JPS61104629A - 半導体装置 - Google Patents

半導体装置

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Publication number
JPS61104629A
JPS61104629A JP22704784A JP22704784A JPS61104629A JP S61104629 A JPS61104629 A JP S61104629A JP 22704784 A JP22704784 A JP 22704784A JP 22704784 A JP22704784 A JP 22704784A JP S61104629 A JPS61104629 A JP S61104629A
Authority
JP
Japan
Prior art keywords
stage
paste
chip
leads
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP22704784A
Other languages
English (en)
Inventor
Tadanobu Terui
照井 忠信
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP22704784A priority Critical patent/JPS61104629A/ja
Publication of JPS61104629A publication Critical patent/JPS61104629A/ja
Pending legal-status Critical Current

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L24/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L24/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
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    • H01L24/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L24/28Structure, shape, material or disposition of the layer connectors prior to the connecting process
    • H01L24/29Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
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    • H01L24/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
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    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/2612Auxiliary members for layer connectors, e.g. spacers
    • H01L2224/26152Auxiliary members for layer connectors, e.g. spacers being formed on an item to be connected not being a semiconductor or solid-state body
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    • H01L2224/27011Involving a permanent auxiliary member, i.e. a member which is left at least partly in the finished device, e.g. coating, dummy feature
    • H01L2224/27013Involving a permanent auxiliary member, i.e. a member which is left at least partly in the finished device, e.g. coating, dummy feature for holding or confining the layer connector, e.g. solder flow barrier
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    • H01L2224/29001Core members of the layer connector
    • H01L2224/29099Material
    • H01L2224/29198Material with a principal constituent of the material being a combination of two or more materials in the form of a matrix with a filler, i.e. being a hybrid material, e.g. segmented structures, foams
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    • H01L2224/29299Base material
    • H01L2224/293Base material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
    • H01L2224/29338Base material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
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    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
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    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
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    • H01L2224/42Wire connectors; Manufacturing methods related thereto
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    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
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    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
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    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
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    • H01L2224/83009Pre-treatment of the layer connector or the bonding area
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    • H01L2224/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • H01L2224/838Bonding techniques
    • H01L2224/8385Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester
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    • H01L2924/151Die mounting substrate
    • H01L2924/15165Monolayer substrate

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は半導体装置、詳しくは基板上に印刷されたステ
ージに半導体チップをダイス付けしてなる装置における
改良に関する。
第3図の部分的な断面図に示されるモジュールは、チッ
プ・オン・ボード方式の構造の一例である。同図におい
て、21は基板、22と23は基板21に印刷されたイ
ンナーリード(以下単にリードという)とステージ、2
4は半導体チップ(以下単にチツブという)、25はチ
ップ24の電極とり−ド22とを接続するワイヤ、26
はチップ24をダイス付けするtM、(Ag)ペースト
、27はチップ24を封止する樹脂を示す。厚さに割附
の有る分野に利用価値が大きく、例えば、キャッシュカ
ード、ガソリンスタンドなどで用いられている磁気カー
ドに代るべきものとして、ICカード等が注目されてい
る。
C発明が解決しようとする問題点〕 前記したチップ24をステージにダイス付けするには、
Agペーストをステージ23上に塗布し、チップ24を
その上にのせてスクラブ(こすり付け)または、押し付
けてペーストを拡げる。
かかるスクラブまたは押し付けによってAgペーストを
拡げようとすると、軸ペーストが第3図に示される如く
ステージからはみ出ることがある。
ここでステージからはみ出るAgペーストの量が多し)
と、へgペーストがリード22に達することがあり、絶
縁性保持の観点から問題がある。
また、厚さに制限の有るモジュールは、各部が薄くまた
は低く形成される。そこで、ワイヤ25を低く張ろうと
すると、ワイヤの垂れ下がりが発生ずるおそれがあり、
そうなるとAgペースト26が僅かばかりはみ出たとき
でもワイヤとAgペーストが接触し短絡を生ずる問題が
ある。ワイヤに代る接続手段について研究はなされてい
るが、現在のところ可撓性(flexibility 
)の点でワイヤボンディング法が有望と見られるため、
前記した問題の解決が要望されている。またチップの厚
さも通常の厚さよりも薄くなっているためダイス(−1
時のAgペーストのはい」二かりも問題となっている。
〔問題点を解決するための手段〕
本発明は、」二記問題点を解消したAgペース1−を用
いる半導体チップのダイス付けのときのAgペース1〜
のはみ出しおよびはい上がりに対する対策を講した半導
体装置を提供するもので、その手段は、基板上に半導体
チップ搭載用ステージと、該ステージのまわりに配設さ
れたリードを有し、前記ステージに半導体チップが接着
され、前記ステージと前記リードの間の前記基板」二に
前記ステージから所定の間隔をおいて枠状パターンが設
けられてなることを特徴とする半導体装置によってなさ
れる。
〔作用〕
上記装置においては、ステージのまわりに枠状にパター
ンが形成されているので、Agペーストがステージから
はみ出したとしても、枠状パターンによってそれがリー
ドに到達することが防止され、また多量のAgペースト
がはみ出したときでも、それはステージと枠状パターン
の間の隙間に流出するため、Agペーストのチップへの
はい上がりも防止され、ワイヤとの接触も回避されるも
のである。
〔実施例〕
以下、図面を参照して本発明の実施例を詳細に説明する
第1図と第2図に、本発明実施例が平面図と断面図で示
され、これらの図において、1】は基板(例えばエポキ
シ樹脂製のもの)、12と13は導電性材料をプリント
して作ったリードとステージ、14は半導体チップ(半
導体チップは第2図にのみ示される)、15は半導体チ
ップ(以下単にチップという)の電極とり一ド12とを
接続するワイヤ(ワイヤ15も第2図にのみ示される)
、をそれぞれ示す。
図示の実施例においては、ステージ13から所定の距離
をおいて、ステージを囲む所定の幅の枠状パターン16
を形成する。枠状パターン16は、ステージ、リードを
印刷する(パターニングする)ときに同時に印刷するこ
とによって形成する。そして、枠状パターンの幅および
枠状パターンとステージとの間の間隔は、通常、ステー
ジ、リードなどの厚さおよびチップサイズを考慮して適
宜設定する。そして、第2図に示されるように、ステー
ジ寸法を第3図に示される従来例よりも小に、すなわち
チップの寸法とほぼ同し大きさに設定することによって
、枠状パターンを設けることが半導体装置の小型化に悪
影響を及ぼすことのないよう゛にする。
ダイス付けのときAgペースト17が第2図に示される
如くステージ13からはみ出したとしても、それは枠状
パターン16によって阻止されてリード12に達するこ
とがない。そして、はみ出したAgペーストは、チップ
にはい上がることなく枠状パターン16とステージ13
との間の溝に流出することもあって、ワイヤ15とAg
ペースト17との短絡が防止される。
チップのダイス付けの後には、従来技術の場合と同様に
樹脂18をポツティングして封止する。
〔発明の効果〕
以上説明したように本発明によれば、印刷によってステ
ージとリードとが印刷され、ステージにチップがダイス
付けされたチップ・オン・ボード方式の半導体装置にお
いて、ステージなどの印刷のとき同時にステージのまわ
りに枠状パターンを形成し、このパターンとステージと
の間に溝を形成することによって、チップのダイス付け
のときのAgペーストのはみ出しが前記溝内に流出する
ので、半導体装置における絶縁性が十分保たれ、またA
gペーストとチップの電極とリード間の接続用ワイヤと
の短絡が防止され、しかも、かかる枠状パターンは容易
に、かつ、半導体装置の小型化を妨げることなく形成可
能である。
【図面の簡単な説明】
第1図と第2図は本発明実施例の平面図と断面図、第3
図は従来例の断面図である。 図中、11は基板、12はリード、13はステージ、1
4は半導体チップ、15はワイヤ、16は枠状パターン
、17はAgペースト、18は樹脂、をそれぞれ示す。 第1図 第2図 第3図

Claims (1)

    【特許請求の範囲】
  1.  基板上に半導体チップ搭載用ステージと、該ステージ
    のまわりに配設されたリードを有し、前記ステージに半
    導体チップが接着され、前記ステージと前記リードの間
    の前記基板上に前記ステージから所定の間隔をおいて枠
    状パターンが設けられてなることを特徴とする半導体装
    置。
JP22704784A 1984-10-29 1984-10-29 半導体装置 Pending JPS61104629A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22704784A JPS61104629A (ja) 1984-10-29 1984-10-29 半導体装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22704784A JPS61104629A (ja) 1984-10-29 1984-10-29 半導体装置

Publications (1)

Publication Number Publication Date
JPS61104629A true JPS61104629A (ja) 1986-05-22

Family

ID=16854693

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22704784A Pending JPS61104629A (ja) 1984-10-29 1984-10-29 半導体装置

Country Status (1)

Country Link
JP (1) JPS61104629A (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH027534A (ja) * 1988-06-27 1990-01-11 Fujitsu Ltd 半導体装置
EP1249870A3 (en) * 2001-04-11 2005-03-30 Sharp Kabushiki Kaisha Semiconductor device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH027534A (ja) * 1988-06-27 1990-01-11 Fujitsu Ltd 半導体装置
JP2530002B2 (ja) * 1988-06-27 1996-09-04 富士通株式会社 半導体装置
EP1249870A3 (en) * 2001-04-11 2005-03-30 Sharp Kabushiki Kaisha Semiconductor device

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