JPS5979841A - 絶対反射率測定装置 - Google Patents

絶対反射率測定装置

Info

Publication number
JPS5979841A
JPS5979841A JP57191306A JP19130682A JPS5979841A JP S5979841 A JPS5979841 A JP S5979841A JP 57191306 A JP57191306 A JP 57191306A JP 19130682 A JP19130682 A JP 19130682A JP S5979841 A JPS5979841 A JP S5979841A
Authority
JP
Japan
Prior art keywords
window
light
integrating sphere
absolute reflectance
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57191306A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6355020B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
Osamu Akiyama
修 秋山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Shimazu Seisakusho KK
Original Assignee
Shimadzu Corp
Shimazu Seisakusho KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp, Shimazu Seisakusho KK filed Critical Shimadzu Corp
Priority to JP57191306A priority Critical patent/JPS5979841A/ja
Priority to US06/542,150 priority patent/US4575252A/en
Priority to DE19833338203 priority patent/DE3338203A1/de
Priority to CA000439966A priority patent/CA1203399A/en
Publication of JPS5979841A publication Critical patent/JPS5979841A/ja
Publication of JPS6355020B2 publication Critical patent/JPS6355020B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/065—Integrating spheres

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
JP57191306A 1982-10-29 1982-10-29 絶対反射率測定装置 Granted JPS5979841A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP57191306A JPS5979841A (ja) 1982-10-29 1982-10-29 絶対反射率測定装置
US06/542,150 US4575252A (en) 1982-10-29 1983-10-14 Apparatus for measuring absolute reflectance
DE19833338203 DE3338203A1 (de) 1982-10-29 1983-10-20 Geraet zur messung des absoluten reflexionsgrades
CA000439966A CA1203399A (en) 1982-10-29 1983-10-28 Apparatus for measuring absolute reflectance

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57191306A JPS5979841A (ja) 1982-10-29 1982-10-29 絶対反射率測定装置

Publications (2)

Publication Number Publication Date
JPS5979841A true JPS5979841A (ja) 1984-05-09
JPS6355020B2 JPS6355020B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1988-11-01

Family

ID=16272362

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57191306A Granted JPS5979841A (ja) 1982-10-29 1982-10-29 絶対反射率測定装置

Country Status (4)

Country Link
US (1) US4575252A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JPS5979841A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
CA (1) CA1203399A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (1) DE3338203A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62132152A (ja) * 1985-12-04 1987-06-15 Hitachi Ltd 反射率測定方法
JP2006519379A (ja) * 2003-02-28 2006-08-24 コーニンクレッカ　フィリップス　エレクトロニクス　エヌ　ヴィ 面を観察するスキャタロメータ及び方法
JP2008516224A (ja) * 2004-10-08 2008-05-15 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 検査表面の光学検査
JP2018205231A (ja) * 2017-06-08 2018-12-27 一般財団法人雑賀技術研究所 積分球を用いた相対反射率測定装置及びその較正方法

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6276433A (ja) * 1985-09-30 1987-04-08 Shimadzu Corp 分光光度計における積分球測定装置
US6927850B1 (en) * 1987-10-09 2005-08-09 The United States Of America As Represented By The Secretary Of The Navy Infrared integrating sphere
US5044754A (en) * 1989-12-20 1991-09-03 Eastman Kodak Company Apparatus and method for use in determining the optical transmission factor or density of a translucent element
US5045704A (en) * 1990-02-01 1991-09-03 Nanometrics Incorporated Method for determining absolute reflectance of a material in the ultraviolet range
DE4030836A1 (de) * 1990-09-28 1992-04-02 Kim Yoon Ok Vorrichtung zur qualitativen und/oder quantitativen bestimmung der zusammensetzung einer zu analysierenden probe
US5386267A (en) * 1994-02-16 1995-01-31 Eastman Kodak Company Light integrating cavity for a film scanner
GB2300257B (en) * 1995-04-28 1999-08-25 Deutsche Forsch Luft Raumfahrt Method and device for determination of the albedo of particles
US5597237A (en) * 1995-05-30 1997-01-28 Quantum Logic Corp Apparatus for measuring the emissivity of a semiconductor wafer
US5745234A (en) * 1995-07-31 1998-04-28 The United States Of America As Represented By The Secretary Of The Navy Variable angle reflectometer employing an integrating sphere and a light concentrator
US7048424B2 (en) * 2002-08-14 2006-05-23 Cross Match Technologies, Inc. Light integrating column
US7554665B2 (en) * 2005-08-15 2009-06-30 Koninklijke Philips Electronics N.V. Dual beam set-up for parousiameter
CN101426419B (zh) * 2006-04-18 2012-12-26 皇家飞利浦电子股份有限公司 光学测量设备
US8294898B2 (en) * 2007-08-28 2012-10-23 Trustees Of Princeton University Rotationally asymmetric chaotic optical multi-pass cavity
DE102011050969A1 (de) * 2011-06-09 2013-05-16 Carl Zeiss Microscopy Gmbh Vorrichtung zur referenzierten Messung von reflektiertem Licht und Verfahren zum Kalibrieren einer solchen Vorrichtung
WO2019149997A1 (en) 2018-01-30 2019-08-08 Grainsense Oy A method for calibrating an integrating cavity

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1964365A (en) * 1931-01-08 1934-06-26 Razek Joseph Method of and apparatus for determining the intensity of colors
US3327583A (en) * 1962-07-16 1967-06-27 Lion Res Corp Apparatus with diffusely reflecting hollow housing for measuring absolute reflectivity of a surface and the like
US3502890A (en) * 1965-06-10 1970-03-24 Cary Instruments Rotating sphere radiometer
DE1921432A1 (de) * 1969-04-26 1970-11-12 Licentia Gmbh Reflexionsgradmesser
US3874799A (en) * 1973-06-01 1975-04-01 Color Control Inc Method and apparatus for color spectrophotometry
US4035085A (en) * 1973-06-29 1977-07-12 Ppg Industries, Inc. Method and apparatus for comparing light reflectance of a sample against a standard
DE2606675C3 (de) * 1976-02-19 1979-02-22 Vladimir Dipl.-Ing. 5100 Aachen Blazek Anordnung zur spektralanalytischen Untersuchung des Remissionsvermögens einer Probe
US4093991A (en) * 1977-01-26 1978-06-06 Hunter Associates Laboratory, Inc. Spectrophotometer-digital data processing system for appearance measurements providing fast and accurate standardization, ease of use for different appearance measurements and fast response
DE3138878A1 (de) * 1981-09-30 1983-04-14 Boehringer Mannheim Gmbh, 6800 Mannheim Messeinrichtung, insbesondere ulbricht'sche kugel

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62132152A (ja) * 1985-12-04 1987-06-15 Hitachi Ltd 反射率測定方法
JP2006519379A (ja) * 2003-02-28 2006-08-24 コーニンクレッカ　フィリップス　エレクトロニクス　エヌ　ヴィ 面を観察するスキャタロメータ及び方法
JP2008516224A (ja) * 2004-10-08 2008-05-15 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 検査表面の光学検査
JP4777992B2 (ja) * 2004-10-08 2011-09-21 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 検査表面の光学検査
JP2018205231A (ja) * 2017-06-08 2018-12-27 一般財団法人雑賀技術研究所 積分球を用いた相対反射率測定装置及びその較正方法

Also Published As

Publication number Publication date
CA1203399A (en) 1986-04-22
DE3338203A1 (de) 1984-05-03
US4575252A (en) 1986-03-11
JPS6355020B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1988-11-01

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