JPS5588256A - Sample compression tester for electron microscope or the like - Google Patents
Sample compression tester for electron microscope or the likeInfo
- Publication number
- JPS5588256A JPS5588256A JP16330578A JP16330578A JPS5588256A JP S5588256 A JPS5588256 A JP S5588256A JP 16330578 A JP16330578 A JP 16330578A JP 16330578 A JP16330578 A JP 16330578A JP S5588256 A JPS5588256 A JP S5588256A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- electron microscope
- compressed
- compression tester
- knob
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16330578A JPS5588256A (en) | 1978-12-26 | 1978-12-26 | Sample compression tester for electron microscope or the like |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16330578A JPS5588256A (en) | 1978-12-26 | 1978-12-26 | Sample compression tester for electron microscope or the like |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5588256A true JPS5588256A (en) | 1980-07-03 |
JPS6143817B2 JPS6143817B2 (ja) | 1986-09-30 |
Family
ID=15771294
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16330578A Granted JPS5588256A (en) | 1978-12-26 | 1978-12-26 | Sample compression tester for electron microscope or the like |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5588256A (ja) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006196310A (ja) * | 2005-01-13 | 2006-07-27 | Central Res Inst Of Electric Power Ind | 電子顕微鏡用可動プローブ装置および電子顕微鏡の試料観察方法 |
JP2013512545A (ja) * | 2009-11-27 | 2013-04-11 | ハイジトロン,インク. | ミクロ電気機械ヒータ |
JP2013127859A (ja) * | 2011-12-16 | 2013-06-27 | Nagoya Institute Of Technology | 被検査試料測定装置及び被検査試料測定装置の制御方法 |
US9476816B2 (en) | 2011-11-14 | 2016-10-25 | Hysitron, Inc. | Probe tip heating assembly |
US9804072B2 (en) | 2011-11-28 | 2017-10-31 | Hysitron, Inc. | High temperature heating system |
US9829417B2 (en) | 2012-06-13 | 2017-11-28 | Hysitron, Inc. | Environmental conditioning assembly for use in mechanical testing at micron or nano-scales |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5026469A (ja) * | 1973-07-09 | 1975-03-19 |
-
1978
- 1978-12-26 JP JP16330578A patent/JPS5588256A/ja active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5026469A (ja) * | 1973-07-09 | 1975-03-19 |
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006196310A (ja) * | 2005-01-13 | 2006-07-27 | Central Res Inst Of Electric Power Ind | 電子顕微鏡用可動プローブ装置および電子顕微鏡の試料観察方法 |
JP2013512545A (ja) * | 2009-11-27 | 2013-04-11 | ハイジトロン,インク. | ミクロ電気機械ヒータ |
JP2016029662A (ja) * | 2009-11-27 | 2016-03-03 | ハイジトロン, インク.Hysitron, Inc. | ミクロ電気機械ヒータ |
US9316569B2 (en) | 2009-11-27 | 2016-04-19 | Hysitron, Inc. | Micro electro-mechanical heater |
US9759641B2 (en) | 2009-11-27 | 2017-09-12 | Hysitron, Inc. | Micro electro-mechanical heater |
EP2504671A4 (en) * | 2009-11-27 | 2017-11-08 | Hysitron, Inc. | Micro electro-mechanical heater |
US9476816B2 (en) | 2011-11-14 | 2016-10-25 | Hysitron, Inc. | Probe tip heating assembly |
US9804072B2 (en) | 2011-11-28 | 2017-10-31 | Hysitron, Inc. | High temperature heating system |
US10241017B2 (en) | 2011-11-28 | 2019-03-26 | Bruker Nano, Inc. | High temperature heating system |
JP2013127859A (ja) * | 2011-12-16 | 2013-06-27 | Nagoya Institute Of Technology | 被検査試料測定装置及び被検査試料測定装置の制御方法 |
US9829417B2 (en) | 2012-06-13 | 2017-11-28 | Hysitron, Inc. | Environmental conditioning assembly for use in mechanical testing at micron or nano-scales |
Also Published As
Publication number | Publication date |
---|---|
JPS6143817B2 (ja) | 1986-09-30 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
ATE143136T1 (de) | Vorrichtung und verfahren zur einachsigen mechanischen werkstoffprüfung | |
CA2045172A1 (en) | Dual color camera microscope and methodology for cell staining and analysis | |
JPS5795056A (en) | Appearance inspecting process | |
JPS5588256A (en) | Sample compression tester for electron microscope or the like | |
GB2051471B (en) | Method of adjusting a specimen in an electron microscope | |
CH614532A5 (en) | Method for producing cryofractures in samples of animal or vegetable tissue and apparatus for implementing this method | |
JPS54154345A (en) | Movable aperture plate of objective lens | |
GB2010577A (en) | Preparing specimens using an ion beam | |
Tsuya et al. | In situ observation of wear process in a scanning electron microscope | |
JPS52128053A (en) | Electron microscope | |
JPS6468646A (en) | Pretreatment of sample for fluorescent x-ray analysis | |
CAMPBELL | In-situ microscopic studies of deformation[M. S. Thesis] | |
CA2534544A1 (en) | Method for the characterisation of surface structures and use thereof for the modification development and production of materials | |
JPS5252562A (en) | Electron beam scanning type sample image pick-up device | |
White | Optical microscope, SEM combined to improve analysis | |
JPS5757460A (en) | Electron microscope | |
JPH1092365A (ja) | 集束イオンビーム加工用試料ホルダ | |
JPS52149062A (en) | Scanning electronic microscope | |
JPS5740843A (en) | Electron microscope | |
Straus et al. | A technique for studying microscopic wear on artifact surfaces | |
GB2052848B (en) | Arrangement for the mounting of large specimens for examination in an electron microscope | |
JPS5366152A (en) | Electron microscope | |
Yakovlev et al. | Study of Residual Strains in Components by the Method of Holographic Interferometry | |
Ito et al. | Examination of several selected fungi by scanning electron microscope | |
JPS5289457A (en) | Stereo scan type electron microscope |