JPS6161424B2 - - Google Patents

Info

Publication number
JPS6161424B2
JPS6161424B2 JP55098425A JP9842580A JPS6161424B2 JP S6161424 B2 JPS6161424 B2 JP S6161424B2 JP 55098425 A JP55098425 A JP 55098425A JP 9842580 A JP9842580 A JP 9842580A JP S6161424 B2 JPS6161424 B2 JP S6161424B2
Authority
JP
Japan
Prior art keywords
port
test
instruction
predetermined
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55098425A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5723153A (en
Inventor
Hitoshi Takahashi
Tsuyoshi Yamamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP9842580A priority Critical patent/JPS5723153A/ja
Publication of JPS5723153A publication Critical patent/JPS5723153A/ja
Publication of JPS6161424B2 publication Critical patent/JPS6161424B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Microcomputers (AREA)
JP9842580A 1980-07-18 1980-07-18 Microcomputer Granted JPS5723153A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9842580A JPS5723153A (en) 1980-07-18 1980-07-18 Microcomputer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9842580A JPS5723153A (en) 1980-07-18 1980-07-18 Microcomputer

Publications (2)

Publication Number Publication Date
JPS5723153A JPS5723153A (en) 1982-02-06
JPS6161424B2 true JPS6161424B2 (enrdf_load_stackoverflow) 1986-12-25

Family

ID=14219450

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9842580A Granted JPS5723153A (en) 1980-07-18 1980-07-18 Microcomputer

Country Status (1)

Country Link
JP (1) JPS5723153A (enrdf_load_stackoverflow)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59146352A (ja) * 1983-02-09 1984-08-22 Nec Corp シングル・チップ・マイクロコンピュータ
JPS60134350A (ja) * 1983-12-22 1985-07-17 Nec Corp シングルチツプマイクロコンピユ−タ
JPS617663U (ja) * 1984-06-20 1986-01-17 いすゞ自動車株式会社 自動変速機の変速操作機構
JPS619669U (ja) * 1984-06-23 1986-01-21 日産ディーゼル工業株式会社 自動変速機のシフト機構
JPS6132858U (ja) * 1984-07-31 1986-02-27 日産ディーゼル工業株式会社 自動変速機のシフト機構
JPS6147155U (ja) * 1984-08-31 1986-03-29 日産ディーゼル工業株式会社 自動変速機のシフト機構
JPH0231239A (ja) * 1988-07-20 1990-02-01 Ricoh Co Ltd レジスタテスト回路装置
JP2747228B2 (ja) * 1994-09-30 1998-05-06 山形日本電気株式会社 エミュレーション装置

Also Published As

Publication number Publication date
JPS5723153A (en) 1982-02-06

Similar Documents

Publication Publication Date Title
KR980006434A (ko) 메모리 테스트를 위한 온-칩 자동 절차
US5812867A (en) Integrated circuit comprising a microprocessor, a memory and internal configurable peripherals
JPS6161424B2 (enrdf_load_stackoverflow)
EP0587445B1 (en) Semiconductor integrated circuit and IC card using the same
JP2621894B2 (ja) マイクロコンピュータ
US4958309A (en) Apparatus and method for changing frequencies
KR100209762B1 (ko) 리셋 장치 및 그를 이용한 동작 모드 설정 방법
KR100277770B1 (ko) 시퀀스 제어회로
US5974519A (en) Address re-designate circuit for microcontroller
JPH0752405B2 (ja) シングルチップマイクロコンピュータ
EP0633529B1 (en) Emulation system for microcomputer
US7191323B2 (en) Information processing unit selecting one of reset vector addresses
US6003141A (en) Single chip processor with externally executed test function
US4538923A (en) Test circuit for watch LSI
JP3154098B2 (ja) メモリ素子のリフレッシュ回路
KR100251682B1 (ko) 이동 무선 단말기의 메모리 자체 테스트 장치 및 방법
JPS6031641A (ja) ワンチツプマイクロコンピユ−タ
JP2659147B2 (ja) 評価用マイクロコンピュータ
JPH06249927A (ja) 電子回路装置
JPH02135542A (ja) Ｅｐｒｏｍ内蔵マイクロコンピュータのテスト回路
JPH06103106A (ja) プログラムデバッグ装置
JPH04320555A (ja) マイクロコンピュータのデータ確認方式
JPS60134350A (ja) シングルチツプマイクロコンピユ−タ
JPS6210389B2 (enrdf_load_stackoverflow)
JPH09274611A (ja) マイクロコンピュータ