JPS61267320A - 荷電ビ−ム露光方法 - Google Patents
荷電ビ−ム露光方法Info
- Publication number
- JPS61267320A JPS61267320A JP10870485A JP10870485A JPS61267320A JP S61267320 A JPS61267320 A JP S61267320A JP 10870485 A JP10870485 A JP 10870485A JP 10870485 A JP10870485 A JP 10870485A JP S61267320 A JPS61267320 A JP S61267320A
- Authority
- JP
- Japan
- Prior art keywords
- sub
- pattern
- deflection
- drawn
- deflector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Electron Beam Exposure (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10870485A JPS61267320A (ja) | 1985-05-21 | 1985-05-21 | 荷電ビ−ム露光方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10870485A JPS61267320A (ja) | 1985-05-21 | 1985-05-21 | 荷電ビ−ム露光方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61267320A true JPS61267320A (ja) | 1986-11-26 |
| JPH0586850B2 JPH0586850B2 (enrdf_load_stackoverflow) | 1993-12-14 |
Family
ID=14491498
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10870485A Granted JPS61267320A (ja) | 1985-05-21 | 1985-05-21 | 荷電ビ−ム露光方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61267320A (enrdf_load_stackoverflow) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63283130A (ja) * | 1987-05-15 | 1988-11-21 | Toshiba Mach Co Ltd | 荷電ビ−ム描画方法及び描画装置 |
| JPS6411328A (en) * | 1987-06-30 | 1989-01-13 | Ibm | Electron beam exposure system |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59231810A (ja) * | 1983-06-14 | 1984-12-26 | Toshiba Corp | 電子ビ−ム露光装置 |
-
1985
- 1985-05-21 JP JP10870485A patent/JPS61267320A/ja active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59231810A (ja) * | 1983-06-14 | 1984-12-26 | Toshiba Corp | 電子ビ−ム露光装置 |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63283130A (ja) * | 1987-05-15 | 1988-11-21 | Toshiba Mach Co Ltd | 荷電ビ−ム描画方法及び描画装置 |
| JPS6411328A (en) * | 1987-06-30 | 1989-01-13 | Ibm | Electron beam exposure system |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0586850B2 (enrdf_load_stackoverflow) | 1993-12-14 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP5484808B2 (ja) | 描画装置及び描画方法 | |
| EP1253619B1 (en) | Charged particle beam exposure apparatus and device manufacturing method using same | |
| US6552353B1 (en) | Multi-electron beam exposure method and apparatus and device manufacturing method | |
| US8872139B2 (en) | Settling time acquisition method | |
| US6815698B2 (en) | Charged particle beam exposure system | |
| JP2000150367A (ja) | 荷電ビ―ム描画装置 | |
| JPH0691005B2 (ja) | 荷電ビ−ム描画方法 | |
| US10811224B2 (en) | Multi-charged-particle beam writing apparatus | |
| JPS61267320A (ja) | 荷電ビ−ム露光方法 | |
| JP4664552B2 (ja) | 可変成型ビーム型パターン描画装置 | |
| US20010017355A1 (en) | Electron beam lithography apparatus and lithography method | |
| US20180122616A1 (en) | Charged Particle Beam Writing Apparatus, and Charged Particle Beam Writing Method | |
| US9281161B2 (en) | Electron beam writing apparatus and electron beam writing method | |
| JP3285645B2 (ja) | 荷電ビーム描画方法 | |
| JP6039970B2 (ja) | セトリング時間の設定方法、荷電粒子ビーム描画方法、および荷電粒子ビーム描画装置 | |
| JP5809483B2 (ja) | ショットデータの作成方法、荷電粒子ビーム描画装置及び荷電粒子ビーム描画方法 | |
| US12046447B2 (en) | Multi-charged-particle-beam writing method, multi-charged-particle-beam writing apparatus, and computer-readable recording medium | |
| JP7468795B1 (ja) | マルチ荷電粒子ビーム描画装置 | |
| JPH01248617A (ja) | 荷電粒子ビーム露光装置 | |
| JP7480917B1 (ja) | マルチ荷電粒子ビーム描画装置 | |
| JPS62149126A (ja) | 荷電ビ−ム露光方法 | |
| JP3460416B2 (ja) | 電子ビーム描画装置 | |
| JPH01278725A (ja) | 荷電粒子ビーム露光装置 | |
| JPS6182430A (ja) | 荷電ビ−ム露光装置 | |
| JPH11329933A (ja) | 荷電粒子ビーム露光装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |