JPS5772081A - Device for testing charge couple device - Google Patents
Device for testing charge couple deviceInfo
- Publication number
- JPS5772081A JPS5772081A JP55148942A JP14894280A JPS5772081A JP S5772081 A JPS5772081 A JP S5772081A JP 55148942 A JP55148942 A JP 55148942A JP 14894280 A JP14894280 A JP 14894280A JP S5772081 A JPS5772081 A JP S5772081A
- Authority
- JP
- Japan
- Prior art keywords
- converter
- signal level
- level
- difference
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2641—Circuits therefor for testing charge coupled devices
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Solid State Image Pick-Up Elements (AREA)
Abstract
PURPOSE:To measure the output signal level of each element and the difference between said signal level and an average signal level with high accuracy, by amplifying the difference between a high frequency signal from an image sensor and a signal which is set in a D/A converter by k times, converting the result into digital value, and reducing the errors in a sample hold circuit and the A/D converter. CONSTITUTION:In order to obtain the high frequency signal level on which the DC level which is outputted from the image sensor 1 is overlapped, the high resolution D/A converter 7 and an amplifier 8 are provided. The difference between the high frequency signal from the image sensor 1 and the signal set by a converter 7 is amplified by k times in said amplifier, then it is converted into the digital signal. Therefore, the errors in the sample and hold circuit 4 and the A/D converter 5 can be reduced to 1/k. The reference level of the output signal of the CCD, the output signal level of each element, and the difference between said output signal level of each element and the average signal level are measured highly accurately with high resolution, and the quality of each element in the CCD is determined.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55148942A JPS5772081A (en) | 1980-10-24 | 1980-10-24 | Device for testing charge couple device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55148942A JPS5772081A (en) | 1980-10-24 | 1980-10-24 | Device for testing charge couple device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5772081A true JPS5772081A (en) | 1982-05-06 |
JPS6131430B2 JPS6131430B2 (en) | 1986-07-19 |
Family
ID=15464102
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55148942A Granted JPS5772081A (en) | 1980-10-24 | 1980-10-24 | Device for testing charge couple device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5772081A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6176967A (en) * | 1984-09-21 | 1986-04-19 | Toshiba Corp | Sensitivity measuring device |
-
1980
- 1980-10-24 JP JP55148942A patent/JPS5772081A/en active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6176967A (en) * | 1984-09-21 | 1986-04-19 | Toshiba Corp | Sensitivity measuring device |
Also Published As
Publication number | Publication date |
---|---|
JPS6131430B2 (en) | 1986-07-19 |
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