JPS6148210B2 - - Google Patents
Info
- Publication number
- JPS6148210B2 JPS6148210B2 JP56031332A JP3133281A JPS6148210B2 JP S6148210 B2 JPS6148210 B2 JP S6148210B2 JP 56031332 A JP56031332 A JP 56031332A JP 3133281 A JP3133281 A JP 3133281A JP S6148210 B2 JPS6148210 B2 JP S6148210B2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- electron microscope
- scanning electron
- partition plate
- positively charged
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/026—Means for avoiding or neutralising unwanted electrical charges on tube components
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56031332A JPS57147857A (en) | 1981-03-06 | 1981-03-06 | Sample observation through scanning electron microscope |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56031332A JPS57147857A (en) | 1981-03-06 | 1981-03-06 | Sample observation through scanning electron microscope |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57147857A JPS57147857A (en) | 1982-09-11 |
JPS6148210B2 true JPS6148210B2 (enrdf_load_html_response) | 1986-10-23 |
Family
ID=12328297
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56031332A Granted JPS57147857A (en) | 1981-03-06 | 1981-03-06 | Sample observation through scanning electron microscope |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57147857A (enrdf_load_html_response) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6172363B1 (en) | 1996-03-05 | 2001-01-09 | Hitachi, Ltd. | Method and apparatus for inspecting integrated circuit pattern |
EP2365512A3 (en) | 2000-06-27 | 2012-01-04 | Ebara Corporation | Inspection system by charged particle beam |
JP4629207B2 (ja) * | 2000-10-20 | 2011-02-09 | 株式会社ホロン | マスク検査装置 |
US6627884B2 (en) | 2001-03-19 | 2003-09-30 | Kla-Tencor Technologies Corporation | Simultaneous flooding and inspection for charge control in an electron beam inspection machine |
EP1978355B1 (en) * | 2006-01-20 | 2016-07-27 | Hitachi High-Technologies Corporation | Method of observing sample using a liquid medium for preventing charge-up in an electron microscope |
WO2013035866A1 (ja) * | 2011-09-09 | 2013-03-14 | 独立行政法人科学技術振興機構 | 生物試料をそのままの姿で観察するための電子顕微鏡による観察方法とそれに用いられる真空下での蒸発抑制用組成物、走査型電子顕微鏡および透過型電子顕微鏡 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5127981A (ja) * | 1974-09-02 | 1976-03-09 | Mitsui Shipbuilding Eng | Jikubarikikei |
-
1981
- 1981-03-06 JP JP56031332A patent/JPS57147857A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS57147857A (en) | 1982-09-11 |
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