JPS5327484A - Ion microanalyzer - Google Patents

Ion microanalyzer

Info

Publication number
JPS5327484A
JPS5327484A JP10159276A JP10159276A JPS5327484A JP S5327484 A JPS5327484 A JP S5327484A JP 10159276 A JP10159276 A JP 10159276A JP 10159276 A JP10159276 A JP 10159276A JP S5327484 A JPS5327484 A JP S5327484A
Authority
JP
Japan
Prior art keywords
ion microanalyzer
microanalyzer
ion
providing
air
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10159276A
Other languages
Japanese (ja)
Inventor
Hiroshi Hirose
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP10159276A priority Critical patent/JPS5327484A/en
Publication of JPS5327484A publication Critical patent/JPS5327484A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE:To carry out analysis in the depth direction in a short time by providing an air-tight chamber and removing surface layer of a material.
JP10159276A 1976-08-27 1976-08-27 Ion microanalyzer Pending JPS5327484A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10159276A JPS5327484A (en) 1976-08-27 1976-08-27 Ion microanalyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10159276A JPS5327484A (en) 1976-08-27 1976-08-27 Ion microanalyzer

Publications (1)

Publication Number Publication Date
JPS5327484A true JPS5327484A (en) 1978-03-14

Family

ID=14304644

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10159276A Pending JPS5327484A (en) 1976-08-27 1976-08-27 Ion microanalyzer

Country Status (1)

Country Link
JP (1) JPS5327484A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61135460U (en) * 1985-02-14 1986-08-23
JPS63128661U (en) * 1987-02-16 1988-08-23

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61135460U (en) * 1985-02-14 1986-08-23
JPH0314775Y2 (en) * 1985-02-14 1991-04-02
JPS63128661U (en) * 1987-02-16 1988-08-23

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