JPS60197367A - Preparation of mirror-surface wafer - Google Patents
Preparation of mirror-surface waferInfo
- Publication number
- JPS60197367A JPS60197367A JP59053040A JP5304084A JPS60197367A JP S60197367 A JPS60197367 A JP S60197367A JP 59053040 A JP59053040 A JP 59053040A JP 5304084 A JP5304084 A JP 5304084A JP S60197367 A JPS60197367 A JP S60197367A
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- mirror
- clockwise
- polishing
- revolution
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は両面ボリシング装置による鏡面ウェハの製造方
法の改良に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an improvement in a method for manufacturing mirror-finished wafers using a double-sided boring machine.
従来、シリコン等のウェハの鏡面ボリシングは通常片面
ポリシング装置により行なわれている。Conventionally, mirror polishing of wafers such as silicon is usually performed using a single-sided polishing machine.
これは、第1図に示す如く、貼付用のプレートlにウェ
ハ2をワックスあるいは貼付用の吸着パッドを用いて貼
付け、これを加圧ヘッド3に装着し、回転しているポリ
ラングテーブル4表面の研磨布5によって片面ポリシン
グするものである。As shown in Fig. 1, the wafer 2 is pasted on a pasting plate l using wax or a suction pad for pasting, and this is attached to the pressure head 3, and the surface of the rotating polylang table 4 is Polishing is performed on one side using a polishing cloth 5.
しかし、この方法では加圧ヘッド3の貼付用プレート1
との接触面における加圧状態、貼付用プレートlの平坦
度、ウェハ2の貼付精度あるいはポリシングテーブル4
の平坦度及びその温度変形などがポリシングしたウェハ
の鏡面精度に影響し、ウェハを高精度に加工することが
困難である。また、これらを技術的に改善できたとして
も、ウェハの鏡面精度には限界があり、特にウェハの大
口径化に対応することができない。However, in this method, the attachment plate 1 of the pressure head 3
The pressure condition on the contact surface with the wafer 2, the flatness of the pasting plate 1, the pasting accuracy of the wafer 2, or the polishing table 4.
The flatness of the wafer and its temperature deformation affect the mirror surface precision of the polished wafer, making it difficult to process the wafer with high precision. Further, even if these could be improved technically, there is a limit to the mirror surface accuracy of the wafer, and it is not possible to cope with the increase in the diameter of the wafer.
一方、高精度加工装置として両面ポリシング装置が注目
されてきている。これは下定盤と上定盤との間で太陽ギ
アとインターナルギアとに噛合して回転するキャリアに
ウェハを保持させて挟み、ウェハ両面を同時にボリシン
グするものである。On the other hand, double-sided polishing devices are attracting attention as high-precision processing devices. In this method, a wafer is held and sandwiched between a lower surface plate and an upper surface plate by a rotating carrier that meshes with a sun gear and an internal gear, and both sides of the wafer are simultaneously bored.
しかし、この方法で製造された両面ミラーウェハは、デ
バイス製造工程における熱処理時にウェハ同志が接着す
るという問題があり、ユーザー側のニーズにマツチした
ものではなく、例外的なものを除いては商品としての価
値はなかった。However, double-sided mirror wafers manufactured using this method have the problem that the wafers adhere to each other during heat treatment in the device manufacturing process, and they do not meet the needs of users, and with the exception of exceptional cases, they are not commercially available. It wasn't worth it.
本発明は上記事情に鑑みてなされたものであり、大口径
で、かつ高精度の片面鏡面ウェノ\を製造し得る方法を
提供しようとするものである。The present invention has been made in view of the above circumstances, and it is an object of the present invention to provide a method for producing a single-sided mirror-finished weno sheet with a large diameter and high precision.
すなわち本発明の鏡面ウェハの製造方法は、互いに逆方
向に回転する下定盤と上定盤との間にウェハを挟んでボ
リシングすることにより鏡面ウェハを製造するにあたり
、前記ウェハの一面と他面とのポリシング速度に差を与
え、−面を鏡面に、他面を半光沢面にすることを特徴と
するものである。That is, in the method for manufacturing a mirror-finished wafer of the present invention, when manufacturing a mirror-finished wafer by sandwiching the wafer between a lower surface plate and an upper surface plate that rotate in opposite directions and performing boring, one surface and the other surface of the wafer are It is characterized by giving a difference in the polishing speed of the two surfaces, and making the negative surface a mirror surface and the other surface a semi-glossy surface.
このような方法によれば、ウェハが大口径化しても、従
来の片面ポリシング装置を用いて製造された片面鏡面ウ
ェハと外観的には変らず、しかも高精度なウェハを製造
することができる。According to such a method, even if the diameter of the wafer is increased, it is possible to manufacture a wafer with high precision, which has the same external appearance as a single-sided mirror-finished wafer manufactured using a conventional single-sided polishing apparatus.
以下、本発明の実施例を第2図を参照して説明する。Hereinafter, embodiments of the present invention will be described with reference to FIG.
第2図は両面ボリシング装置の断面図である。FIG. 2 is a sectional view of the double-sided boring machine.
図中11は下定盤であり、この下定盤11の中央開口に
は回転軸12が挿入されている。この回転軸12の上端
部12aには上定盤13の中央開口が嵌合される。また
、回転軸12外周の下定盤11との間には太陽ギアi4
が配設されている。In the figure, reference numeral 11 denotes a lower surface plate, and a rotating shaft 12 is inserted into the central opening of this lower surface plate 11. The center opening of the upper surface plate 13 is fitted into the upper end portion 12a of this rotating shaft 12. In addition, a sun gear i4 is provided between the lower surface plate 11 and the outer circumference of the rotating shaft 12.
is installed.
また、下足5111の外周にはインターナルギア15が
配設されている。更に、下定盤11上には太陽ギア14
とインターナルギア15とに噛合する複数のキャリア1
6.・・・が蔵置され、これらキャリア16、・・・に
よってウェハ17、・・・が保持される。Furthermore, an internal gear 15 is disposed around the outer periphery of the lower leg 5111. Furthermore, a sun gear 14 is placed on the lower surface plate 11.
A plurality of carriers 1 meshing with and internal gear 15
6. . . are stored, and the wafers 17, . . . are held by these carriers 16, .
上記両面ボリシング装置を用いて、例えばインターナル
ギア15の回転数を時計回りに12rpm、太陽ギア1
4の回転数を時計回りにl Orpmとすると、キャリ
ア16、・・・は時計回りに10.9rp履の回転数で
公転する。この状態で下足!111の回転数を時計回り
に11 rptn 、上定盤13の回転数を反時計回り
に5 Orpmとしてウェハのポリシングを行なった。Using the above-mentioned double-sided boring machine, for example, the rotation speed of the internal gear 15 is set to 12 rpm clockwise, and the sun gear 1 is rotated clockwise.
4 rotate clockwise as l Orpm, the carriers 16, . . . revolve clockwise at a rotation speed of 10.9 rpm. My legs are in this state! The wafer was polished by setting the rotation speed of the upper surface plate 13 to 11 rpm clockwise and 5 Orpm counterclockwise.
上記の条件下でキャリア16、・・・の公転速度をウェ
ハ17、・・・の速度と考えると、ウニ/\17上面−
上定盤13間の速度差とウニ/\17下面−下定盤11
間の速度差との比は510:lとなる。Under the above conditions, if we consider the revolution speed of the carriers 16,... to be the speed of the wafers 17,..., then the top surface of the sea urchin/\17 -
Speed difference between upper surface plate 13 and sea urchin/\17 Lower surface - lower surface plate 11
The ratio with the speed difference between them is 510:l.
加工中の雰囲気は上下等しいので、上記速度差の比はウ
ェハ17、・・・の上下両面の加工速度の比とほぼ等し
くなる。この結果、ウニ/\17、・・・の上面だけを
鏡面とし、下面を半光沢面とすることができる。Since the atmosphere during processing is the same on the upper and lower sides, the ratio of the speed difference is approximately equal to the ratio of the processing speeds on both the upper and lower surfaces of the wafers 17, . As a result, only the upper surface of the sea urchin/\17, . . . can be made into a mirror surface, and the lower surface can be made into a semi-glossy surface.
したがって、ウェハ17、・・・が大口径化しても、従
来の片面鏡面ウェハと外観的には同様な片面鏡面ウェハ
を高精度で製造することができる。Therefore, even if the diameter of the wafers 17, .
例えば、加工温度30℃、圧力300 g 7cm2で
、回転速度等は上記したのと同一の条件として125f
f1m径のウェハをボリシングしたところ、ポリシング
速度の大きい上面は20#Lmポリシングされて鏡面と
なり、下面は0.04Ji、mボリシングされただけで
半光沢面であった。For example, the processing temperature is 30℃, the pressure is 300g 7cm2, and the rotation speed is 125f under the same conditions as above.
When a wafer with a diameter of f1 was polished, the top surface, which had a high polishing speed, was polished by 20 #Lm and became a mirror surface, and the bottom surface was polished by only 0.04Ji, m and had a semi-glossy surface.
上述した平坦度規格が厳しい125mm径のウェハの場
合、例えば平坦度3pm以内の規格内の鏡面ウェハを1
0枚得るには、従来の片面ボリシング装置を用いる方法
では50〜60枚の加工枚数を必要としたが、上記実施
例の方法では加工枚数は10〜15枚ですむようになっ
た。また、両面ボリシング装置を用いることにより、鏡
面ウェハの平坦度のレベルは30〜40%向上した。更
に、従来は高精度の貼付技術を必要としていたが、本発
明方法ではこうした必要もなくなる。In the case of a wafer with a diameter of 125 mm, which has strict flatness standards as mentioned above, for example, a mirror-finished wafer with a flatness within the standard of 3 pm is
In order to obtain 0 sheets, 50 to 60 sheets were required to be processed using the conventional method using a single-sided boring machine, but with the method of the above embodiment, only 10 to 15 sheets were processed. Moreover, by using a double-sided boring machine, the level of flatness of mirror-finished wafers was improved by 30-40%. Furthermore, although the past required a highly accurate pasting technique, the method of the present invention eliminates this need.
なお、上記実施例のようにボリシング速度比を510:
lとした場合、ウェハの赤外線透過率は10%、表面粗
さはRmax表示で0.5〜1.0 JLtaであるが
、上記ボリシング速度比は20:1以上であればよい。In addition, as in the above example, the bollising speed ratio was set to 510:
1, the infrared transmittance of the wafer is 10%, and the surface roughness is 0.5 to 1.0 JLta in Rmax, but the bolling speed ratio may be 20:1 or more.
これは、従来の片面鏡面ウェハの赤外線透過率が50%
以下、表面粗さがR+sax表示で0.1〜2.0gm
であるため、この範囲とするためにはボリシング速度比
を20:1以上にすればよいからである・
また、以−Lの説明ではウェハの上面を鏡面とし、下面
を半光沢面とする場合について説明したが、下面を鏡面
、上面を半光沢面としてもよい。This means that the infrared transmittance of conventional single-sided mirror wafers is 50%.
Below, the surface roughness is 0.1 to 2.0 g in R+sax.
Therefore, in order to achieve this range, the borizing speed ratio should be set to 20:1 or more. Also, in the following explanation, when the top surface of the wafer is a mirror surface and the bottom surface is a semi-glossy surface, However, the lower surface may be a mirror surface and the upper surface may be a semi-glossy surface.
以上詳述した如く本発明の鏡面ウェハの製・遣方法によ
れば、大口径かつ高精度の片面鏡面ウェハを高能率で製
造することができる等極めて顕著な効果を奏するもので
ある。As described in detail above, the method for manufacturing and distributing mirror-finished wafers of the present invention has extremely remarkable effects such as being able to manufacture large-diameter, high-precision, single-sided mirror-finished wafers with high efficiency.
第1図は従来の片面ボリシング装置の正面図、第2図は
本発明の実施例において使用される両面ポリシング装置
の断面図である。
11・・・下定盤、12・・・回転軸、13・・・上定
盤、14・・・太陽ギア、15・・・インターナルギア
、16・・・キャリア、17・・・ウェハ。
出願人代理人 弁理士 鈴 江 武 彦第1図
第2図FIG. 1 is a front view of a conventional single-sided polishing device, and FIG. 2 is a sectional view of a double-sided polishing device used in an embodiment of the present invention. DESCRIPTION OF SYMBOLS 11... Lower surface plate, 12... Rotating shaft, 13... Upper surface plate, 14... Sun gear, 15... Internal gear, 16... Carrier, 17... Wafer. Applicant's representative Patent attorney Takehiko Suzue Figure 1 Figure 2
Claims (4)
ウェハを挟んでポリシングすることにより鏡面ウェハを
製造するにあたり、前記ウェハの一面と他面とのポリシ
ング速度に差を与え、−面を鏡面に、他面を半光沢面に
することを特徴とする鏡面ウェハの製造方法。(1) When manufacturing a mirror-finished wafer by sandwiching and polishing a wafer between a lower surface plate and an upper surface plate that rotate in opposite directions, giving a difference in polishing speed between one side and the other side of the wafer, - A method for manufacturing a mirror-finished wafer, characterized in that one surface is made into a mirror surface and the other surface is made into a semi-glossy surface.
求の範囲第1項記載の鏡面ウェハの製造方法。(2) The method for manufacturing a mirror-finished wafer according to claim 1, wherein the ratio of polishing speeds is 20:1 or more.
する特許請求の範囲第1項記載の鏡面ウェハの製造方法
。(3) The method for manufacturing a mirror-finished wafer according to claim 1, wherein the infrared transmittance of the semi-glossy surface of the wafer is 50% or less.
.1〜2.0 gmとする特許請求の範囲第1項記載の
鏡面ウェハの製造方法。(4) The surface roughness of the semi-glossy surface of the wafer is 0 in Rmax
.. 1. The method for manufacturing a mirror-finished wafer according to claim 1, wherein the wafer has a grain size of 1 to 2.0 gm.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59053040A JPS60197367A (en) | 1984-03-19 | 1984-03-19 | Preparation of mirror-surface wafer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59053040A JPS60197367A (en) | 1984-03-19 | 1984-03-19 | Preparation of mirror-surface wafer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS60197367A true JPS60197367A (en) | 1985-10-05 |
Family
ID=12931772
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59053040A Pending JPS60197367A (en) | 1984-03-19 | 1984-03-19 | Preparation of mirror-surface wafer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60197367A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02222144A (en) * | 1989-02-23 | 1990-09-04 | Nkk Corp | Semiconductor wafer and manufacture thereof |
JPH02299232A (en) * | 1989-05-15 | 1990-12-11 | Nkk Corp | Semiconductor wafer and manufacture thereof |
WO2005055301A1 (en) * | 2003-12-01 | 2005-06-16 | Sumitomo Mitsubishi Silicon Corporation | Silicon wafer producing method |
US7589023B2 (en) | 2000-04-24 | 2009-09-15 | Sumitomo Mitsubishi Silicon Corporation | Method of manufacturing semiconductor wafer |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS526197A (en) * | 1975-07-02 | 1977-01-18 | Kotobuki Kiko Kk | Surface lap planing equipment |
-
1984
- 1984-03-19 JP JP59053040A patent/JPS60197367A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS526197A (en) * | 1975-07-02 | 1977-01-18 | Kotobuki Kiko Kk | Surface lap planing equipment |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02222144A (en) * | 1989-02-23 | 1990-09-04 | Nkk Corp | Semiconductor wafer and manufacture thereof |
JPH02299232A (en) * | 1989-05-15 | 1990-12-11 | Nkk Corp | Semiconductor wafer and manufacture thereof |
US7589023B2 (en) | 2000-04-24 | 2009-09-15 | Sumitomo Mitsubishi Silicon Corporation | Method of manufacturing semiconductor wafer |
US8283252B2 (en) | 2000-04-24 | 2012-10-09 | Sumitomo Mitsubishi Silicon Corporation | Method of manufacturing semiconductor wafer |
WO2005055301A1 (en) * | 2003-12-01 | 2005-06-16 | Sumitomo Mitsubishi Silicon Corporation | Silicon wafer producing method |
CN100435289C (en) * | 2003-12-01 | 2008-11-19 | 胜高股份有限公司 | Manufacturing method of silicon wafer |
US7645702B2 (en) | 2003-12-01 | 2010-01-12 | Sumco Corporation | Manufacturing method of silicon wafer |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS62154614A (en) | Manufacture of junction type semiconductor substrate | |
TW399257B (en) | Method for manufacturing a semiconductor wafer which is coated on one side and provided with a finish | |
JPS60197367A (en) | Preparation of mirror-surface wafer | |
JPS5516464A (en) | Method of forming wafer for semiconductor device | |
JP2001121412A (en) | Double side surface polisher | |
JP2552305B2 (en) | Double side polishing machine | |
JPS6025649A (en) | One-side polishing device by double polishing device | |
JPS60249568A (en) | Polishing of semiconductor wafer | |
JPS62264864A (en) | Lapping method for substrate | |
JPS60259372A (en) | Both face polishing | |
JPH02273923A (en) | Manufacture of semiconductor substrate | |
JPS60228068A (en) | Polishing machine | |
JPS59154444A (en) | Method for coating resist | |
JP2608757B2 (en) | Quartz crystal crystal wafer | |
JPH0526755Y2 (en) | ||
JPS6125976Y2 (en) | ||
JPH03196965A (en) | Polishing method for semiconductor wafer | |
JPS5330284A (en) | Production of substrate for semiconductor integrated circuits | |
CN107571145B (en) | Thickness-adjustable large-size planetary wheel | |
JPS6274567A (en) | Polishing method for ceramic plate | |
JPS58132458A (en) | Method and equipment for polishing flat surface of hard and brittle plate | |
JPS5336180A (en) | Production of semiconductor device | |
JPS59147325A (en) | Manufacture of liquid crystal panel | |
JPS6243145A (en) | Manufacture apparatus of semiconductor element | |
JPS63138720A (en) | Semicondoctor substrate wafer |