JPS60216279A - 検査装置 - Google Patents

検査装置

Info

Publication number
JPS60216279A
JPS60216279A JP60030352A JP3035285A JPS60216279A JP S60216279 A JPS60216279 A JP S60216279A JP 60030352 A JP60030352 A JP 60030352A JP 3035285 A JP3035285 A JP 3035285A JP S60216279 A JPS60216279 A JP S60216279A
Authority
JP
Japan
Prior art keywords
circuits
output
inputted
inspected
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60030352A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0224472B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
Sadao Nakamura
仲村　定男
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP60030352A priority Critical patent/JPS60216279A/ja
Publication of JPS60216279A publication Critical patent/JPS60216279A/ja
Publication of JPH0224472B2 publication Critical patent/JPH0224472B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)
JP60030352A 1985-02-20 1985-02-20 検査装置 Granted JPS60216279A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60030352A JPS60216279A (ja) 1985-02-20 1985-02-20 検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60030352A JPS60216279A (ja) 1985-02-20 1985-02-20 検査装置

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP7675379A Division JPS562045A (en) 1979-06-20 1979-06-20 Inspection unit for random logic circuit

Publications (2)

Publication Number Publication Date
JPS60216279A true JPS60216279A (ja) 1985-10-29
JPH0224472B2 JPH0224472B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1990-05-29

Family

ID=12301456

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60030352A Granted JPS60216279A (ja) 1985-02-20 1985-02-20 検査装置

Country Status (1)

Country Link
JP (1) JPS60216279A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Also Published As

Publication number Publication date
JPH0224472B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1990-05-29

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