JPS6161426B2 - - Google Patents

Info

Publication number
JPS6161426B2
JPS6161426B2 JP55106225A JP10622580A JPS6161426B2 JP S6161426 B2 JPS6161426 B2 JP S6161426B2 JP 55106225 A JP55106225 A JP 55106225A JP 10622580 A JP10622580 A JP 10622580A JP S6161426 B2 JPS6161426 B2 JP S6161426B2
Authority
JP
Japan
Prior art keywords
under test
output
digital circuit
failure
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55106225A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5731058A (en
Inventor
Kenzo Ookawa
Toshio Maeda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP10622580A priority Critical patent/JPS5731058A/ja
Publication of JPS5731058A publication Critical patent/JPS5731058A/ja
Publication of JPS6161426B2 publication Critical patent/JPS6161426B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
JP10622580A 1980-08-01 1980-08-01 Fault diagnostic system of digital circuit Granted JPS5731058A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10622580A JPS5731058A (en) 1980-08-01 1980-08-01 Fault diagnostic system of digital circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10622580A JPS5731058A (en) 1980-08-01 1980-08-01 Fault diagnostic system of digital circuit

Publications (2)

Publication Number Publication Date
JPS5731058A JPS5731058A (en) 1982-02-19
JPS6161426B2 true JPS6161426B2 (ru) 1986-12-25

Family

ID=14428188

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10622580A Granted JPS5731058A (en) 1980-08-01 1980-08-01 Fault diagnostic system of digital circuit

Country Status (1)

Country Link
JP (1) JPS5731058A (ru)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0429835U (ru) * 1990-06-29 1992-03-10
JPH0523054U (ja) * 1991-09-03 1993-03-26 エヌオーケー株式会社 液面センサ
JPH0536322U (ja) * 1991-10-21 1993-05-18 エヌオーケー株式会社 液面センサ

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04167029A (ja) * 1990-10-31 1992-06-15 Nec Corp 故障検出判定装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0429835U (ru) * 1990-06-29 1992-03-10
JPH0523054U (ja) * 1991-09-03 1993-03-26 エヌオーケー株式会社 液面センサ
JPH0536322U (ja) * 1991-10-21 1993-05-18 エヌオーケー株式会社 液面センサ

Also Published As

Publication number Publication date
JPS5731058A (en) 1982-02-19

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