JPS5979498A - Checking system using program judging storage data of ram - Google Patents
Checking system using program judging storage data of ramInfo
- Publication number
- JPS5979498A JPS5979498A JP57189891A JP18989182A JPS5979498A JP S5979498 A JPS5979498 A JP S5979498A JP 57189891 A JP57189891 A JP 57189891A JP 18989182 A JP18989182 A JP 18989182A JP S5979498 A JPS5979498 A JP S5979498A
- Authority
- JP
- Japan
- Prior art keywords
- ram
- data
- comparison
- comparison data
- take
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/0751—Error or fault detection not based on redundancy
- G06F11/0763—Error or fault detection not based on redundancy by bit configuration check, e.g. of formats or tags
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Abstract
Description
【発明の詳細な説明】
この発明はコノピユータに記憶させたテークが停電又は
電圧低下等により破壊又は変容されIこかとうかをブロ
クラムにより検査する方法で、1・)る。DETAILED DESCRIPTION OF THE INVENTION The present invention is a method for inspecting by using a block diagram whether or not a data stored in a computer has been destroyed or altered due to a power outage, voltage drop, or the like.
マイクロコンピュータを用いて小規模な制御ンステムを
製作する場合、不慮の停電等で記はテークを失なわない
様に回路内に停電時対策として電池を接続している。そ
してこのバックアップ電源が正常に作動1−1でいるか
とうかを通常回路内に検査器を設けて検査していた。し
かし回路構成が複雑になり部品数の増加で、コストアッ
プと信頼性の低下を招くという欠点かあった。その為本
発明は検査回路を設けずコノピユータのソフI〜ウェア
で同様の検査を行うものでロス1〜クウノと機器の信頼
性の向上に役ψl−)ものである。When manufacturing a small-scale control system using a microcomputer, a battery is connected in the circuit as a countermeasure against power outages to prevent loss of data due to unexpected power outages. A tester is usually installed in the circuit to check whether this backup power supply is operating normally. However, the disadvantage was that the circuit configuration became complicated and the number of parts increased, leading to increased costs and decreased reliability. Therefore, the present invention performs a similar test using the software of the computer computer without providing a test circuit, which is useful for improving the reliability of the equipment and the loss.
即ち、コンピュータを用いた制御ンステムにおいて本発
明を実施した例のフロック図を図1として示している。That is, FIG. 1 shows a block diagram of an example in which the present invention is implemented in a control system using a computer.
図においてRA M内の本テータとして示された部分が
停電等によりテーク破壊又は変容か起こったかとうか知
りたい部分である。■(・へへ4内の比1咬テータはR
OR1!内の比較テークと比−\た結果で本テータ内容
が正しく保たれているかとうか判断する基準となるもの
である。R,0八・1内の処理ブロクラムには](、A
M内の比)咬テータと1(、OM内の比較テークを比
較1、その結果に矛盾があれば一定の作動の後その暦表
示′□−1−る判断プログラムと本来の目的である制御
システムを稼動させるプログラムとが含まれている。R
OM内の比較テークはRAΔ4内の比較テークのもとに
なるもので、この両者の比較テークの関係は一致する場
合、処理ブロクラムと明確に分離していなくて、処理ブ
ロクラムにより語算する場合とがある。In the figure, the part shown as main data in the RAM is the part where one would like to know whether the take has been destroyed or changed due to a power outage or the like. ■(・hehe Ratio 1 occlusion in 4 is R
OR1! The results of the comparison with the comparison take in the table serve as a standard for determining whether or not the contents of this data are maintained correctly. The processing blockrum in R, 08.1 contains ](, A
Compare the comparison take in OM with the ratio in M) and 1, and if there is a discrepancy in the results, display the calendar after a certain operation and the original purpose of control is the judgment program. Contains a program to run the system.R
The comparison take in OM is the basis of the comparison take in RAΔ4, and if the relationship between the two comparison takes is the same, it is not clearly separated from the processing blockrum, and it is calculated by the processing blockrum. There is.
実際の処理手続きとして■R,A M内に保存を1目1
的とした木テータを格納する。■本テータを格納した以
外の部分にROM、 J:り取り出した比較テ−り又は
処理ブロクラムにより導き出された比較テークを格納す
る。■T(、A M内の本テータか正しく保存されてい
るかどうか判断したい場合にRA M内の比較テークと
ROM内の比較テークを比べる。■■両者間に矛盾がな
かった場合、■(・A Mは同一素子内に多数の格納部
分を持っていて、その一部テークをとってみてその内容
に変化がなければ、他の部分ても変化かなかったと判断
できる。この場合少なくとも停電等物理的原因のテーク
の破壊及変容は確実に全体に影響を及ぼす為それらかな
かったと云える■両者間に矛盾があった場合、RA A
1に対してそのテークを破壊又は変容させる障害か発生
したことである。As for the actual processing procedure, ■ Save in R, A M 1 item 1
Stores the target tree data. (2) Store the extracted comparison take or the comparison take derived from the processing block in the ROM, in a portion other than where the main data is stored. ■T(, A Compare the comparison take in RAM and the comparison take in ROM when you want to judge whether the main data in M is saved correctly.■■If there is no contradiction between the two,■(・AM has many storage parts in the same element, and if you take a part of it and there is no change in its contents, you can conclude that the other parts have not changed either.In this case, at least a physical failure such as a power outage etc. Since the destruction and transformation of the cause of the cause definitely affects the whole, it can be said that there was no such thing ■ If there is a contradiction between the two, RA A
It is the occurrence of an obstacle that destroys or transforms a take.
以上の様に11. OM内比1咬テータとRA A′I
内比較テーテー比較するだけで、RA M内容が正しく
保存されているか否かを少なくとも停電等の原因による
場合には確実な確率で判断できる。As mentioned above, 11. OM internal ratio 1 occlusator and RA A'I
By simply comparing the data, it is possible to determine with certainty whether or not the RAM contents are correctly saved, at least in the case of a power outage or the like.
なお両比較テータが矛盾する櫂1合、表示器にその旨連
続して表示し同時にIt A M内の記憶をクリアし再
度■〜■の動作をくり返ず。In addition, if the two comparison data contradict each other, the display will continuously display that fact, and at the same time, the memory in It AM will be cleared, and the operations from ■ to ■ will be repeated again.
上記検査は主に電源スィッチのONにてバックアップ電
池によるテーク保存状態より電燈線よりの電源に切り替
えたコンビューりの作動開始直前に自動的に横歪を行う
様になっている。The above-mentioned inspection is mainly performed by automatically performing lateral strain just before the power switch is turned on and the computer is switched from the storage state using the backup battery to the power source from the electric light line and starts operating.
本発明は検査回路を設(づる従来の方式のものと比べ、
コストの面に於ても信頼性の面においても優れ、又直接
記憶内容を検査する方式の為電源異常に限ることなく
1(・Aへ4自体に起った障害も知ることができる。こ
の方式は持に記憶容ノiIの1上較的少なく部品点数の
少ないマイクロコノビュークに応用した場合特に上記特
質がクロースアップされる。Compared to the conventional method of setting up a test circuit, the present invention has the following advantages:
It is superior in terms of cost and reliability, and since it directly inspects the stored contents, it is not limited to power supply abnormalities.
1 (・It is also possible to know the failure that has occurred in A to 4 itself. This method is especially effective when applied to a microconobuque with a relatively small memory capacity and a small number of parts. Will be uploaded.
図は本発明のブロック図である。 国 1 The figure is a block diagram of the present invention. Country 1
Claims (1)
の記憶テークの良イヤを判断するブロクラムを本来の制
御ンステムとして稼動させるブロクラムとは別に設け、
It A M内の記憶テークか停電等により破壊叉は変
容されたかどうか知るためにRA M内の比較テークを
1(、OM内の比較テークと比1咬しIf、 A Al
内の記憶テークが正しく保たれているかとうか判断し、
正しく保たれていなければ表示a:+にその旨表示させ
るブロクラムによる且A M自記1.はテ−りの検査方
式+! , (1) In the processing block of R4, a block for determining whether the memory take in RA Al is good or not is provided separately from the block for operating as the original control system,
In order to know whether the memory take in It A M has been destroyed or transformed due to a power outage, etc., compare the comparison take in RAM by 1 (, compare it with the comparison take in OM by 1) If, A Al
Determine whether the internal memory take is maintained correctly,
If it is not maintained correctly, it will be indicated on the display a:+ by blockram and A M self-recorded 1. H tail inspection method
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57189891A JPS5979498A (en) | 1982-10-28 | 1982-10-28 | Checking system using program judging storage data of ram |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57189891A JPS5979498A (en) | 1982-10-28 | 1982-10-28 | Checking system using program judging storage data of ram |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5979498A true JPS5979498A (en) | 1984-05-08 |
Family
ID=16248905
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57189891A Pending JPS5979498A (en) | 1982-10-28 | 1982-10-28 | Checking system using program judging storage data of ram |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5979498A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61120273A (en) * | 1984-11-16 | 1986-06-07 | Canon Inc | Document processor |
JPS63195439U (en) * | 1987-05-29 | 1988-12-15 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS573121A (en) * | 1980-06-07 | 1982-01-08 | Omron Tateisi Electronics Co | Detection system for voltage lowering of memory protecting battery |
-
1982
- 1982-10-28 JP JP57189891A patent/JPS5979498A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS573121A (en) * | 1980-06-07 | 1982-01-08 | Omron Tateisi Electronics Co | Detection system for voltage lowering of memory protecting battery |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61120273A (en) * | 1984-11-16 | 1986-06-07 | Canon Inc | Document processor |
JPS63195439U (en) * | 1987-05-29 | 1988-12-15 |
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