JPS61138145A - 屈折率計および屈折率決定方法 - Google Patents
屈折率計および屈折率決定方法Info
- Publication number
- JPS61138145A JPS61138145A JP60274875A JP27487585A JPS61138145A JP S61138145 A JPS61138145 A JP S61138145A JP 60274875 A JP60274875 A JP 60274875A JP 27487585 A JP27487585 A JP 27487585A JP S61138145 A JPS61138145 A JP S61138145A
- Authority
- JP
- Japan
- Prior art keywords
- array
- signal
- refractive index
- light
- prism
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
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- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/43—Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J2001/4446—Type of detector
- G01J2001/448—Array [CCD]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/4133—Refractometers, e.g. differential
- G01N2021/414—Correcting temperature effect in refractometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/12—Circuits of general importance; Signal processing
- G01N2201/126—Microprocessor processing
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US06/678,932 US4640616A (en) | 1984-12-06 | 1984-12-06 | Automatic refractometer |
| US678932 | 1984-12-06 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS61138145A true JPS61138145A (ja) | 1986-06-25 |
Family
ID=24724926
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60274875A Pending JPS61138145A (ja) | 1984-12-06 | 1985-12-06 | 屈折率計および屈折率決定方法 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US4640616A (fr) |
| EP (1) | EP0184911A3 (fr) |
| JP (1) | JPS61138145A (fr) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004527753A (ja) * | 2001-04-26 | 2004-09-09 | レイチャート インコーポレーテッド | 携帯自動屈折計 |
| JP2009047436A (ja) * | 2007-08-13 | 2009-03-05 | Atago:Kk | 屈折計 |
| JP2011007787A (ja) * | 2009-06-26 | 2011-01-13 | Mettler-Toledo Ag | 屈折計 |
Families Citing this family (38)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE8718006U1 (fr) * | 1987-02-17 | 1992-10-22 | Franz Schmidt & Haensch Gmbh & Co, 1000 Berlin, De | |
| US5157452A (en) * | 1990-07-03 | 1992-10-20 | Mitsubishi Denki Kabushiki Kaisha | Method and apparatus for liquid content detection with refractive index and temperature signal mixing |
| DE4223840C2 (de) * | 1992-07-20 | 1994-06-16 | Zeiss Carl Jena Gmbh | Refraktometer |
| FI933830A0 (fi) * | 1993-09-01 | 1993-09-01 | Janesko Oy | Foerfarande vid refraktometermaetning |
| FI96451C (fi) * | 1993-09-07 | 1996-06-25 | Janesko Oy | Refraktometri |
| AU1524500A (en) | 1998-11-13 | 2000-06-05 | Leica Microsystems Inc. | Refractometer and method for qualitative and quantitative measurements |
| US6172746B1 (en) * | 1999-10-27 | 2001-01-09 | Leica Microsystems Inc. | Transmitted light refractometer |
| US6396576B1 (en) | 2001-02-27 | 2002-05-28 | Leica Microsystems Inc. | Method for determining shadowline location on a photosensitive array and critical angle refractometer employing the method |
| US6486944B1 (en) * | 2001-06-08 | 2002-11-26 | Leica Microsystems Inc. | Fluid-sealed refractometer having data transmission means |
| US6717663B2 (en) * | 2002-03-08 | 2004-04-06 | Reichert, Inc. | Optical configuration and method for differential refractive index measurements |
| US6734956B2 (en) | 2002-05-06 | 2004-05-11 | Reichert, Inc. | Optical configuration and method for differential refractive index measurements |
| JP2004150923A (ja) * | 2002-10-30 | 2004-05-27 | Atago:Kk | 屈折計 |
| WO2005052644A2 (fr) * | 2003-11-21 | 2005-06-09 | Perkinelmer Las, Inc. | Dispositif optique integre a une cupule |
| WO2005074550A2 (fr) * | 2004-01-30 | 2005-08-18 | 3Wave Optics, Llc | Systeme de mesure non effractive de composant sanguin |
| US7271885B2 (en) * | 2004-03-25 | 2007-09-18 | Perkinelmer Las, Inc. | Plasmon resonance measuring method and apparatus |
| US7305158B2 (en) * | 2004-04-15 | 2007-12-04 | Davidson Instruments Inc. | Interferometric signal conditioner for measurement of absolute static displacements and dynamic displacements of a Fabry-Perot interferometer |
| US7492463B2 (en) * | 2004-04-15 | 2009-02-17 | Davidson Instruments Inc. | Method and apparatus for continuous readout of Fabry-Perot fiber optic sensor |
| EP1586854A3 (fr) * | 2004-04-15 | 2006-02-08 | Davidson Instruments | Conditionneur de signal interféromètrique pour la mesure de la longueur absolue d'entrefers dans un interféromètre Fabry-Pérot à fibres optiques |
| US7864329B2 (en) * | 2004-12-21 | 2011-01-04 | Halliburton Energy Services, Inc. | Fiber optic sensor system having circulators, Bragg gratings and couplers |
| EP1681540A1 (fr) * | 2004-12-21 | 2006-07-19 | Davidson Instruments, Inc. | Processeur de réseau à canaux multiples |
| EP1869737B1 (fr) * | 2005-03-16 | 2021-05-12 | Davidson Instruments, Inc. | Capteur fabry-perot haute intensite |
| WO2007033069A2 (fr) * | 2005-09-13 | 2007-03-22 | Davidson Instruments Inc. | Algorithme de poursuite pour processeur de signal a reseau lineaire a schemas de correlation croisee de fabry-perot et son procede d'utilisation |
| US7684051B2 (en) * | 2006-04-18 | 2010-03-23 | Halliburton Energy Services, Inc. | Fiber optic seismic sensor based on MEMS cantilever |
| WO2007126475A2 (fr) * | 2006-04-26 | 2007-11-08 | Davidson Instruments, Inc. | Capteurs sismiques micro-électromécanique à fibres optiques à masse supportée par des bras articulés |
| US8115937B2 (en) * | 2006-08-16 | 2012-02-14 | Davidson Instruments | Methods and apparatus for measuring multiple Fabry-Perot gaps |
| US7787128B2 (en) * | 2007-01-24 | 2010-08-31 | Halliburton Energy Services, Inc. | Transducer for measuring environmental parameters |
| WO2008137203A1 (fr) * | 2007-05-03 | 2008-11-13 | Jorge Sanchez | Sortie d'égalisation de lumière à des extrémités opposées d'une rangée de lampes fluorescentes |
| US20100187450A1 (en) * | 2007-06-21 | 2010-07-29 | Koninklijke Philips Electronics N.V. | Microelectronic sensor device with light source and light detector |
| US20090279076A1 (en) * | 2008-05-09 | 2009-11-12 | Board Of Regents, The University Of Texas System | Self calibrated measurement of index of refraction changes to ultra-fast phenomena |
| US20090323073A1 (en) * | 2008-06-30 | 2009-12-31 | Reichert, Inc. | Analytical Instrument Having Internal Reference Channel |
| US20110168876A1 (en) * | 2010-01-14 | 2011-07-14 | Hsiung Hsiao | Optical module and system for liquid sample |
| US8605271B2 (en) * | 2011-03-25 | 2013-12-10 | Rudolph Research Analytical Inc. | Critical-angle refractometery |
| DE102012102983A1 (de) * | 2012-04-05 | 2013-10-10 | Carl Zeiss Microscopy Gmbh | Verfahren und Vorrichtung zum Bestimmen eines kritischen Winkels eines Anregungslichtstrahls |
| US9869227B2 (en) | 2015-05-26 | 2018-01-16 | Intellectual Reserves, LLC | System and method for repeatable fluid measurements |
| CN108613949B (zh) * | 2018-07-30 | 2023-11-17 | 兰州理工大学 | 基于非对称金属包覆介质波导的角度扫描折射率传感器 |
| CN112601948A (zh) * | 2018-08-31 | 2021-04-02 | 粒子监测系统有限公司 | 流体折射率优化粒子计数器 |
| CN113281302B (zh) * | 2021-05-24 | 2022-06-28 | 深圳市贵航电子有限公司 | 一种用于检测nmp液体浓度的快速测量装置及其操作方法 |
| DE102022111448A1 (de) * | 2022-05-09 | 2023-11-09 | Hydac Filter Systems Gmbh | Verfahren |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB257127A (en) * | 1925-10-30 | 1926-08-26 | Bristow John Tully | Improvements in and relating to refractometers |
| GB462332A (en) * | 1935-09-09 | 1937-03-08 | Rayner Optical Company Ltd | Improvements in refractometers |
| US3311014A (en) * | 1961-09-08 | 1967-03-28 | Honeywell Inc | Refractometer for indicating the index of refraction of a fluid stream |
| US3540808A (en) * | 1966-03-30 | 1970-11-17 | Bausch & Lomb | Apparatus for efficiently directing a beam of radiation through a test sample |
| DE1936346A1 (de) * | 1969-01-22 | 1970-07-30 | Pruefergeraetewerk Medingen Si | Vorrichtung zur Umwandlung von Brechzahlaenderungen von Gasen und Fluessigkeiten in geeignete Ausgangssignale |
| US3628867A (en) * | 1969-08-20 | 1971-12-21 | Anacon Inc | Refractometer |
| JPS5240187A (en) * | 1975-09-25 | 1977-03-28 | Hitachi Ltd | Automatic refractometer |
| DE2642891A1 (de) * | 1976-09-21 | 1978-03-23 | Schmidt & Haensch Franz | Vorrichtung zur messung des optischen brechungsindexes von fluessigen und gasfoermigen medien |
| GB2008793A (en) * | 1977-11-04 | 1979-06-06 | Anacon Instr Ltd | Refractometers |
| GB2054845B (en) * | 1979-07-26 | 1984-01-04 | Wiggins Teape Group Ltd | Measuring reflectivity |
| US4381895A (en) * | 1980-02-28 | 1983-05-03 | Biovation, Inc. | Method and apparatus for automatic flow-through digital refractometer |
| EP0071143A1 (fr) * | 1981-07-31 | 1983-02-09 | High Voltage Engineering Corporation | Réfractomètre |
| US4469441A (en) * | 1982-03-04 | 1984-09-04 | Allied Corporation | Scanning monochromator system with direct coupled dispersing element-electromagnetic drive transducer assembly |
-
1984
- 1984-12-06 US US06/678,932 patent/US4640616A/en not_active Expired - Lifetime
-
1985
- 1985-11-15 EP EP85308332A patent/EP0184911A3/fr not_active Withdrawn
- 1985-12-06 JP JP60274875A patent/JPS61138145A/ja active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004527753A (ja) * | 2001-04-26 | 2004-09-09 | レイチャート インコーポレーテッド | 携帯自動屈折計 |
| JP2009047436A (ja) * | 2007-08-13 | 2009-03-05 | Atago:Kk | 屈折計 |
| JP2011007787A (ja) * | 2009-06-26 | 2011-01-13 | Mettler-Toledo Ag | 屈折計 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP0184911A2 (fr) | 1986-06-18 |
| US4640616A (en) | 1987-02-03 |
| EP0184911A3 (fr) | 1987-07-29 |
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