JPS59226981A - パタ−ンマツチング方法および装置 - Google Patents

パタ−ンマツチング方法および装置

Info

Publication number
JPS59226981A
JPS59226981A JP58100962A JP10096283A JPS59226981A JP S59226981 A JPS59226981 A JP S59226981A JP 58100962 A JP58100962 A JP 58100962A JP 10096283 A JP10096283 A JP 10096283A JP S59226981 A JPS59226981 A JP S59226981A
Authority
JP
Japan
Prior art keywords
pattern
circuit
matching
mask
degree
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58100962A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0215102B2 (OSRAM
Inventor
Tetsuo Hizuka
哲男 肥塚
Hiroyuki Tsukahara
博之 塚原
Masahito Nakajima
雅人 中島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=14287975&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=JPS59226981(A) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP58100962A priority Critical patent/JPS59226981A/ja
Priority to EP84401153A priority patent/EP0128820B2/en
Priority to DE8484401153T priority patent/DE3484522D1/de
Priority to KR1019840003221A priority patent/KR890002287B1/ko
Publication of JPS59226981A publication Critical patent/JPS59226981A/ja
Priority to US07/020,201 priority patent/US4805224A/en
Publication of JPH0215102B2 publication Critical patent/JPH0215102B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M4/00—Electrodes
    • H01M4/02—Electrodes composed of, or comprising, active material
    • H01M4/62—Selection of inactive substances as ingredients for active masses, e.g. binders, fillers
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/20—Image preprocessing
    • G06V10/24—Aligning, centring, orientation detection or correction of the image
    • G06V10/245—Aligning, centring, orientation detection or correction of the image by locating a pattern; Special marks for positioning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/21—Design or setup of recognition systems or techniques; Extraction of features in feature space; Blind source separation
    • G06F18/211—Selection of the most significant subset of features
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/28—Determining representative reference patterns, e.g. by averaging or distorting; Generating dictionaries
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/74—Image or video pattern matching; Proximity measures in feature spaces
    • G06V10/75—Organisation of the matching processes, e.g. simultaneous or sequential comparisons of image or video features; Coarse-fine approaches, e.g. multi-scale approaches; using context analysis; Selection of dictionaries
    • G06V10/758—Involving statistics of pixels or of feature values, e.g. histogram matching
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/77—Processing image or video features in feature spaces; using data integration or data reduction, e.g. principal component analysis [PCA] or independent component analysis [ICA] or self-organising maps [SOM]; Blind source separation
    • G06V10/772—Determining representative reference patterns, e.g. averaging or distorting patterns; Generating dictionaries
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10—Energy storage using batteries

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • Evolutionary Computation (AREA)
  • Artificial Intelligence (AREA)
  • Multimedia (AREA)
  • Data Mining & Analysis (AREA)
  • Software Systems (AREA)
  • Databases & Information Systems (AREA)
  • Computing Systems (AREA)
  • Medical Informatics (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Evolutionary Biology (AREA)
  • General Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Image Analysis (AREA)
JP58100962A 1983-06-08 1983-06-08 パタ−ンマツチング方法および装置 Granted JPS59226981A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP58100962A JPS59226981A (ja) 1983-06-08 1983-06-08 パタ−ンマツチング方法および装置
EP84401153A EP0128820B2 (en) 1983-06-08 1984-06-06 Pattern matching method and apparatus
DE8484401153T DE3484522D1 (de) 1983-06-08 1984-06-06 Verfahren und anlage zum mustervergleich.
KR1019840003221A KR890002287B1 (ko) 1983-06-08 1984-06-08 패턴 매칭방법 및 장치
US07/020,201 US4805224A (en) 1983-06-08 1987-02-27 Pattern matching method and apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58100962A JPS59226981A (ja) 1983-06-08 1983-06-08 パタ−ンマツチング方法および装置

Publications (2)

Publication Number Publication Date
JPS59226981A true JPS59226981A (ja) 1984-12-20
JPH0215102B2 JPH0215102B2 (OSRAM) 1990-04-11

Family

ID=14287975

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58100962A Granted JPS59226981A (ja) 1983-06-08 1983-06-08 パタ−ンマツチング方法および装置

Country Status (5)

Country Link
US (1) US4805224A (OSRAM)
EP (1) EP0128820B2 (OSRAM)
JP (1) JPS59226981A (OSRAM)
KR (1) KR890002287B1 (OSRAM)
DE (1) DE3484522D1 (OSRAM)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6346583A (ja) * 1986-08-14 1988-02-27 Toshiba Seiki Kk パタ−ン認識方法
JPS63211474A (ja) * 1987-02-27 1988-09-02 Yaskawa Electric Mfg Co Ltd 階層化構造的テンプレ−ト・マツチング方法
JPH01140271A (ja) * 1987-11-26 1989-06-01 Oki Electric Ind Co Ltd パターン欠陥検出装置
JPH07302344A (ja) * 1995-01-17 1995-11-14 Toshiba Seiki Kk パターン認識装置
WO1997034258A1 (fr) * 1996-03-15 1997-09-18 Komatsu Ltd. Dispositif et procede d'inspection utilisant un appareillement de motifs
JP2009009488A (ja) * 2007-06-29 2009-01-15 Fuji Xerox Co Ltd 真偽判定装置及び真偽判定プログラム

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DE3621056A1 (de) * 1986-06-24 1988-01-14 Polygram Gmbh Verfahren zum ausrichten der drehlage von drehbaren oder positionieren von verschieblichen gegenstaenden
JPS63211076A (ja) * 1987-02-27 1988-09-01 Hitachi Ltd パタ−ン検査装置
DE3720489A1 (de) * 1987-06-20 1988-12-29 Sood Ralf A Verfahren zum lesen von text- und druckvorlagen
JP2539856B2 (ja) * 1987-10-15 1996-10-02 株式会社ヒューテック 印刷パタ―ン周期長のずれ検知方法
US4899391A (en) * 1988-06-24 1990-02-06 Cimino William J Automatic key identification system
US5127532A (en) * 1988-06-24 1992-07-07 Cimino William J Automatic key identification system
US5406642A (en) * 1988-12-23 1995-04-11 Nec Corporation Image matching method using direction sensitivity and vector smoothing functions for correcting matches
US5119436A (en) * 1990-09-24 1992-06-02 Kulicke And Soffa Industries, Inc Method of centering bond positions
US5091968A (en) * 1990-12-28 1992-02-25 Ncr Corporation Optical character recognition system and method
US8352400B2 (en) 1991-12-23 2013-01-08 Hoffberg Steven M Adaptive pattern recognition based controller apparatus and method and human-factored interface therefore
US6850252B1 (en) * 1999-10-05 2005-02-01 Steven M. Hoffberg Intelligent electronic appliance system and method
US5903454A (en) 1991-12-23 1999-05-11 Hoffberg; Linda Irene Human-factored interface corporating adaptive pattern recognition based controller apparatus
US6400996B1 (en) 1999-02-01 2002-06-04 Steven M. Hoffberg Adaptive pattern recognition based control system and method
US6418424B1 (en) 1991-12-23 2002-07-09 Steven M. Hoffberg Ergonomic man-machine interface incorporating adaptive pattern recognition based control system
US7242988B1 (en) 1991-12-23 2007-07-10 Linda Irene Hoffberg Adaptive pattern recognition based controller apparatus and method and human-factored interface therefore
US10361802B1 (en) 1999-02-01 2019-07-23 Blanding Hovenweep, Llc Adaptive pattern recognition based control system and method
US5479533A (en) * 1992-02-28 1995-12-26 Yamatake-Honeywell Co., Ltd. Pattern recognition apparatus and method using fuzzy logic
US5590048A (en) * 1992-06-05 1996-12-31 Fujitsu Limited Block exposure pattern data extracting system and method for charged particle beam exposure
US5442572A (en) * 1992-11-23 1995-08-15 Ford Motor Company Method and system for comparing free-form geometries using high density point data models
US5638301A (en) * 1994-06-02 1997-06-10 Ford Motor Company Method and system for inspecting die sets using free-form inspection techniques
KR980700633A (ko) * 1994-12-06 1998-03-30 로버트 에프. 도너후 디스플레이 스크린상의 데이터 블록의 디스플레이를 제어하기 위한 회로, 시스템 및 방법(circuits, systems and methods for controlling the display of blocks of data on a display screen)
US5659493A (en) * 1995-03-03 1997-08-19 Ford Motor Company Virtual machining techniques for modifying computer models of parts
US5739518A (en) * 1995-05-17 1998-04-14 Metanetics Corporation Autodiscrimination for dataform decoding and standardized recording
US5911003A (en) * 1996-04-26 1999-06-08 Pressco Technology Inc. Color pattern evaluation system for randomly oriented articles
US6222939B1 (en) * 1996-06-25 2001-04-24 Eyematic Interfaces, Inc. Labeled bunch graphs for image analysis
RU2128843C1 (ru) * 1997-03-04 1999-04-10 Научно-исследовательский институт измерительных систем Система диагностики по статическому низкочастотному сигналу
RU2129301C1 (ru) * 1997-03-04 1999-04-20 Научно-исследовательский институт измерительных систем Способ диагностики по статическому низкочастотному сигналу
KR100278064B1 (ko) * 1997-08-20 2001-02-01 전주범 눈영역검출장치및방법
US6272231B1 (en) 1998-11-06 2001-08-07 Eyematic Interfaces, Inc. Wavelet-based facial motion capture for avatar animation
AU2004212509B2 (en) * 1998-04-13 2005-09-08 Google Llc Face recognition from video images
KR100530812B1 (ko) 1998-04-13 2005-11-28 네브엔지니어링 인코포레이티드 아바타 애니메이션을 위한 웨이브렛-기반 얼굴 움직임 캡쳐
US6301370B1 (en) 1998-04-13 2001-10-09 Eyematic Interfaces, Inc. Face recognition from video images
US5969753A (en) * 1998-04-24 1999-10-19 Medar, Inc. Method and system for detecting errors in a sample image
US6173213B1 (en) 1998-05-11 2001-01-09 Ellison Machinery Company Motorized inbound laser orientation and wheel recognition station
DE69926699T2 (de) 1998-08-31 2006-06-08 International Business Machines Corp. Unterscheidung zwischen Formularen
EP0984387B1 (en) * 1998-08-31 2005-08-17 International Business Machines Corporation Distinguishing between similar forms
US7050655B2 (en) * 1998-11-06 2006-05-23 Nevengineering, Inc. Method for generating an animated three-dimensional video head
US6714661B2 (en) 1998-11-06 2004-03-30 Nevengineering, Inc. Method and system for customizing facial feature tracking using precise landmark finding on a neutral face image
US7050624B2 (en) * 1998-12-04 2006-05-23 Nevengineering, Inc. System and method for feature location and tracking in multiple dimensions including depth
US7904187B2 (en) 1999-02-01 2011-03-08 Hoffberg Steven M Internet appliance system and method
US6466695B1 (en) 1999-08-04 2002-10-15 Eyematic Interfaces, Inc. Procedure for automatic analysis of images and image sequences based on two-dimensional shape primitives
WO2001026051A1 (fr) * 1999-10-04 2001-04-12 Hamamatsu Photonic K.K. Systeme de camera assurant le traitement des images a grande vitesse
US7787017B2 (en) * 2000-05-18 2010-08-31 OptigraP Sagl Digital camera and method for identification of objects
US8682077B1 (en) 2000-11-28 2014-03-25 Hand Held Products, Inc. Method for omnidirectional processing of 2D images including recognizable characters
US6917703B1 (en) 2001-02-28 2005-07-12 Nevengineering, Inc. Method and apparatus for image analysis of a gabor-wavelet transformed image using a neural network
US7392287B2 (en) * 2001-03-27 2008-06-24 Hemisphere Ii Investment Lp Method and apparatus for sharing information using a handheld device
DE10135817A1 (de) 2001-07-23 2003-02-20 Siemens Ag Verfahren zum Ähnlichkeitsvergleich von zwei aus Polygonzügen aufgebauten, digitalen Bildern
US6853379B2 (en) * 2001-08-13 2005-02-08 Vidiator Enterprises Inc. Method for mapping facial animation values to head mesh positions
US6834115B2 (en) 2001-08-13 2004-12-21 Nevengineering, Inc. Method for optimizing off-line facial feature tracking
US6876364B2 (en) 2001-08-13 2005-04-05 Vidiator Enterprises Inc. Method for mapping facial animation values to head mesh positions
JP3978098B2 (ja) * 2002-08-12 2007-09-19 株式会社日立製作所 欠陥分類方法及びその装置
JP2004192307A (ja) * 2002-12-11 2004-07-08 Seiko Epson Corp 類似画像抽出装置、類似画像抽出方法および類似画像抽出プログラム
US20050047647A1 (en) * 2003-06-10 2005-03-03 Ueli Rutishauser System and method for attentional selection
US20050182692A1 (en) * 2004-01-23 2005-08-18 Woos Michael T. Product finder system and method
US7416125B2 (en) * 2005-03-24 2008-08-26 Hand Held Products, Inc. Synthesis decoding and methods of use thereof
MX2008009440A (es) 2006-01-23 2008-11-19 Hy Ko Products Co Máquina duplicadora de llaves.
US9101990B2 (en) 2006-01-23 2015-08-11 Hy-Ko Products Key duplication machine
AT509026B1 (de) * 2009-04-22 2013-04-15 Arc Austrian Res Centers Gmbh Verfahren zur bestimmung von als passpunkt einsetzbaren bildausschnitten eines masterbildes
CN102686348A (zh) 2009-05-01 2012-09-19 海高制品有限公司 具有槽扫描的钥匙原坯识别系统
CN102448636B (zh) 2009-05-01 2014-09-10 海高制品有限公司 具有齿分析的钥匙原坯识别系统
US8326018B2 (en) * 2010-05-29 2012-12-04 Mentor Graphics Corporation Fast pattern matching
US8994936B2 (en) * 2012-11-22 2015-03-31 Shenzhen China Star Optoelectronics Technology Co., Ltd Pattern matching method, apparatus and line width measuring machine
US9818041B2 (en) 2015-08-03 2017-11-14 Hy-Ko Products Company High security key scanning system

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5549779A (en) * 1978-10-04 1980-04-10 Hajime Sangyo Kk Standard memory take-in method

Family Cites Families (4)

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JPS5214112B2 (OSRAM) * 1973-02-22 1977-04-19
US4200861A (en) * 1978-09-01 1980-04-29 View Engineering, Inc. Pattern recognition apparatus and method
JPS56132505A (en) * 1980-03-24 1981-10-16 Hitachi Ltd Position detecting method
US4441205A (en) * 1981-05-18 1984-04-03 Kulicke & Soffa Industries, Inc. Pattern recognition system

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5549779A (en) * 1978-10-04 1980-04-10 Hajime Sangyo Kk Standard memory take-in method

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6346583A (ja) * 1986-08-14 1988-02-27 Toshiba Seiki Kk パタ−ン認識方法
JPS63211474A (ja) * 1987-02-27 1988-09-02 Yaskawa Electric Mfg Co Ltd 階層化構造的テンプレ−ト・マツチング方法
JPH01140271A (ja) * 1987-11-26 1989-06-01 Oki Electric Ind Co Ltd パターン欠陥検出装置
JPH07302344A (ja) * 1995-01-17 1995-11-14 Toshiba Seiki Kk パターン認識装置
WO1997034258A1 (fr) * 1996-03-15 1997-09-18 Komatsu Ltd. Dispositif et procede d'inspection utilisant un appareillement de motifs
JP2009009488A (ja) * 2007-06-29 2009-01-15 Fuji Xerox Co Ltd 真偽判定装置及び真偽判定プログラム

Also Published As

Publication number Publication date
US4805224A (en) 1989-02-14
EP0128820B2 (en) 1996-05-29
KR890002287B1 (ko) 1989-06-27
EP0128820A3 (en) 1988-07-27
JPH0215102B2 (OSRAM) 1990-04-11
DE3484522D1 (de) 1991-06-06
EP0128820A2 (en) 1984-12-19
KR850000088A (ko) 1985-02-25
EP0128820B1 (en) 1991-05-02

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