JPS6129070B2 - - Google Patents
Info
- Publication number
- JPS6129070B2 JPS6129070B2 JP56205120A JP20512081A JPS6129070B2 JP S6129070 B2 JPS6129070 B2 JP S6129070B2 JP 56205120 A JP56205120 A JP 56205120A JP 20512081 A JP20512081 A JP 20512081A JP S6129070 B2 JPS6129070 B2 JP S6129070B2
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- memory cell
- voltage
- correction
- bit line
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000003321 amplification Effects 0.000 claims description 4
- 238000003199 nucleic acid amplification method Methods 0.000 claims description 4
- 230000005669 field effect Effects 0.000 description 38
- 239000003990 capacitor Substances 0.000 description 18
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 10
- 238000010586 diagram Methods 0.000 description 9
- 230000003071 parasitic effect Effects 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 3
- 230000006870 function Effects 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
Landscapes
- Static Random-Access Memory (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56205120A JPS58108090A (ja) | 1981-12-21 | 1981-12-21 | メモリ回路 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56205120A JPS58108090A (ja) | 1981-12-21 | 1981-12-21 | メモリ回路 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58108090A JPS58108090A (ja) | 1983-06-28 |
| JPS6129070B2 true JPS6129070B2 (cs) | 1986-07-04 |
Family
ID=16501747
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56205120A Granted JPS58108090A (ja) | 1981-12-21 | 1981-12-21 | メモリ回路 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58108090A (cs) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6584026B2 (en) | 2000-06-28 | 2003-06-24 | Kabushiki Kaisha Toshiba | Semiconductor integrated circuit capable of adjusting input offset voltage |
| JP4965883B2 (ja) * | 2006-04-07 | 2012-07-04 | 株式会社東芝 | 半導体集積回路装置および半導体集積回路装置のトリミング方法 |
| JP5452348B2 (ja) * | 2009-07-27 | 2014-03-26 | ルネサスエレクトロニクス株式会社 | 半導体記憶装置 |
-
1981
- 1981-12-21 JP JP56205120A patent/JPS58108090A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58108090A (ja) | 1983-06-28 |
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