JPS61139705A - 位置検出装置 - Google Patents
位置検出装置Info
- Publication number
- JPS61139705A JPS61139705A JP26237984A JP26237984A JPS61139705A JP S61139705 A JPS61139705 A JP S61139705A JP 26237984 A JP26237984 A JP 26237984A JP 26237984 A JP26237984 A JP 26237984A JP S61139705 A JPS61139705 A JP S61139705A
- Authority
- JP
- Japan
- Prior art keywords
- light
- sample
- reflected light
- slit
- optical axis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 claims abstract description 53
- 238000001514 detection method Methods 0.000 claims abstract description 24
- 238000010408 sweeping Methods 0.000 claims abstract description 5
- 238000006073 displacement reaction Methods 0.000 abstract description 12
- 238000010586 diagram Methods 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 230000035945 sensitivity Effects 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 238000007689 inspection Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Measurement Of Optical Distance (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26237984A JPS61139705A (ja) | 1984-12-11 | 1984-12-11 | 位置検出装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26237984A JPS61139705A (ja) | 1984-12-11 | 1984-12-11 | 位置検出装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61139705A true JPS61139705A (ja) | 1986-06-27 |
JPH0533322B2 JPH0533322B2 (enrdf_load_stackoverflow) | 1993-05-19 |
Family
ID=17374935
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP26237984A Granted JPS61139705A (ja) | 1984-12-11 | 1984-12-11 | 位置検出装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61139705A (enrdf_load_stackoverflow) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006075782A (ja) * | 2004-09-13 | 2006-03-23 | Shin Meiwa Ind Co Ltd | 曝気槽の泡抑制装置及びそれを備えた生ごみ処理装置 |
-
1984
- 1984-12-11 JP JP26237984A patent/JPS61139705A/ja active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006075782A (ja) * | 2004-09-13 | 2006-03-23 | Shin Meiwa Ind Co Ltd | 曝気槽の泡抑制装置及びそれを備えた生ごみ処理装置 |
Also Published As
Publication number | Publication date |
---|---|
JPH0533322B2 (enrdf_load_stackoverflow) | 1993-05-19 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4256137B2 (ja) | デュアル・ビーム対称高さシステムおよび方法 | |
KR102802750B1 (ko) | 스캐닝 산란 계측 오버레이 측정 | |
JP2008275612A (ja) | 半導体製造用のサブストレート上の構造体を測定する高解像度を備えた装置及び測定装置におけるアパーチャの使用 | |
JPH0117523B2 (enrdf_load_stackoverflow) | ||
KR20210034001A (ko) | 검출 장치 및 검출 방법 | |
JPH10326587A (ja) | 電動スキャニングテーブル付き共焦点顕微鏡 | |
JPH0580497A (ja) | 面状態検査装置 | |
US7259869B2 (en) | System and method for performing bright field and dark field optical inspection | |
JP2000275027A (ja) | スリット共焦点顕微鏡とそれを用いた表面形状計測装置 | |
JPH11211439A (ja) | 表面形状計測装置 | |
JPS6355002B2 (enrdf_load_stackoverflow) | ||
TW200521481A (en) | Focusing system and method | |
TWI358529B (en) | Shape measuring apparatus, shape measuring method, | |
JPS61111402A (ja) | 位置検出装置 | |
JPS61139705A (ja) | 位置検出装置 | |
JPH11183326A (ja) | レンズの測定装置及び測定方法 | |
EP0019941B1 (en) | Reduction projection aligner system | |
JP2633718B2 (ja) | 形状認識装置 | |
JP2542754B2 (ja) | 集積回路の電界測定用プロ―ブ位置決め方法および位置決め装置 | |
JPS6243129A (ja) | パタ−ン測定装置 | |
JP2000509825A (ja) | 光走査デバイス | |
JPH0627027A (ja) | 異物検査装置 | |
JPH08334317A (ja) | 測定顕微鏡 | |
JP3606410B2 (ja) | 落射照明光学系における垂直照明設定装置 | |
CN119935891B (zh) | 监测系统及其监测方法、光学系统及其工作方法 |