JPS6035543A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS6035543A
JPS6035543A JP58143693A JP14369383A JPS6035543A JP S6035543 A JPS6035543 A JP S6035543A JP 58143693 A JP58143693 A JP 58143693A JP 14369383 A JP14369383 A JP 14369383A JP S6035543 A JPS6035543 A JP S6035543A
Authority
JP
Japan
Prior art keywords
layer
substrate
glass epoxy
recess
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP58143693A
Other languages
Japanese (ja)
Inventor
Yutaka Oota
豊 太田
Harufumi Kobayashi
小林 治文
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oki Electric Industry Co Ltd
Original Assignee
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Industry Co Ltd filed Critical Oki Electric Industry Co Ltd
Priority to JP58143693A priority Critical patent/JPS6035543A/en
Publication of JPS6035543A publication Critical patent/JPS6035543A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/52Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/538Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates
    • H01L23/5384Conductive vias through the substrate with or without pins, e.g. buried coaxial conductors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/12Mountings, e.g. non-detachable insulating substrates
    • H01L23/14Mountings, e.g. non-detachable insulating substrates characterised by the material or its electrical properties
    • H01L23/145Organic substrates, e.g. plastic
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01078Platinum [Pt]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/12Passive devices, e.g. 2 terminal devices
    • H01L2924/1204Optical Diode
    • H01L2924/12044OLED
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/1515Shape
    • H01L2924/15153Shape the die mounting substrate comprising a recess for hosting the device
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/15165Monolayer substrate

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Die Bonding (AREA)

Abstract

PURPOSE:To enable the electrical connection of a back surface of the element with a metallic conductor layer by a method wherein after the metallic conductor layer on a surface of an organic insulating film substrate in an element mounting region is removed, said organic insulating film of substrate in this region is removed to the metallic conductor on the back surface so as to form a recess and the element is mounted in this recess. CONSTITUTION:A glass epoxy substrate whose both surfaces are covered with Cu is prepared and a through hole 13 is opened on the desired position of said substrate. After that, the overall plating is performed by electroless plating thereby coating the inner wall of the through hole 13 with a Cu layer 12. Next, the desired Cu pattern 12'' is formed by photolithography and etching techniques on the both surfaces of the glass epoxy substrate. The Cu layer on a front surface is removed whereas the Cu layer on a back surface is left. Next, the glass epoxy of substrate in a dice mounting region is removed to the thin Cu layer on the back surface so as to form a recess 14. Next, the surface of the Cu pattern 12'' is coated with an Ni-Au plating layer to form a conductor pattern 15, after which a dice 16 is mounted in the recess 14 and electrodes are connected to the conductor pattern 15 by a wire 17.

Description

【発明の詳細な説明】 (技術分野) この発明は半導体装置の製造方法に関し、詳しくは、セ
ラミック基板に代って取シ扱いが容易で安価な有機絶縁
膜系のプリント基板タイプの特殊バックーソの製造方法
に関するものである。
[Detailed Description of the Invention] (Technical Field) The present invention relates to a method for manufacturing a semiconductor device, and more particularly, a special backplane of a printed circuit board type using an organic insulating film, which is easy to handle and inexpensive, in place of a ceramic substrate. This relates to a manufacturing method.

(従来技術) 有機絶縁膜系、たとえばガラスエポキシ系のプリント基
板タイプの特殊パッケージは、既に電子ウォッチ用のL
SIバックーソとして大量に使用されている。電子ウォ
ッチ用のLSIバックーノとしては、当初は、3〜5層
のセラミック基板が用いられていたが、LSIの実装密
度の上昇に伴ない基板上の配線パターンが簡略化され、
両面配線基板が主体となってきたため、取り扱いが容易
で安価なガラスエポキシ系のプリント基板タイプの使用
が可能となった。
(Prior art) Special printed circuit board type packages based on organic insulating films, such as glass epoxy, have already been used in L for electronic watches.
It is widely used as an SI backso. Initially, three to five layer ceramic substrates were used for LSI backnos for electronic watches, but as the packaging density of LSIs increased, the wiring pattern on the substrate became simpler.
Since double-sided wiring boards have become the main type, it has become possible to use glass epoxy printed circuit boards, which are easy to handle and inexpensive.

従来のガラスエポキシ系プリント基板タイプの両面配線
パッケージの製造方法を第1図に示す。
FIG. 1 shows a conventional method for manufacturing a glass epoxy printed circuit board type double-sided wiring package.

第1図(a)において、1は厚み約1朋程度のガラスエ
ポキシ基板、2はその両面に形成された厚み約35〜7
0μ程度の薄膜Cu層である。このように、初めに、両
面CLI張シのガラスエポキシ基板を準備する。
In FIG. 1(a), 1 is a glass epoxy substrate with a thickness of about 1 mm, and 2 is a glass epoxy substrate with a thickness of about 35 to 7 mm formed on both sides.
It is a thin Cu layer of about 0μ. In this way, first, a double-sided CLI-covered glass epoxy substrate is prepared.

次に、そのガラスエポキシ基板の所望の位置に第1図(
b)に示すようにスルーホール3をあける。
Next, place the glass epoxy board at the desired position (see Figure 1).
Drill through hole 3 as shown in b).

そして、その後、無電界メッキにて全ωiCuメッキす
ることによシ、第1図(e)に示すようにスルーホール
3の内壁にもCu層2′を被着させる。
Thereafter, by electroless plating with ωiCu, a Cu layer 2' is also deposited on the inner wall of the through hole 3, as shown in FIG. 1(e).

次に、写真食刻技術とエツチング技術にて第1図(d)
に示すように所望のCuパターン21/をガラスエポキ
シ基板1の両面に形成する。
Next, Figure 1(d) was created using photoengraving technology and etching technology.
A desired Cu pattern 21/ is formed on both sides of the glass epoxy substrate 1 as shown in FIG.

その後+ Cuパターン2〃の表面にNi −Auメッ
キ層を被着させることVζよシ導体パターンの形成を完
了する。この形成の完了した導体パターンを第1図(e
)に符号4を付して示す。
Thereafter, a Ni--Au plating layer is deposited on the surface of the +Cu pattern 2, thereby completing the formation of the conductor pattern Vζ. The completed conductor pattern is shown in Figure 1 (e
) is shown with the reference numeral 4.

次に、ダイス塔載領域のガラスエポキシ基板1を約50
0μm程度の深さに凹状にざぐって、第1図(f)に示
すように四部5を形成する。
Next, about 50% of the glass epoxy substrate 1 in the die mounting area is
A concave counterbore is formed to a depth of approximately 0 μm to form four portions 5 as shown in FIG. 1(f).

そして、この四部5には第1図(g)に示すようにダイ
ス6を接着し、ダイス6は各電極をワイヤ7にて導体パ
ターン4に接続する。
Then, a die 6 is adhered to the four parts 5 as shown in FIG. 1(g), and each electrode of the die 6 is connected to the conductive pattern 4 by a wire 7.

このような従来の製造方法では、凹部5の底面はガラス
エポキシ材が露出している。したがって、ダイス6裏面
と導体パターン4との電気的接続は不可能であった。
In such a conventional manufacturing method, the glass epoxy material is exposed at the bottom of the recess 5. Therefore, electrical connection between the back surface of the dice 6 and the conductor pattern 4 was impossible.

(発明の目的) この発明は上躬の点に鑑みなされたもので、半導体素子
(ダイス)裏面と金属導体層(導体パターン)との電気
的接続を可能とする半導体装置の製造方法を提供するこ
とを目的とする。
(Object of the Invention) The present invention has been made in view of the above points, and provides a method for manufacturing a semiconductor device that enables electrical connection between the back surface of a semiconductor element (dice) and a metal conductor layer (conductor pattern). The purpose is to

(実施例) 以下この発明の一実施例を第2図を参照して説明する。(Example) An embodiment of the present invention will be described below with reference to FIG.

第2図(a)において、11は厚み約0.5朋程度のガ
ラスエポキシ基板(有機絶縁膜基板)、121はその表
面に形成された厚み約35〜70μ程度の薄膜Cu層(
金)・4導体層)、122はガラスエポキシ基板11の
裏面に形成された厚み70〜140μ程度の、つまシ前
記Cu層121の厚みよυ約2倍径度の厚みを有する薄
膜Cu層(金属導体層)である。
In FIG. 2(a), 11 is a glass epoxy substrate (organic insulating film substrate) with a thickness of about 0.5 mm, and 121 is a thin Cu layer (about 35 to 70 μm thick) formed on its surface.
122 is a thin film Cu layer formed on the back surface of the glass epoxy substrate 11 and having a thickness of about 70 to 140 μm and about twice the diameter of the Cu layer 121. metal conductor layer).

このように、初めに、両面Cu張りガラスエポキシ基板
を準備する。
In this way, first, a double-sided Cu-clad glass epoxy substrate is prepared.

次に、そのガラスエポキシ基板の所望の位置に第2図(
b)に示すようにスルーホール13をめける。
Next, place the glass epoxy board at the desired position (see Figure 2).
Flip through hole 13 as shown in b).

そして、その後、無電界メッキにて全面Cuメッキする
ことにより、第2図(c)に示すようにスルーホール1
3の内壁にもCu層12′を被着させる。
Then, by electroless plating the entire surface with Cu, the through holes 1 are formed as shown in FIG. 2(c).
A Cu layer 12' is also deposited on the inner wall of No.3.

次に、写真食刻技術とエツチング技術にて第2図(d)
に示すように所望のCuパターン12〃をガラスエポキ
シ基板11の両面に形成する。ここで、ダイス塔載領域
(半導体素子塔載領域)においては。
Next, Figure 2(d) was created using photoengraving technology and etching technology.
As shown in FIG. 2, desired Cu patterns 12 are formed on both sides of the glass epoxy substrate 11. Here, in the die mounting area (semiconductor element mounting area).

ガラスエポキシ基板11表面のCu層を除去する一方、
ガラスエポキシ基板11の裏面のCu層は残す。
While removing the Cu layer on the surface of the glass epoxy substrate 11,
The Cu layer on the back surface of the glass epoxy substrate 11 is left.

次に、ダイス塔載領域の基板ガラスエポキシを、裏面の
薄膜Cu層に到達するまで凹状にざぐって、第2図(e
)に示すように凹部14を形成する。このようにして四
部14を形成すると、その底部においては全面にCu層
(Cuパターン12″の一部)が露出する。
Next, the substrate glass epoxy in the die mounting area is hollowed out in a concave shape until it reaches the thin Cu layer on the back side, as shown in Figure 2 (e).
) A recess 14 is formed as shown in FIG. When the four parts 14 are formed in this way, the Cu layer (part of the Cu pattern 12'') is exposed on the entire surface at the bottom.

次に、この露出面を含むCuパターン12・′の表面に
Ni −Auメッキ層を被着させることによシ導体パタ
ーンの形成を完了する。この形成の完了した導体パター
ンを第2図(f)に符号15を付して示す。
Next, the formation of the conductor pattern is completed by depositing a Ni--Au plating layer on the surface of the Cu pattern 12.' including this exposed surface. The completed conductor pattern is shown in FIG. 2(f) with reference numeral 15.

最後に、ダイス塔載領域の前記四部14内に第2図ω)
に示すようにダイス16を塔載し、ダイス16は各電極
をワイヤ17にて導体パターン15に接続する。なお、
ダイス16の塔載は、ダイス16の裏面を、凹部14底
部の導体層(導体パターン15の一部)に導電性ペース
トまたは導電性接続剤にて取着することによシ行われる
Finally, in the four parts 14 of the die mounting area (see Fig. 2ω)
As shown in FIG. 1, a die 16 is mounted on the substrate, and each electrode of the die 16 is connected to the conductor pattern 15 by a wire 17. In addition,
Mounting of the dice 16 is carried out by attaching the back surface of the dice 16 to the conductor layer (part of the conductor pattern 15) at the bottom of the recess 14 using a conductive paste or a conductive connecting agent.

(発明の効果) 以上の一実施例から明らかなように、この発明の方法で
は、半導体素子塔載領域における有機絶縁膜基板表面の
金属導体層を除去した後、同領域における基板有機絶縁
膜を、裏面の金属導体層に到達するまで座ぐp除去して
凹部を形成する。したがって、四部の底部には金属導体
層が露出するようになシ、凹部内に半導体素子を塔載す
れば、その裏面を金JUi導体層(導体パターン)に電
気的に接続することが可能となる。
(Effects of the Invention) As is clear from the above embodiment, in the method of the present invention, after removing the metal conductor layer on the surface of the organic insulating film substrate in the semiconductor element mounting area, the organic insulating film in the same area is removed. , a concave portion is formed by removing the surface layer until it reaches the metal conductor layer on the back surface. Therefore, if the metal conductor layer is exposed at the bottom of the four parts and the semiconductor element is mounted in the recess, the back side of the semiconductor element can be electrically connected to the gold JUi conductor layer (conductor pattern). Become.

(他の例) なお、上記一実施例では、有機絶縁膜基板としてガラス
エポキシ基板を用いたが、ガラスエポキシ基板の代りに
ビスマレイミドトリアソン佃脂基板などを用いることも
できる。
(Other Examples) In the above embodiment, a glass epoxy substrate was used as the organic insulating film substrate, but a bismaleimide triazone tsukuba substrate or the like may be used instead of the glass epoxy substrate.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来のガラスエポキシ系プリント基板タイプの
両面配線パッケージの製造方法を示す断面図、第2図は
この発明の半導体装置の製造方法の一実施例を示す断面
図でおる、。 11・・・ガラスエポキシ基板、12..122・・・
薄膜Cu層、12//・・・Cuパターン、14・・・
凹部、15・・・導体パターン、16・・・ダイス。 特許出願人 沖電気工業株式会社 第1図 第2図
FIG. 1 is a sectional view showing a conventional method for manufacturing a double-sided wiring package of the glass epoxy type printed circuit board type, and FIG. 2 is a sectional view showing an embodiment of the method for manufacturing a semiconductor device of the present invention. 11...Glass epoxy substrate, 12. .. 122...
Thin film Cu layer, 12//...Cu pattern, 14...
Recessed portion, 15...conductor pattern, 16...dice. Patent applicant: Oki Electric Industry Co., Ltd. Figure 1 Figure 2

Claims (1)

【特許請求の範囲】[Claims] 表面と裏面に金属導体層が形成された有機絶縁膜基板を
準備する工程と、半導体素子塔載領域における前記表面
金属導体層を除去した後、同領域における基板有機絶縁
膜を、裏面の金属導体層に到達する壕で座ぐシ除去して
凹部を形成する工程と、この凹部内に半導体素子を塔載
する工程とを具備してなる半導体装置の製造方法。
A process of preparing an organic insulating film substrate with a metal conductor layer formed on the front and back surfaces, and after removing the surface metal conductor layer in the semiconductor element mounting area, the substrate organic insulating film in the same area is replaced with a metal conductor layer on the back side. A method for manufacturing a semiconductor device, comprising the steps of forming a recess by removing a trench that reaches a layer, and mounting a semiconductor element in the recess.
JP58143693A 1983-08-08 1983-08-08 Manufacture of semiconductor device Pending JPS6035543A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58143693A JPS6035543A (en) 1983-08-08 1983-08-08 Manufacture of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58143693A JPS6035543A (en) 1983-08-08 1983-08-08 Manufacture of semiconductor device

Publications (1)

Publication Number Publication Date
JPS6035543A true JPS6035543A (en) 1985-02-23

Family

ID=15344761

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58143693A Pending JPS6035543A (en) 1983-08-08 1983-08-08 Manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS6035543A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6215881A (en) * 1985-07-12 1987-01-24 松下電工株式会社 Chip carrier for electronic element
JPS6355944A (en) * 1986-08-26 1988-03-10 Matsushita Electric Works Ltd Manufacture of chip carrier
JPS6355943A (en) * 1986-08-26 1988-03-10 Matsushita Electric Works Ltd Chip carrier
WO1996025763A3 (en) * 1995-02-15 1996-11-07 Ibm Organic chip carriers for wire bond-type chips
WO2004059028A1 (en) * 2002-12-24 2004-07-15 Pung Kuk Edm Wire Manufacturing Co., Ltd Method of manufacturing zinc-coated electrode wire for electric discharge processors using hot dip galvanizing process

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6215881A (en) * 1985-07-12 1987-01-24 松下電工株式会社 Chip carrier for electronic element
JPS6355944A (en) * 1986-08-26 1988-03-10 Matsushita Electric Works Ltd Manufacture of chip carrier
JPS6355943A (en) * 1986-08-26 1988-03-10 Matsushita Electric Works Ltd Chip carrier
WO1996025763A3 (en) * 1995-02-15 1996-11-07 Ibm Organic chip carriers for wire bond-type chips
WO2004059028A1 (en) * 2002-12-24 2004-07-15 Pung Kuk Edm Wire Manufacturing Co., Ltd Method of manufacturing zinc-coated electrode wire for electric discharge processors using hot dip galvanizing process

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