JPS6113611B2 - - Google Patents

Info

Publication number
JPS6113611B2
JPS6113611B2 JP55082479A JP8247980A JPS6113611B2 JP S6113611 B2 JPS6113611 B2 JP S6113611B2 JP 55082479 A JP55082479 A JP 55082479A JP 8247980 A JP8247980 A JP 8247980A JP S6113611 B2 JPS6113611 B2 JP S6113611B2
Authority
JP
Japan
Prior art keywords
flip
scan
supplied
flop
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55082479A
Other languages
English (en)
Japanese (ja)
Other versions
JPS578856A (en
Inventor
Ryozo Nishina
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP8247980A priority Critical patent/JPS578856A/ja
Publication of JPS578856A publication Critical patent/JPS578856A/ja
Publication of JPS6113611B2 publication Critical patent/JPS6113611B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP8247980A 1980-06-18 1980-06-18 Information processor Granted JPS578856A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8247980A JPS578856A (en) 1980-06-18 1980-06-18 Information processor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8247980A JPS578856A (en) 1980-06-18 1980-06-18 Information processor

Publications (2)

Publication Number Publication Date
JPS578856A JPS578856A (en) 1982-01-18
JPS6113611B2 true JPS6113611B2 (enrdf_load_stackoverflow) 1986-04-14

Family

ID=13775642

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8247980A Granted JPS578856A (en) 1980-06-18 1980-06-18 Information processor

Country Status (1)

Country Link
JP (1) JPS578856A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59174954A (ja) * 1983-03-25 1984-10-03 Fujitsu Ltd スキヤン方式

Also Published As

Publication number Publication date
JPS578856A (en) 1982-01-18

Similar Documents

Publication Publication Date Title
EP0388001B1 (en) Testing method and apparatus for an integrated circuit
EP0053665A1 (en) Testing embedded arrays in large scale integrated circuits
US4300234A (en) Address pattern generator for testing a memory
KR980010789A (ko) 구성 메모리 집적 회로
JPS61223675A (ja) デジタル集積回路
US4586181A (en) Test pattern generating apparatus
US4326290A (en) Means and methods for monitoring the storage states of a memory and other storage devices in a digital data processor
EP0048810A2 (en) Recirculating loop memory array with a shift register buffer
JPH04301290A (ja) 先入れ先出しメモリ回路
JPH04215316A (ja) 逐次有限状態マシン回路とそのような回路を具える集積回路
JPH0119182B2 (enrdf_load_stackoverflow)
JPS6113611B2 (enrdf_load_stackoverflow)
KR100276504B1 (ko) 오류 데이터 저장 시스템
JP2820462B2 (ja) データ列発生装置
JPH05134007A (ja) 半導体集積論理回路
JPS5939053B2 (ja) 記憶要素指定方式
JPS6144342B2 (enrdf_load_stackoverflow)
JPS5947394B2 (ja) 可変長二次元シストレジスタ
JP2877505B2 (ja) Ｌｓｉ実装ボード及びデータ処理装置
JP2848619B2 (ja) テスト容易化回路
JP3254781B2 (ja) 半導体装置
JP2738112B2 (ja) 情報処理装置の障害情報採取方式
JP3057728B2 (ja) 半導体記憶装置
JP2751382B2 (ja) シフトパス制御システム
JPS59110097A (ja) スキヤンパス制御装置