JPS59154444A - Method for coating resist - Google Patents

Method for coating resist

Info

Publication number
JPS59154444A
JPS59154444A JP2768283A JP2768283A JPS59154444A JP S59154444 A JPS59154444 A JP S59154444A JP 2768283 A JP2768283 A JP 2768283A JP 2768283 A JP2768283 A JP 2768283A JP S59154444 A JPS59154444 A JP S59154444A
Authority
JP
Japan
Prior art keywords
resist
substrate
coating
turntable
speed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2768283A
Other languages
Japanese (ja)
Inventor
Keiichi Shibata
圭一 柴田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP2768283A priority Critical patent/JPS59154444A/en
Publication of JPS59154444A publication Critical patent/JPS59154444A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/16Coating processes; Apparatus therefor
    • G03F7/162Coating on a rotating support, e.g. using a whirler or a spinner

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)

Abstract

PURPOSE:To make the thickness of a coated film uniform by regulating the speed of revolution of a turntable in the early and last stages of coating when a resist is coated on the principal surface of a substrate for a videodisc or the like while turning the substrate around an axis perpendicular to the principal surface of the substrate. CONSTITUTION:A substrate W is fixed on a turntable 1, the turntable 1 is rotated, and while releasing a resist from a nozzle 4, the nozzle 4 is moved in the direction of an arrow 5 to stick the resist to the principal surface Wa of the substrate W. In the early stage of coating, the turntable 1 is rotated at a high speed for a fixed time, and then the speed is reduced. The speed is further reduced, and in the last stage of coating, the turntable 1 is rotated at a low speed. Thus, the thickness of a resist film coated on the surface Wa of the substrate W is made uniform. The reason that the film is made uniform is that the action of centrifugal force is eliminated by the interaction between a change in the amount of a solvent remaining in the resist with the lapse of time and said change in the speed.

Description

【発明の詳細な説明】 〔発明の技術分野〕 この発明はビデオデスクなどの製造のだめの工程で基板
にレジストを塗布するレジスト塗布方法の改良に関する
DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to an improvement in a resist coating method for coating a substrate with a resist in a final step of manufacturing a video desk or the like.

〔発明の技術的背景とその問題点〕[Technical background of the invention and its problems]

たとえば、ビデオデスクの製造にはガラスの基板にレジ
ストを塗布する工程がある。この工程は、ガラス基板を
ターンテーブルに取付けて回転させておき、上記回転す
るガラス基板の主面にノズルからし、シストを放出させ
て行っている。そして上記回転は上記レジストが所望の
厚みの塗膜になるよう膜厚に対応する一定速度で行われ
て、余分のレジストは遠心力によって除去され、これと
ともに溶剤が蒸発して塗布を完了する。
For example, the manufacturing of video desks involves the process of applying resist to a glass substrate. This step is carried out by attaching the glass substrate to a turntable and rotating it, and ejecting cysts from a nozzle onto the main surface of the rotating glass substrate. Then, the rotation is performed at a constant speed corresponding to the film thickness so that the resist becomes a coating film of a desired thickness, and the excess resist is removed by centrifugal force, and at the same time, the solvent evaporates, completing the coating.

しかるに、遠心力の大きさは回転中心からの距離によっ
て異なるためこのような従来の方法によると膜厚が一定
にならず、結果としてビデオデスクの品質を低下させる
欠点がある。
However, since the magnitude of centrifugal force varies depending on the distance from the center of rotation, this conventional method has the disadvantage that the film thickness is not constant, resulting in a decrease in the quality of the video desk.

〔発明の目的〕[Purpose of the invention]

この発明は基板に塗布するレジストの膜厚を一定にする
塗布方法を提供することを目的とする。
An object of the present invention is to provide a coating method that makes the thickness of a resist coated on a substrate constant.

〔発明の概要〕[Summary of the invention]

基板にレジストを付着したのち、上記基板に少くとも塗
布の初期に高速回転を与え、塗布の中期に減速回転を与
え、塗布の末期に低速回転を与えて基板に塗布するレジ
ス)・の膜厚を一定にするようにしたものである。
After a resist is attached to a substrate, the substrate is subjected to high-speed rotation at least in the initial stage of coating, decelerated rotation in the middle of coating, and low-speed rotation in the final stage of coating. is made to be constant.

〔発明の実施例〕[Embodiments of the invention]

以下、図面を参照し、この発明を実施例に基づいて説明
する。
Hereinafter, the present invention will be described based on embodiments with reference to the drawings.

この発明の方法に用いられるレジスト塗布装置には、第
1図に示すようにガラスの基板(W−)を吸着1〜て保
持するターンテーブル(1)が設けられている。とのタ
ーンデープル(1)は図示せぬ1駆動装仙および制御装
置によって任意の時間任意の速度で−」転できる。この
ターンテーブル(1)のテーブル面には図示せぬ減圧源
に連なる減圧通路(2)に連通ずる溝(3)が形成され
ていて、−1:、記減圧源からの減圧によって基板(W
)をターンテーブル+1.)に同定でさるようになって
いる。このターンテーブル(1)と基板(W)を介して
対面してレジストを基板(W)の主面(Wa )に付着
させるだめのノズル(4)が収けられる。
As shown in FIG. 1, the resist coating apparatus used in the method of the present invention is equipped with a turntable (1) that holds a glass substrate (W-) by suction. The turntable (1) can be turned at any time and at any speed by means of a drive unit and a control device (not shown). A groove (3) communicating with a vacuum passage (2) connected to a vacuum source (not shown) is formed on the table surface of the turntable (1).
) on the turntable +1. ) is now available for identification. A nozzle (4) for depositing resist onto the main surface (Wa) of the substrate (W) is housed facing the turntable (1) via the substrate (W).

このノズ、7l−(4)は図示の基板中心部付近から矢
印(5)飛び散るレジストを回収するだめの外囲器(ら
)か設けられる。
This nozzle 7l-(4) is provided with an envelope (ra) for collecting the resist scattered from near the center of the substrate shown by the arrow (5).

つぎに塗布方法を述べる。Next, the coating method will be described.

先ず基板(W )をターンテーブル(1)に減圧吸着し
て固定する。そして、上記ターンテーブル(1)全回転
させておいてノズル(4)からレジストを放出させなが
らこのノズル(4)を矢印(5)方向に移動させて、基
板(VV)の主面(Wa)にレジストを付着させる。し
かして1、ターンテーブル(1)を第2A図に示すよう
に、t1時時間、々る高速度で回転させ、これに続いて
12時間一定加速度でN2に減速し、史に続けて1s時
間とのN2で回転させ、レジスト中の溶材を蒸発させて
塗布を完了する。
First, the substrate (W) is fixed to the turntable (1) by adsorption under reduced pressure. Then, while the turntable (1) is fully rotated and the nozzle (4) is moved in the direction of the arrow (5) while discharging the resist from the nozzle (4), the main surface (Wa) of the substrate (VV) is removed. Attach resist to. 1. As shown in Figure 2A, the turntable (1) is rotated at a high speed for t1 hours, then decelerated to N2 at a constant acceleration for 12 hours, and then continued for 1 s. The resist is rotated with N2 gas to evaporate the solvent in the resist and complete the coating.

これにより、基板(W)の主面(Wa)に塗布されるレ
ジストの膜厚は一定の厚さになる。このように一定の厚
さになるのは時間の経鍋によってレジスト中の残留溶剤
Ω量が変化するので、この溶剤量の変化と上記速度変化
の相互作用によって遠心力の作用が打ち消されるのでj
膜厚が一定になるものと考えることができる。
As a result, the thickness of the resist coated on the main surface (Wa) of the substrate (W) becomes constant. The reason for this constant thickness is that the amount of residual solvent Ω in the resist changes over time, and the interaction between this change in solvent amount and the speed change cancels out the effect of centrifugal force.
It can be considered that the film thickness is constant.

第2B図と第2C図とは他の実施例を示すものであって
、第2B図はレジストの付着17フこ基板(W)を11
時間N、なる高速1fで回転させ、これに続いてt2時
間一定加速度でN2に減速l〜、史に続けてt5時間こ
のN2で回転させ、これと同じことを複数回繰υ返して
行い最後に14時間このN2で回転させ、レジスト中の
溶剤を蒸発させて塗布を完了する。また、第2C図はレ
ジストの付着した基板(W)をt。
FIG. 2B and FIG. 2C show other embodiments, and FIG. 2B shows a resist-adhering 17-wall substrate (W) with 11
Rotate at a high speed of 1f for a time N, then decelerate to N2 at a constant acceleration for t2 hours l ~, continue to rotate at this N2 for t5 hours, repeat this same process multiple times υ, and finally The resist was rotated with N2 for 14 hours to evaporate the solvent in the resist and complete the coating. Further, FIG. 2C shows the substrate (W) to which the resist is attached.

時間N、なる商速度で回転させたのちN2に減速してt
2時間回転し、これと同様のことを複数回繰り返して行
い最後に、13時間N5で回転させ、レジスト中の溶剤
を蒸発させて塗布を完了する。
After rotating at a quotient speed of N2 for a time, it is decelerated to N2 and t
The resist was rotated for 2 hours, and the same process was repeated several times.Finally, the resist was rotated for 13 hours using N5 to evaporate the solvent in the resist and complete the coating.

これらの実施例の方法によると、前記実施例と同じ理由
により同様の効果を奏することができる。
According to the methods of these embodiments, similar effects can be achieved for the same reasons as those of the embodiments described above.

上述の実施例はガラスの基板(W)に塗布を行うものに
ついて述べたが、半尋体集積回路の製作に使用されるウ
エハ−ヒにレジストを塗布する作≠などにも適用でさる
ことはいうまでもない。また減速の方法は上述の実施例
に限定されるものではなく任意の方法を選択することが
できる。
Although the above-mentioned embodiment has been described for applying resist to a glass substrate (W), it can also be applied to processes such as applying resist to wafers used in the production of semi-solid integrated circuits. Needless to say. Further, the method of deceleration is not limited to the above-mentioned embodiments, and any method can be selected.

〔発明の効果〕〔Effect of the invention〕

この発明はレジストの付着した基板に少なくとも塗布の
初期に高速回転を与え、塗布の中期に減速回転を与え塗
布の末期に低速回転を与えたから基板に塗布するレジス
トの膜厚を従来の上記基板に定速回転だけ与えたものと
比へて一定のものとすることができ、結果としてレジス
ト塗布の品質を向上することができた。
This invention applies high-speed rotation to the substrate on which the resist is attached at least at the beginning of coating, decelerated rotation in the middle of coating, and low-speed rotation at the end of coating, so that the film thickness of the resist applied to the substrate can be reduced from that of the conventional substrate. Compared to the case where only constant speed rotation was applied, it was possible to make the resist coating constant, and as a result, the quality of resist coating could be improved.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの発明の実施例に用いるレジスト塗布装置の
断面図、第2図(AXB)(C)はそれぞれこの発明の
塗布方法を説明するだめの図面である。 (1):ターンテーブル    (VV):基 板(W
a):主 面 代・埋入 弁理士  則 近 途 佑 (ほか1名)
FIG. 1 is a sectional view of a resist coating apparatus used in an embodiment of the present invention, and FIGS. 2 (AXB) and (C) are drawings for explaining the coating method of the present invention. (1): Turntable (VV): Board (W
a): Main face fee/embedding Patent attorney rule Yu Chika (and 1 other person)

Claims (1)

【特許請求の範囲】[Claims] 主面にレジストの付着した基板を上記基板の主面に垂直
な軸線まわりに回転させるレジスト塗布方法において、
上記基板に少くとも塗布の初期に高速回転を与え、塗布
の中期に減速回転を与え、塗布の末期に低速回転を与え
ることを特徴とするレジスト塗布方法。
In a resist coating method in which a substrate having a resist attached to its main surface is rotated around an axis perpendicular to the main surface of the substrate,
A resist coating method characterized in that the substrate is subjected to high-speed rotation at least in the initial stage of coating, decelerated rotation in the middle of coating, and low-speed rotation in the final stage of coating.
JP2768283A 1983-02-23 1983-02-23 Method for coating resist Pending JPS59154444A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2768283A JPS59154444A (en) 1983-02-23 1983-02-23 Method for coating resist

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2768283A JPS59154444A (en) 1983-02-23 1983-02-23 Method for coating resist

Publications (1)

Publication Number Publication Date
JPS59154444A true JPS59154444A (en) 1984-09-03

Family

ID=12227736

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2768283A Pending JPS59154444A (en) 1983-02-23 1983-02-23 Method for coating resist

Country Status (1)

Country Link
JP (1) JPS59154444A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62190838A (en) * 1986-02-18 1987-08-21 Rohm Co Ltd Resist coating method
JPH02126970A (en) * 1988-11-07 1990-05-15 Fuji Electric Co Ltd Spin coating method
JP2008006379A (en) * 2006-06-29 2008-01-17 Disco Abrasive Syst Ltd Protection film formation method
JP2008251810A (en) * 2007-03-30 2008-10-16 Fujitsu Microelectronics Ltd Coating method of coating liquid, and manufacturing method of semiconductor device
JP2008306220A (en) * 2008-09-22 2008-12-18 Renesas Technology Corp Manufacturing method of semiconductor integrated circuit device

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62190838A (en) * 1986-02-18 1987-08-21 Rohm Co Ltd Resist coating method
JPH0556847B2 (en) * 1986-02-18 1993-08-20 Rohm Kk
JPH02126970A (en) * 1988-11-07 1990-05-15 Fuji Electric Co Ltd Spin coating method
JP2008006379A (en) * 2006-06-29 2008-01-17 Disco Abrasive Syst Ltd Protection film formation method
JP2008251810A (en) * 2007-03-30 2008-10-16 Fujitsu Microelectronics Ltd Coating method of coating liquid, and manufacturing method of semiconductor device
JP2008306220A (en) * 2008-09-22 2008-12-18 Renesas Technology Corp Manufacturing method of semiconductor integrated circuit device

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