-27 | 1984-06-07 | Jeol Ltd | 物体の表面高さ測定装置 |
JPS59121932A (ja) * | 1982-12-28 | 1984-07-14 | Fujitsu Ltd | 自動焦点制御装置 |
-
1984
- 1984-09-20 JP JP59195728A patent/JPS6174338A/ja active Granted
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS516565A (enrdf_load_stackoverflow) * | 1974-06-06 | 1976-01-20 | Ibm | |
JPS55134812A (en) * | 1979-04-02 | 1980-10-21 | Optimetrix Corp | Optical collection system |
JPS5632114A (en) * | 1979-06-12 | 1981-04-01 | Philips Nv | Optical image forming system |
JPS5696203A (en) * | 1979-12-27 | 1981-08-04 | Fujitsu Ltd | Detection device for optical position |
JPS56101112A (en) * | 1980-01-16 | 1981-08-13 | Fujitsu Ltd | Exposure method |
JPS58156937A (ja) * | 1982-03-12 | 1983-09-19 | Hitachi Ltd | 露光装置 |
JPS5947731A (ja) * | 1982-09-10 | 1984-03-17 | Hitachi Ltd | 投影露光装置におけるオ−トフオ−カス機構 |
JPS5999216A (ja) * | 1982-11-27 | 1984-06-07 | Jeol Ltd | 物体の表面高さ測定装置 |
JPS5999215A (ja) * | 1982-11-27 | 1984-06-07 | Jeol Ltd | 物体の表面高さ測定装置 |
JPS59121932A (ja) * | 1982-12-28 | 1984-07-14 | Fujitsu Ltd | 自動焦点制御装置 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6336526A (ja) * | 1986-07-30 | 1988-02-17 | Oki Electric Ind Co Ltd | ウエハ露光装置 |
JPS63161616A (ja) * | 1986-12-25 | 1988-07-05 | Nikon Corp | 位置ずれ検出装置 |
US6094268A (en) * | 1989-04-21 | 2000-07-25 | Hitachi, Ltd. | Projection exposure apparatus and projection exposure method |
Also Published As
Publication number | Publication date |
---|---|
JPH0564450B2 (enrdf_load_stackoverflow) | 1993-09-14 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4815854A (en) | Method of alignment between mask and semiconductor wafer | |
US6233043B1 (en) | Position detection technique applied to proximity exposure | |
JP2943499B2 (ja) | 高さ測定方法および装置 | |
US4636626A (en) | Apparatus for aligning mask and wafer used in semiconductor circuit element fabrication | |
JPH0726803B2 (ja) | 位置検出方法及び装置 | |
JP3880155B2 (ja) | 位置決め方法及び位置決め装置 | |
JPS61174717A (ja) | 位置合わせ装置 | |
TW201520704A (zh) | 對準感測器及高度感測器 | |
JP2005070225A (ja) | 表面画像投影装置及び表面画像投影方法 | |
JPS61111402A (ja) | 位置検出装置 | |
JPH09223650A (ja) | 露光装置 | |
JP2004247476A (ja) | 面位置計測方法 | |
JP3279979B2 (ja) | ウエハとマスクとの位置検出装置及び変形誤差検出方法 | |
JP2728368B2 (ja) | 露光方法 | |
JPS6174338A (ja) | 縮小投影露光装置およびその方法 | |
US4708484A (en) | Projection alignment method and apparatus | |
JP3376219B2 (ja) | 面位置検出装置および方法 | |
JPH09246356A (ja) | 表面位置設定方法 | |
JP3299144B2 (ja) | 近接露光に適用される位置検出装置及び位置検出方法 | |
JP2915051B2 (ja) | パターン形成方法及びその装置 | |
JPS61117831A (ja) | 焦点合せ装置 | |
JPS61128522A (ja) | 焦点合せ装置 | |
JPS6236822A (ja) | 光学的位置合せ装置 | |
JP3333759B2 (ja) | マスクとウエハとの間隔の測定方法及び設置方法 | |
JP2513281B2 (ja) | 位置合わせ装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term |