JPS5920840A - 欠陥検査装置 - Google Patents
欠陥検査装置Info
- Publication number
- JPS5920840A JPS5920840A JP13179882A JP13179882A JPS5920840A JP S5920840 A JPS5920840 A JP S5920840A JP 13179882 A JP13179882 A JP 13179882A JP 13179882 A JP13179882 A JP 13179882A JP S5920840 A JPS5920840 A JP S5920840A
- Authority
- JP
- Japan
- Prior art keywords
- inspected
- photodetector
- light
- sample
- defect
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N21/95692—Patterns showing hole parts, e.g. honeycomb filtering structures
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13179882A JPS5920840A (ja) | 1982-07-28 | 1982-07-28 | 欠陥検査装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13179882A JPS5920840A (ja) | 1982-07-28 | 1982-07-28 | 欠陥検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5920840A true JPS5920840A (ja) | 1984-02-02 |
JPH0447782B2 JPH0447782B2 (enrdf_load_stackoverflow) | 1992-08-04 |
Family
ID=15066359
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13179882A Granted JPS5920840A (ja) | 1982-07-28 | 1982-07-28 | 欠陥検査装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5920840A (enrdf_load_stackoverflow) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5999364A (ja) * | 1982-11-30 | 1984-06-08 | Fujitsu Ltd | スル−ホ−ル検査装置 |
JPS59150329A (ja) * | 1983-01-28 | 1984-08-28 | Fujitsu Ltd | スル−ホ−ル検査装置 |
JPS62297750A (ja) * | 1986-06-17 | 1987-12-24 | Matsushita Electric Ind Co Ltd | ハンダ付け検査装置 |
JPS62299747A (ja) * | 1986-06-19 | 1987-12-26 | Fujitsu Ltd | スル−ホ−ル検査装置 |
JPH0455991U (enrdf_load_stackoverflow) * | 1990-09-19 | 1992-05-13 | ||
US5548400A (en) * | 1994-02-16 | 1996-08-20 | Sochata | Method and apparatus for inspecting honeycomb structures using optical fibres |
EP0997722A1 (fr) * | 1998-10-29 | 2000-05-03 | Societe Nationale D'etude Et De Construction De Moteurs D'aviation "Snecma" | Procédé et instrument de contrôle de la liaison de l'âme alvéolée d'un nid d'abeilles sur une peau |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53143384A (en) * | 1977-05-20 | 1978-12-13 | Yaskawa Denki Seisakusho Kk | Pinhole detector |
JPS5444769A (en) * | 1977-09-14 | 1979-04-09 | Matsushita Electric Ind Co Ltd | Device for inspecting displacement of chipplike parts |
JPS54141661A (en) * | 1978-04-27 | 1979-11-05 | Fujitsu Ltd | Assignment system of inspection area |
-
1982
- 1982-07-28 JP JP13179882A patent/JPS5920840A/ja active Granted
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53143384A (en) * | 1977-05-20 | 1978-12-13 | Yaskawa Denki Seisakusho Kk | Pinhole detector |
JPS5444769A (en) * | 1977-09-14 | 1979-04-09 | Matsushita Electric Ind Co Ltd | Device for inspecting displacement of chipplike parts |
JPS54141661A (en) * | 1978-04-27 | 1979-11-05 | Fujitsu Ltd | Assignment system of inspection area |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5999364A (ja) * | 1982-11-30 | 1984-06-08 | Fujitsu Ltd | スル−ホ−ル検査装置 |
JPS59150329A (ja) * | 1983-01-28 | 1984-08-28 | Fujitsu Ltd | スル−ホ−ル検査装置 |
JPS62297750A (ja) * | 1986-06-17 | 1987-12-24 | Matsushita Electric Ind Co Ltd | ハンダ付け検査装置 |
JPS62299747A (ja) * | 1986-06-19 | 1987-12-26 | Fujitsu Ltd | スル−ホ−ル検査装置 |
JPH0455991U (enrdf_load_stackoverflow) * | 1990-09-19 | 1992-05-13 | ||
US5548400A (en) * | 1994-02-16 | 1996-08-20 | Sochata | Method and apparatus for inspecting honeycomb structures using optical fibres |
EP0997722A1 (fr) * | 1998-10-29 | 2000-05-03 | Societe Nationale D'etude Et De Construction De Moteurs D'aviation "Snecma" | Procédé et instrument de contrôle de la liaison de l'âme alvéolée d'un nid d'abeilles sur une peau |
FR2785388A1 (fr) * | 1998-10-29 | 2000-05-05 | Snecma | Procede et instrument de controle de la liaison de l'ame alveolee d'un nid d'abeilles sur une peau |
Also Published As
Publication number | Publication date |
---|---|
JPH0447782B2 (enrdf_load_stackoverflow) | 1992-08-04 |
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