JPS6131430B2 - - Google Patents
Info
- Publication number
- JPS6131430B2 JPS6131430B2 JP55148942A JP14894280A JPS6131430B2 JP S6131430 B2 JPS6131430 B2 JP S6131430B2 JP 55148942 A JP55148942 A JP 55148942A JP 14894280 A JP14894280 A JP 14894280A JP S6131430 B2 JPS6131430 B2 JP S6131430B2
- Authority
- JP
- Japan
- Prior art keywords
- signal
- converter
- digital
- analog
- charge
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 12
- 230000008878 coupling Effects 0.000 claims 1
- 238000010168 coupling process Methods 0.000 claims 1
- 238000005859 coupling reaction Methods 0.000 claims 1
- 238000005070 sampling Methods 0.000 claims 1
- 238000005259 measurement Methods 0.000 description 8
- 238000006243 chemical reaction Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 206010034972 Photosensitivity reaction Diseases 0.000 description 3
- 230000036211 photosensitivity Effects 0.000 description 3
- 230000007423 decrease Effects 0.000 description 2
- 239000000284 extract Substances 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2641—Circuits therefor for testing charge coupled devices
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Solid State Image Pick-Up Elements (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55148942A JPS5772081A (en) | 1980-10-24 | 1980-10-24 | Device for testing charge couple device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55148942A JPS5772081A (en) | 1980-10-24 | 1980-10-24 | Device for testing charge couple device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5772081A JPS5772081A (en) | 1982-05-06 |
| JPS6131430B2 true JPS6131430B2 (enrdf_load_stackoverflow) | 1986-07-19 |
Family
ID=15464102
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55148942A Granted JPS5772081A (en) | 1980-10-24 | 1980-10-24 | Device for testing charge couple device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5772081A (enrdf_load_stackoverflow) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6176967A (ja) * | 1984-09-21 | 1986-04-19 | Toshiba Corp | 感度測定装置 |
-
1980
- 1980-10-24 JP JP55148942A patent/JPS5772081A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5772081A (en) | 1982-05-06 |
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