JPS61135460U - - Google Patents
Info
- Publication number
- JPS61135460U JPS61135460U JP1923785U JP1923785U JPS61135460U JP S61135460 U JPS61135460 U JP S61135460U JP 1923785 U JP1923785 U JP 1923785U JP 1923785 U JP1923785 U JP 1923785U JP S61135460 U JPS61135460 U JP S61135460U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- irradiating
- particle beam
- positions
- analyzer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000001678 irradiating effect Effects 0.000 claims 3
- 239000002245 particle Substances 0.000 claims 2
- 238000010884 ion-beam technique Methods 0.000 claims 1
- 238000004544 sputter deposition Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1985019237U JPH0314775Y2 (no) | 1985-02-14 | 1985-02-14 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1985019237U JPH0314775Y2 (no) | 1985-02-14 | 1985-02-14 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61135460U true JPS61135460U (no) | 1986-08-23 |
JPH0314775Y2 JPH0314775Y2 (no) | 1991-04-02 |
Family
ID=30508626
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1985019237U Expired JPH0314775Y2 (no) | 1985-02-14 | 1985-02-14 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0314775Y2 (no) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6312153U (no) * | 1986-07-08 | 1988-01-26 | ||
JPS6420434A (en) * | 1987-07-15 | 1989-01-24 | Shimadzu Corp | Ion etching device |
JP2009204511A (ja) * | 2008-02-28 | 2009-09-10 | Yazaki Corp | シール検査方法、及びシール検査装置 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5327484A (en) * | 1976-08-27 | 1978-03-14 | Hitachi Ltd | Ion microanalyzer |
JPS55130053A (en) * | 1979-03-30 | 1980-10-08 | Jeol Ltd | Sampler in scanning electron microscope |
-
1985
- 1985-02-14 JP JP1985019237U patent/JPH0314775Y2/ja not_active Expired
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5327484A (en) * | 1976-08-27 | 1978-03-14 | Hitachi Ltd | Ion microanalyzer |
JPS55130053A (en) * | 1979-03-30 | 1980-10-08 | Jeol Ltd | Sampler in scanning electron microscope |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6312153U (no) * | 1986-07-08 | 1988-01-26 | ||
JPS6420434A (en) * | 1987-07-15 | 1989-01-24 | Shimadzu Corp | Ion etching device |
JP2009204511A (ja) * | 2008-02-28 | 2009-09-10 | Yazaki Corp | シール検査方法、及びシール検査装置 |
Also Published As
Publication number | Publication date |
---|---|
JPH0314775Y2 (no) | 1991-04-02 |
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