JPS5772081A - Device for testing charge couple device - Google Patents

Device for testing charge couple device

Info

Publication number
JPS5772081A
JPS5772081A JP55148942A JP14894280A JPS5772081A JP S5772081 A JPS5772081 A JP S5772081A JP 55148942 A JP55148942 A JP 55148942A JP 14894280 A JP14894280 A JP 14894280A JP S5772081 A JPS5772081 A JP S5772081A
Authority
JP
Japan
Prior art keywords
converter
signal level
level
difference
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55148942A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6131430B2 (enrdf_load_stackoverflow
Inventor
Ken Hashizume
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP55148942A priority Critical patent/JPS5772081A/ja
Publication of JPS5772081A publication Critical patent/JPS5772081A/ja
Publication of JPS6131430B2 publication Critical patent/JPS6131430B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2641—Circuits therefor for testing charge coupled devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Solid State Image Pick-Up Elements (AREA)
JP55148942A 1980-10-24 1980-10-24 Device for testing charge couple device Granted JPS5772081A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55148942A JPS5772081A (en) 1980-10-24 1980-10-24 Device for testing charge couple device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55148942A JPS5772081A (en) 1980-10-24 1980-10-24 Device for testing charge couple device

Publications (2)

Publication Number Publication Date
JPS5772081A true JPS5772081A (en) 1982-05-06
JPS6131430B2 JPS6131430B2 (enrdf_load_stackoverflow) 1986-07-19

Family

ID=15464102

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55148942A Granted JPS5772081A (en) 1980-10-24 1980-10-24 Device for testing charge couple device

Country Status (1)

Country Link
JP (1) JPS5772081A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6176967A (ja) * 1984-09-21 1986-04-19 Toshiba Corp 感度測定装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6176967A (ja) * 1984-09-21 1986-04-19 Toshiba Corp 感度測定装置

Also Published As

Publication number Publication date
JPS6131430B2 (enrdf_load_stackoverflow) 1986-07-19

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