JPS5967410A - 中間メッキのメッキ厚さを測定する方法 - Google Patents
中間メッキのメッキ厚さを測定する方法Info
- Publication number
- JPS5967410A JPS5967410A JP16626882A JP16626882A JPS5967410A JP S5967410 A JPS5967410 A JP S5967410A JP 16626882 A JP16626882 A JP 16626882A JP 16626882 A JP16626882 A JP 16626882A JP S5967410 A JPS5967410 A JP S5967410A
- Authority
- JP
- Japan
- Prior art keywords
- plating
- thickness
- rays
- fluorescent
- intensity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007747 plating Methods 0.000 title claims abstract description 55
- 238000000034 method Methods 0.000 title claims description 8
- 239000000463 material Substances 0.000 claims description 3
- 238000005259 measurement Methods 0.000 claims description 2
- 238000000691 measurement method Methods 0.000 claims description 2
- 238000010521 absorption reaction Methods 0.000 abstract description 4
- 230000004907 flux Effects 0.000 abstract description 2
- 239000010410 layer Substances 0.000 description 4
- 239000002344 surface layer Substances 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16626882A JPS5967410A (ja) | 1982-09-24 | 1982-09-24 | 中間メッキのメッキ厚さを測定する方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16626882A JPS5967410A (ja) | 1982-09-24 | 1982-09-24 | 中間メッキのメッキ厚さを測定する方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5967410A true JPS5967410A (ja) | 1984-04-17 |
| JPH0251122B2 JPH0251122B2 (enrdf_load_stackoverflow) | 1990-11-06 |
Family
ID=15828229
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16626882A Granted JPS5967410A (ja) | 1982-09-24 | 1982-09-24 | 中間メッキのメッキ厚さを測定する方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5967410A (enrdf_load_stackoverflow) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100887065B1 (ko) | 2006-12-27 | 2009-03-04 | 주식회사 포스코 | 접합부 중첩량 측정장치 |
-
1982
- 1982-09-24 JP JP16626882A patent/JPS5967410A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100887065B1 (ko) | 2006-12-27 | 2009-03-04 | 주식회사 포스코 | 접합부 중첩량 측정장치 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0251122B2 (enrdf_load_stackoverflow) | 1990-11-06 |
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