JPS5744867A - Measuring device for charge coupled element - Google Patents

Measuring device for charge coupled element

Info

Publication number
JPS5744867A
JPS5744867A JP11928780A JP11928780A JPS5744867A JP S5744867 A JPS5744867 A JP S5744867A JP 11928780 A JP11928780 A JP 11928780A JP 11928780 A JP11928780 A JP 11928780A JP S5744867 A JPS5744867 A JP S5744867A
Authority
JP
Japan
Prior art keywords
output
ccd
held
absolute
ram12
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11928780A
Other languages
Japanese (ja)
Inventor
Den Ooshima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP11928780A priority Critical patent/JPS5744867A/en
Publication of JPS5744867A publication Critical patent/JPS5744867A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2641—Circuits therefor for testing charge coupled devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE:To measure the quality of a charge coupled device (CCD) with higher speed and with higher accuracy, by a method wherein with a switch changed over, the absolute value output and the relative value output of a charge coupled device (CCD) are sample-held to process digitally. CONSTITUTION:The output of a CCD is supplied via a coaxial cable C to a buffer amplifier 3 that has been impedance-matched. And when a mode change-over switch 7 is connected to a contact point (a), the absolute value output is held in a sample hold circuit 10 to which a prescribed clock signal to control the CCD is applied. The absolute output is stored via an A/D converter 11 in an RAM12. On the other hand, when the switch 7 is connected to a contact point b, the relative output of the difference between said absolute output and the absolute output held in the sample hold circuit 5 from a differential amplifier 6 is held in the circuit 10, and the digital value is written in the RAM12. When the stored contents in the RAM12 are processed digitally, the quality of the CCD such as average voltage, lacks of bits and existence of noises in the CCD output is measured with higher speed and higher accuracy.
JP11928780A 1980-08-29 1980-08-29 Measuring device for charge coupled element Pending JPS5744867A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11928780A JPS5744867A (en) 1980-08-29 1980-08-29 Measuring device for charge coupled element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11928780A JPS5744867A (en) 1980-08-29 1980-08-29 Measuring device for charge coupled element

Publications (1)

Publication Number Publication Date
JPS5744867A true JPS5744867A (en) 1982-03-13

Family

ID=14757657

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11928780A Pending JPS5744867A (en) 1980-08-29 1980-08-29 Measuring device for charge coupled element

Country Status (1)

Country Link
JP (1) JPS5744867A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5970976A (en) * 1982-10-15 1984-04-21 Advantest Corp Tester for image pickup device
JPS59100880A (en) * 1982-12-01 1984-06-11 Advantest Corp Testing apparatus for image pickup device
JPS59100879A (en) * 1982-12-01 1984-06-11 Advantest Corp Testing apparatus for image pickup device
JPH0547875U (en) * 1991-11-26 1993-06-25 株式会社アドバンテスト CCD tester
US7132844B2 (en) 2002-11-21 2006-11-07 Advantest Corporation Testing device and testing method for testing an electronic device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50126176A (en) * 1974-03-22 1975-10-03
JPS5164823A (en) * 1974-12-03 1976-06-04 Nippon Electric Co

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50126176A (en) * 1974-03-22 1975-10-03
JPS5164823A (en) * 1974-12-03 1976-06-04 Nippon Electric Co

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5970976A (en) * 1982-10-15 1984-04-21 Advantest Corp Tester for image pickup device
JPS59100880A (en) * 1982-12-01 1984-06-11 Advantest Corp Testing apparatus for image pickup device
JPS59100879A (en) * 1982-12-01 1984-06-11 Advantest Corp Testing apparatus for image pickup device
JPH0146035B2 (en) * 1982-12-01 1989-10-05 Advantest Corp
JPH0547875U (en) * 1991-11-26 1993-06-25 株式会社アドバンテスト CCD tester
US7132844B2 (en) 2002-11-21 2006-11-07 Advantest Corporation Testing device and testing method for testing an electronic device

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