JPS59762Y2 - プロ−ブカ−ド - Google Patents

プロ−ブカ−ド

Info

Publication number
JPS59762Y2
JPS59762Y2 JP1979015085U JP1508579U JPS59762Y2 JP S59762 Y2 JPS59762 Y2 JP S59762Y2 JP 1979015085 U JP1979015085 U JP 1979015085U JP 1508579 U JP1508579 U JP 1508579U JP S59762 Y2 JPS59762 Y2 JP S59762Y2
Authority
JP
Japan
Prior art keywords
probe
substrate
probes
tip
probe card
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1979015085U
Other languages
English (en)
Japanese (ja)
Other versions
JPS55115054U (enrdf_load_stackoverflow
Inventor
昌男 大久保
康良 吉光
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Japan Electronic Materials Corp
Original Assignee
Japan Electronic Materials Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Japan Electronic Materials Corp filed Critical Japan Electronic Materials Corp
Priority to JP1979015085U priority Critical patent/JPS59762Y2/ja
Publication of JPS55115054U publication Critical patent/JPS55115054U/ja
Application granted granted Critical
Publication of JPS59762Y2 publication Critical patent/JPS59762Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1979015085U 1979-02-07 1979-02-07 プロ−ブカ−ド Expired JPS59762Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1979015085U JPS59762Y2 (ja) 1979-02-07 1979-02-07 プロ−ブカ−ド

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1979015085U JPS59762Y2 (ja) 1979-02-07 1979-02-07 プロ−ブカ−ド

Publications (2)

Publication Number Publication Date
JPS55115054U JPS55115054U (enrdf_load_stackoverflow) 1980-08-13
JPS59762Y2 true JPS59762Y2 (ja) 1984-01-10

Family

ID=28836165

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1979015085U Expired JPS59762Y2 (ja) 1979-02-07 1979-02-07 プロ−ブカ−ド

Country Status (1)

Country Link
JP (1) JPS59762Y2 (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4074677B2 (ja) * 1996-10-24 2008-04-09 株式会社日本マイクロニクス 検査用ヘッド

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5153478A (ja) * 1974-11-06 1976-05-11 Hitachi Ltd Koteipuroobukaado
JPS6218036Y2 (enrdf_load_stackoverflow) * 1978-11-13 1987-05-09

Also Published As

Publication number Publication date
JPS55115054U (enrdf_load_stackoverflow) 1980-08-13

Similar Documents

Publication Publication Date Title
US5378981A (en) Method for testing a semiconductor device on a universal test circuit substrate
JP4514855B2 (ja) プロービングカードの製造方法
US5382898A (en) High density probe card for testing electrical circuits
US5467252A (en) Method for plating using nested plating buses and semiconductor device having the same
US4523144A (en) Complex probe card for testing a semiconductor wafer
US4801561A (en) Method for making a pre-testable semiconductor die package
US5744383A (en) Integrated circuit package fabrication method
JP2000512065A (ja) 超小型電子素子のコネクタ
JPS6369247A (ja) プローブ装置
JPS63316449A (ja) 集積回路の試験方法及び装置
US20020118029A1 (en) Probe card and contactor
USH1267H (en) Integrated circuit and lead frame assembly
JPS59762Y2 (ja) プロ−ブカ−ド
US20040238818A1 (en) Semiconductor chip with test pads and tape carrier package using the same
US7474113B2 (en) Flexible head probe for sort interface units
US6573113B1 (en) Integrated circuit having dedicated probe pads for use in testing densely patterned bonding pads
JPS5834935B2 (ja) 半導体ウエハ−試験用探針器
JPS5826530Y2 (ja) プロ−ブカ−ド
JPH0964126A (ja) ウェーハプローバ用接続リング
JPS5826531Y2 (ja) プロ−ブカ−ド
JP3249865B2 (ja) 半導体集積回路装置の製造方法
JPH0661316A (ja) プローブ集合体
JPH02500221A (ja) Ｔａｂ相互接続表面用のバーン・インパッド
USH663H (en) High density probe head for chip testing
JPS58194349A (ja) 半導体検査装置