JPS6143817B2 - - Google Patents

Info

Publication number
JPS6143817B2
JPS6143817B2 JP53163305A JP16330578A JPS6143817B2 JP S6143817 B2 JPS6143817 B2 JP S6143817B2 JP 53163305 A JP53163305 A JP 53163305A JP 16330578 A JP16330578 A JP 16330578A JP S6143817 B2 JPS6143817 B2 JP S6143817B2
Authority
JP
Japan
Prior art keywords
sample
inclined surface
knob
electron microscope
view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP53163305A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5588256A (en
Inventor
Toshikazu Honda
Yoshinori Aoki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Denshi KK filed Critical Nihon Denshi KK
Priority to JP16330578A priority Critical patent/JPS5588256A/ja
Publication of JPS5588256A publication Critical patent/JPS5588256A/ja
Publication of JPS6143817B2 publication Critical patent/JPS6143817B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
JP16330578A 1978-12-26 1978-12-26 Sample compression tester for electron microscope or the like Granted JPS5588256A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16330578A JPS5588256A (en) 1978-12-26 1978-12-26 Sample compression tester for electron microscope or the like

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16330578A JPS5588256A (en) 1978-12-26 1978-12-26 Sample compression tester for electron microscope or the like

Publications (2)

Publication Number Publication Date
JPS5588256A JPS5588256A (en) 1980-07-03
JPS6143817B2 true JPS6143817B2 (enrdf_load_stackoverflow) 1986-09-30

Family

ID=15771294

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16330578A Granted JPS5588256A (en) 1978-12-26 1978-12-26 Sample compression tester for electron microscope or the like

Country Status (1)

Country Link
JP (1) JPS5588256A (enrdf_load_stackoverflow)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006196310A (ja) * 2005-01-13 2006-07-27 Central Res Inst Of Electric Power Ind 電子顕微鏡用可動プローブ装置および電子顕微鏡の試料観察方法
JP5826760B2 (ja) * 2009-11-27 2015-12-02 ハイジトロン, インク.Hysitron, Inc. ミクロ電気機械ヒータ
EP2780689B1 (en) 2011-11-14 2017-01-04 Hysitron, Inc. Probe tip heating assembly
WO2013082148A1 (en) 2011-11-28 2013-06-06 Lucas Paul Keranen High temperature heating system
JP2013127859A (ja) * 2011-12-16 2013-06-27 Nagoya Institute Of Technology 被検査試料測定装置及び被検査試料測定装置の制御方法
WO2013187972A1 (en) 2012-06-13 2013-12-19 Schmitz Roger William Environmental conditioning assembly for use in mechanical testing at micron or nano-scales

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS567257B2 (enrdf_load_stackoverflow) * 1973-07-09 1981-02-17

Also Published As

Publication number Publication date
JPS5588256A (en) 1980-07-03

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