FI933830A0 - Foerfarande vid refraktometermaetning - Google Patents

Foerfarande vid refraktometermaetning

Info

Publication number
FI933830A0
FI933830A0 FI933830A FI933830A FI933830A0 FI 933830 A0 FI933830 A0 FI 933830A0 FI 933830 A FI933830 A FI 933830A FI 933830 A FI933830 A FI 933830A FI 933830 A0 FI933830 A0 FI 933830A0
Authority
FI
Finland
Prior art keywords
refractory
measurement
refractory measurement
Prior art date
Application number
FI933830A
Other languages
English (en)
Inventor
Jan Kaohre
Original Assignee
Janesko Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Janesko Oy filed Critical Janesko Oy
Priority to FI933830A priority Critical patent/FI933830A0/fi
Publication of FI933830A0 publication Critical patent/FI933830A0/fi
Priority to US08/299,752 priority patent/US5617201A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/43—Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
FI933830A 1993-09-01 1993-09-01 Foerfarande vid refraktometermaetning FI933830A0 (fi)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FI933830A FI933830A0 (fi) 1993-09-01 1993-09-01 Foerfarande vid refraktometermaetning
US08/299,752 US5617201A (en) 1993-09-01 1994-09-01 Method for refractometer measuring using mathematical modelling

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI933830A FI933830A0 (fi) 1993-09-01 1993-09-01 Foerfarande vid refraktometermaetning

Publications (1)

Publication Number Publication Date
FI933830A0 true FI933830A0 (fi) 1993-09-01

Family

ID=8538511

Family Applications (1)

Application Number Title Priority Date Filing Date
FI933830A FI933830A0 (fi) 1993-09-01 1993-09-01 Foerfarande vid refraktometermaetning

Country Status (2)

Country Link
US (1) US5617201A (fi)
FI (1) FI933830A0 (fi)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6097479A (en) * 1996-10-01 2000-08-01 Texas Instruments Incorporated Critical angle sensor
US6034762A (en) * 1998-06-15 2000-03-07 Leica Microsystems Inc. Brake check handheld refractometer
WO2000029830A1 (en) * 1998-11-13 2000-05-25 Leica Microsystems, Inc. Refractometer and method for qualitative and quantitative measurements
US6172746B1 (en) * 1999-10-27 2001-01-09 Leica Microsystems Inc. Transmitted light refractometer
US6396576B1 (en) 2001-02-27 2002-05-28 Leica Microsystems Inc. Method for determining shadowline location on a photosensitive array and critical angle refractometer employing the method
US6816248B2 (en) * 2001-04-26 2004-11-09 Reichert, Inc. Hand-held automatic refractometer
US6717663B2 (en) * 2002-03-08 2004-04-06 Reichert, Inc. Optical configuration and method for differential refractive index measurements
US7317533B2 (en) * 2005-01-14 2008-01-08 Jetalon Solutions, Inc. Metal ion concentration analysis for liquids
US20060191571A1 (en) * 2005-02-11 2006-08-31 Kattler David R Fluid concentration sensing arrangement
US7319523B2 (en) * 2005-09-26 2008-01-15 Jetalon Solutions, Inc. Apparatus for a liquid chemical concentration analysis system
US7456942B1 (en) 2006-10-17 2008-11-25 Curley Michael J Dynamic refractometer
DE102007010805B3 (de) * 2007-03-02 2008-10-30 Continental Automotive Gmbh Verfahren und Vorrichtung zur Bestimmung der Harnstoffkonzerntration in einer Lösung
US20100025112A1 (en) * 2008-07-29 2010-02-04 Baker Hughes Incorporated In-situ refraction apparatus and method
US8184276B2 (en) * 2008-12-08 2012-05-22 Carl Embry Continuous index of refraction compensation method for measurements in a medium
US8602640B2 (en) * 2009-05-20 2013-12-10 Entegris—Jetalon Solutions, Inc. Sensing system and method
US8411262B2 (en) 2010-09-30 2013-04-02 Precision Energy Services, Inc. Downhole gas breakout sensor
US8542353B2 (en) 2010-09-30 2013-09-24 Precision Energy Services, Inc. Refractive index sensor for fluid analysis
US8934102B2 (en) * 2013-06-17 2015-01-13 Intellectual Reserves, LLC System and method for determining fluid parameters
CN103454247B (zh) * 2013-08-26 2016-05-25 华中科技大学 一种大量程范围的折射率测量装置及方法
FI127243B (fi) * 2014-05-13 2018-02-15 Janesko Oy Menetelmä ja mittalaite Abben luvun jatkuvaksi mittaamiseksi
CN107153049B (zh) * 2017-05-31 2019-11-12 华中科技大学 一种抑制杂散光的物质折射率测量装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5240187A (en) * 1975-09-25 1977-03-28 Hitachi Ltd Automatic refractometer
JPS6111636A (ja) * 1984-06-27 1986-01-20 Nec Corp 液体識別センサ
JPS6111637A (ja) * 1984-06-27 1986-01-20 Nec Corp 液体センサ
US4640616A (en) * 1984-12-06 1987-02-03 The Cambridge Instrument Company Plc Automatic refractometer
JPS63275936A (ja) * 1987-05-08 1988-11-14 Nippon Sheet Glass Co Ltd 屈折率分布測定方法
JPH0652238B2 (ja) * 1988-02-03 1994-07-06 株式会社フジクラ 流体屈折計およびこれを用いた流体密度計

Also Published As

Publication number Publication date
US5617201A (en) 1997-04-01

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Legal Events

Date Code Title Description
FD Application lapsed