JPS5731058A - Fault diagnostic system of digital circuit - Google Patents

Fault diagnostic system of digital circuit

Info

Publication number
JPS5731058A
JPS5731058A JP10622580A JP10622580A JPS5731058A JP S5731058 A JPS5731058 A JP S5731058A JP 10622580 A JP10622580 A JP 10622580A JP 10622580 A JP10622580 A JP 10622580A JP S5731058 A JPS5731058 A JP S5731058A
Authority
JP
Japan
Prior art keywords
board
output
pattern sequence
inputted
tested
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10622580A
Other languages
Japanese (ja)
Other versions
JPS6161426B2 (en
Inventor
Kenzo Okawa
Toshio Maeda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP10622580A priority Critical patent/JPS5731058A/en
Publication of JPS5731058A publication Critical patent/JPS5731058A/en
Publication of JPS6161426B2 publication Critical patent/JPS6161426B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

PURPOSE:To automatically detect faulty parts by a high resolution, by compressing an output signal being different from a normal output, by a prescribed rule, when said output signal has been obtained to a signal of a board to be tested, which is inputted to a board tester, and retrieving a place of a faulty point. CONSTITUTION:To a board to be tested 2 consisting of a printed substrate is mounted a digital circuit to be tested 10, and an output of this board 2 is sent out to a board tester 3. This tester 3 compares an output pattern sequence to be outputted, with an output pattern sequence in case when there is no fault, and checks whether a fault is exists or not in the board 2. In this case, when an input pattern sequence 11 from a floppy disk 4 has been inputted to the board 2, if a different output pattern sequence 12 has been outputted from the board 2, this output is inputted to a cyclic operating circuit 13, is compressed in accordance with a prescribed rule, and a cyclic code 14 is obtained. After that, a table of the code 14 and a place of a faulty point is retrived, a corresponding faulty place is derived, and it is displayed on a typewriter 5.
JP10622580A 1980-08-01 1980-08-01 Fault diagnostic system of digital circuit Granted JPS5731058A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10622580A JPS5731058A (en) 1980-08-01 1980-08-01 Fault diagnostic system of digital circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10622580A JPS5731058A (en) 1980-08-01 1980-08-01 Fault diagnostic system of digital circuit

Publications (2)

Publication Number Publication Date
JPS5731058A true JPS5731058A (en) 1982-02-19
JPS6161426B2 JPS6161426B2 (en) 1986-12-25

Family

ID=14428188

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10622580A Granted JPS5731058A (en) 1980-08-01 1980-08-01 Fault diagnostic system of digital circuit

Country Status (1)

Country Link
JP (1) JPS5731058A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04167029A (en) * 1990-10-31 1992-06-15 Nec Corp Fault detection and decision device

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0429835U (en) * 1990-06-29 1992-03-10
JPH0523054U (en) * 1991-09-03 1993-03-26 エヌオーケー株式会社 Liquid level sensor
JPH0536322U (en) * 1991-10-21 1993-05-18 エヌオーケー株式会社 Liquid level sensor

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04167029A (en) * 1990-10-31 1992-06-15 Nec Corp Fault detection and decision device

Also Published As

Publication number Publication date
JPS6161426B2 (en) 1986-12-25

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